LABORATORY WORK 1
... Ammeter, serving for measurement the current in a circuit, is connected in the circuit in series. A voltmeter, serving for measurement a voltage in a circuit’s part, is connected in parallel to this part. Connection of these devices mustn’t bring noticeable changes into a circuit, so that not to cha ...
... Ammeter, serving for measurement the current in a circuit, is connected in the circuit in series. A voltmeter, serving for measurement a voltage in a circuit’s part, is connected in parallel to this part. Connection of these devices mustn’t bring noticeable changes into a circuit, so that not to cha ...
IGC142T120T8RM IGBT4 Medium Power Chip
... Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automo ...
... Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automo ...
LM195/LM395 Ultra Reliable Power Transistors (Rev. C)
... Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered documentation. Info ...
... Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered documentation. Info ...
LM395T/NOPB - Texas Instruments High
... Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered documentation. Info ...
... Reproduction of significant portions of TI information in TI data books or data sheets is permissible only if reproduction is without alteration and is accompanied by all associated warranties, conditions, limitations, and notices. TI is not responsible or liable for such altered documentation. Info ...
Florida Department of Transportation
... For materials which may not require formal testing, the Engineer reserves the right to require certifications from the manufacturer of such equipment and material, to the effect that they meet all Specification requirements, and, in the event of questionable equipment or material, to require that su ...
... For materials which may not require formal testing, the Engineer reserves the right to require certifications from the manufacturer of such equipment and material, to the effect that they meet all Specification requirements, and, in the event of questionable equipment or material, to require that su ...
BAS20 General Purpose High Voltage Diode B A
... This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. ...
... This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. ...
Advances in Electrical Measurements for Nanotechnology E
... impedance changes, such as occurs in CNTs acting as semiconductor switches. Although the properties of quantum wells, wires, and dots differ, it’s possible This allows a much wider dynamic range of voltage and current stimuli and that information about a particular material in the form of a quantum ...
... impedance changes, such as occurs in CNTs acting as semiconductor switches. Although the properties of quantum wells, wires, and dots differ, it’s possible This allows a much wider dynamic range of voltage and current stimuli and that information about a particular material in the form of a quantum ...
TRS3318 - Texas Instruments
... Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to a ...
... Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to a ...
... have recently been of much interest to research efforts. These design approaches can be considered in two aspects, i.e. testing technique and system implementation. One design aspect is the testing technique. Two major testing techniques are current and voltage sensing techniques. On the one hand, t ...
Interfacing high-voltage applications to low
... 1% value being 44.8 kW. However, for high-voltage designs using a supply of 24 V or more, an input resistor is needed to raise the ON thresh old into the middle of the input-voltage range. Figure 4 presents this case, with the input-current limit assumed to be 2 mA. The input resistor now separates ...
... 1% value being 44.8 kW. However, for high-voltage designs using a supply of 24 V or more, an input resistor is needed to raise the ON thresh old into the middle of the input-voltage range. Figure 4 presents this case, with the input-current limit assumed to be 2 mA. The input resistor now separates ...
JB Operators Manual
... serial data links (EIA-232, EIA-422, or EIA-485 serial data at up to 115.2 Kb/s). As an option, the JB may support up to eight isolated serial data links by eliminating two of the 300-400V DC downlink circuits. 5. Each downlink port can be configured with any available power and data interface at th ...
... serial data links (EIA-232, EIA-422, or EIA-485 serial data at up to 115.2 Kb/s). As an option, the JB may support up to eight isolated serial data links by eliminating two of the 300-400V DC downlink circuits. 5. Each downlink port can be configured with any available power and data interface at th ...
IB1011S190 - Integra Technologies, Inc.
... Integra Technologies Inc. reserves the right to make changes without further notice to any products herein. Integra Technologies Inc. makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Integra Technologies Inc. assume any lia ...
... Integra Technologies Inc. reserves the right to make changes without further notice to any products herein. Integra Technologies Inc. makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does Integra Technologies Inc. assume any lia ...
AN-5059 LVDS Technology Solves Typical EMI Problems
... Cell phones, although usually designed by a single supplier, can be marketed in many countries. Unfortunately, regulatory requirements vary from country to country, and often one country does not recognize the standards or test results of another country. For example, a cell phone must undergo EMI t ...
... Cell phones, although usually designed by a single supplier, can be marketed in many countries. Unfortunately, regulatory requirements vary from country to country, and often one country does not recognize the standards or test results of another country. For example, a cell phone must undergo EMI t ...
Advantages of AC resistance thermometry bridges
... Resistance thermometry bridges By using internal or external standard resistors (model CER6000), resistance thermometry bridges measure resistance ratios with high accuracy, which are indicative of the temperature, among other things. Due to their high accuracy, these instruments are not only used ...
... Resistance thermometry bridges By using internal or external standard resistors (model CER6000), resistance thermometry bridges measure resistance ratios with high accuracy, which are indicative of the temperature, among other things. Due to their high accuracy, these instruments are not only used ...
Attachment 4
... 5.18 Electromagnetic compatibility (EMC). Equipment below 123kV exempted from riv test. 5.19 X-ray emission test introduced based on ANSI C37-85 (see 6.10) 5.20 New Section on Corrosion resistance added. 6.5.2 Temperature rise tests, Arrangement of the equipment. Changes allow use of specified conne ...
... 5.18 Electromagnetic compatibility (EMC). Equipment below 123kV exempted from riv test. 5.19 X-ray emission test introduced based on ANSI C37-85 (see 6.10) 5.20 New Section on Corrosion resistance added. 6.5.2 Temperature rise tests, Arrangement of the equipment. Changes allow use of specified conne ...
Tektronix Curve Tracers - University of Saskatchewan
... Transistor Curve Tracers and one Tek 577 Curve Tracer. These instruments greatly speed the checking of npn and pnp transistors, as well as diodes. This document will not supply you with pictures of the front panels of these instruments, since they are too difficult to reproduce here. Another point t ...
... Transistor Curve Tracers and one Tek 577 Curve Tracer. These instruments greatly speed the checking of npn and pnp transistors, as well as diodes. This document will not supply you with pictures of the front panels of these instruments, since they are too difficult to reproduce here. Another point t ...
miller 400a
... the C1 and C2 terminals (with a load applied), is a 12V(rms) crystalcontrolled 97Hz square wave oscillator and the voltmeter inside the unit, which senses the potential difference (voltage drop) appearing across the P1 and P2 terminals, employs a very narrow band-pass filter centered at 97Hz What th ...
... the C1 and C2 terminals (with a load applied), is a 12V(rms) crystalcontrolled 97Hz square wave oscillator and the voltmeter inside the unit, which senses the potential difference (voltage drop) appearing across the P1 and P2 terminals, employs a very narrow band-pass filter centered at 97Hz What th ...
Specification Status: RELEASED PolyZen GENERAL DESCRIPTION
... This device is intended for limited fault protection. Repeated trip events or extended trip endurance can degrade the device and may affect performance to specifications. Performance impact will depend on multiple factors including, but not limited to, voltage, trip current, trip duration, trip cycl ...
... This device is intended for limited fault protection. Repeated trip events or extended trip endurance can degrade the device and may affect performance to specifications. Performance impact will depend on multiple factors including, but not limited to, voltage, trip current, trip duration, trip cycl ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.