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Transcript
P15610 Test Plans
Control Board:
The control board, an Arduino attached to a frequency generator with digital controls, is most
straightforward to test by programming the Arduino. First, the Arduino will be instructed to
output high voltage on certain pins, and an oscilloscope will measure those outputs. Next, the
Arduino will be instructed to control the frequency generator to provide certain signals, and the
oscilloscope will be used to assure those signals come from the frequency generator. Lastly, the
Arduino's ADC will be fed a stable DC input, and then this value will be read from memory.
Parts necessary:
Oscilloscope + probes (in EE labs)
Signal generator + leads (in EE labs)
DC power supply (in EE labs)
Computer/Laptop with Arduino software (freely available)
Input Board:
One FET's gate will be pulled to a high voltage, and a signal generator with oscilloscope will be
used to assure signal flows from board inputs to the input of the capacitance measurement
circuit. This will be done for each FET.
If the previous test is successful, the capacitance measurement circuit will be powered and its
output measured for signal integrity and attenuation. If these are acceptable values, the input
board will be made fully operational and outputs characterized for frequency response and
amplification.
OR
Breadboard a small version of the whole board and test the circuit elements
Test single FET with required voltage
o Measure voltage on output to make sure there is a full swing
o Measure capacitance measurement on opposite side of FET versus the true output
capacitance (there will be a slight load increase due to the FET’s internal
capacitance
Test two FETs with their sources tied together
o Measure cumulative capacitance of the FETs
o Measure the voltage drop and external capacitance versus the true load
capacitance of each FET (each load should be slightly different and measured
prior to get true measurement)
Test more than two FETs with sources tied together
o Measure cumulative capacitance of the FETs in the off state
o Measure the voltage drop and external capacitance versus the true load
capacitance of each FET
o Switch the FETs quickly to measure rise and fall times of external voltage which
will determine frequency response and steady-state response
Test high voltage and high capacitive load on single FET switching into read mode without a
high voltage dissipation circuit
o The high voltage should pass through and slowly dissipate/remain steady
Test high voltage and high capacitive load on single FET switching into read mode with a high
voltage dissipation circuit
o The high voltage on the source of the FET while it is on will quickly drop off and
dissipate over a capacitor
o Show that the fall time of this voltage is fast enough to prevent damage to a
circuit that will be reading the capacitance
Parts necessary:
Oscilloscope + probes (in EE labs)
Signal generator + leads (in EE labs)
DC power supply (in EE labs)
Output Board:
The output board's shift registers will have a very slow (~0.5Hz) clock signal attached to their
clock inputs, and one or two bits of the signal input will be high (these will be done with a DC
power supply and signal generator). The "high voltage" input (which in the full project will be
120Vrms) will be attached to a steady 5VDC. The outputs will be "chased" by a string of four to
six LEDs, to visually indicate that the high voltage signal can flow through the output board to
the correct output pins.
If the previous test is successful, the high voltage input will be changed to 5V peak-to-peak AC,
and the clock signal disconnected. A voltage divider will be placed on a pin output which
receives the high voltage input, and the divided voltage measured by an oscilloscope. The input
high voltage AC will be increased, assuring circuit functionality, until reaching 120Vrms. The
AC voltage will be provided by a signal generator and a transformer.
Parts necessary:
4-6 LEDs
4-6 Resistors (in series w/ LEDs)
Transformer
Oscilloscope + probes (in EE labs)
Signal generator + leads (in EE labs)
DC power supply (in EE labs)
DC Power Supply:
Utilizing a computer power supply, a digital multi-meter will be used to manually check the DC
voltages at each output. When the PSU is turned on, there will be LED’s indicating which output
rails are connected. There are short-circuit safety measures embedded in the power supply that
will prevent damaging our devices.
Frequency Generator:
The frequency and amplitude will be controlled by the Arduino, and manually confirmed with an
oscilloscope. If the output voltage is too low, the amplifier will accommodate for the loss by
increasing the gain.
Power Amplifier:
Test current limiting circuit by taking measurements of the output with alternating signal
attached, should be less than 500mA.
Test linear regulator circuit, the circuit is only active when FAULT input is LOW.
Test the power amplifier circuit with input connected to sweep signal generator from 0 ~ 20V pp sine wave and also sweep frequencies between 100 Hz to 100 kHz in 100 Hz increments,
record the output data. Calculate the frequency response of the output voltage.
Combine current limiting circuit and regulator circuit, test the output voltage to the DC rail is
VCC and VEE (±15V DC) when FAULT is LOW and off when FAULT is HIGH.
Combine all circuits above to create an amplifier system. Test for same data as power amplifier
test.
Test the high voltage inverting circuit separately. Output voltage should be in the range of 100
Vp-p to 200 Vp-p depending on the varying input voltage values.
Combine signal generator, amplifier system, and transformer. Vary the frequency (100 Hz ~ 100
kHz) of the signal generator and test the circuit for alternating output voltages, record data.
Calculate amplifier frequency response up to 100 kHz.
Equipment:
 Breadboard
 Multi-meter
 Matlab
 Power Supply (DC)
 Signal Generator
 Oscilloscope
 Probes
Housing:
Continuity testing will be performed throughout the components of the housing to ensure that the
appropriate components are fully grounded.
The fully assembled system will be run while the fan is operating at each of its three available
speeds. The internal temperature of the system will be monitored until it reaches steady state,
along with the power draw of the fan.
The housing will be emptied of electrical components, placed on a scale, and weighed. Then, the
overall dimensions of the housing will be measured and the total volume will be calculated.
The emptied housing will be fully disassembled and reassembled by a single person while they
are timed. This test may be repeated to determine an average completion time.