Lightning Transient Suppression Circuit Design
... • A voltage gradient is established throughout the airframe and used to create “zones”. – Each “zone” has a voltage associated with it. ...
... • A voltage gradient is established throughout the airframe and used to create “zones”. – Each “zone” has a voltage associated with it. ...
CLC021 - Texas Instruments
... The CLC021 has EDH character and flag generation and insertion circuitry which operates as proposed in SMPTE RP-165. Inputs and circuitry are provided to control generation and automatic insertion of the EDH check words at proper locations in the serial data output. The EDH polynomial generators acc ...
... The CLC021 has EDH character and flag generation and insertion circuitry which operates as proposed in SMPTE RP-165. Inputs and circuitry are provided to control generation and automatic insertion of the EDH check words at proper locations in the serial data output. The EDH polynomial generators acc ...
DS32EV100 Programmable Single Equalizer
... body size capacitors can help facilitate proper component placement. Additionally, three capacitors with capacitance in the range of 2.2 μF to 10 μF should be incorporated in the power supply bypassing design as well. These capacitors can be either tantalum or an ultra-low ESR ceramic and should be ...
... body size capacitors can help facilitate proper component placement. Additionally, three capacitors with capacitance in the range of 2.2 μF to 10 μF should be incorporated in the power supply bypassing design as well. These capacitors can be either tantalum or an ultra-low ESR ceramic and should be ...
Star-Protective and Device Coordination
... Sequence of Event Viewer The sequence of operation of protective devices are automatically calculated and listed in an Event Viewer, which is dynamically linked with the one-line diagram. This one-step concept utilizes the intelligent one-line diagram and performs a complete set of actions to determ ...
... Sequence of Event Viewer The sequence of operation of protective devices are automatically calculated and listed in an Event Viewer, which is dynamically linked with the one-line diagram. This one-step concept utilizes the intelligent one-line diagram and performs a complete set of actions to determ ...
Short circuit test code TF D8 clause 12 and annex xx
... of currents shall be representative of stresses in the winding. When the transformer winding connected to the energy source is delta-connected, the first cycle peak asymmetrical current cannot be determined directly from terminal measurements at the source terminals. The following alternatives exist ...
... of currents shall be representative of stresses in the winding. When the transformer winding connected to the energy source is delta-connected, the first cycle peak asymmetrical current cannot be determined directly from terminal measurements at the source terminals. The following alternatives exist ...
TD132005EN
... the pulse is checked by a digital transient recorder and its energy content is calculated by computer. Experiments have shown that a good, undamaged fuse will withstand an indefinite number of such pulses with no detrimental effects. In production testing, fuses are subjected to two pulses - a metho ...
... the pulse is checked by a digital transient recorder and its energy content is calculated by computer. Experiments have shown that a good, undamaged fuse will withstand an indefinite number of such pulses with no detrimental effects. In production testing, fuses are subjected to two pulses - a metho ...
SN65HVD179 数据资料 dataSheet 下载
... ISO 8482:1993 standard-compliant devices. The differential bus driver and receiver are monolithic, integrated circuits designed for full-duplex bi-directional data communication on multipoint bus-transmission lines at signaling rates (1) up to 25 Mbps. The SN65HVD179 is fully enabled with no externa ...
... ISO 8482:1993 standard-compliant devices. The differential bus driver and receiver are monolithic, integrated circuits designed for full-duplex bi-directional data communication on multipoint bus-transmission lines at signaling rates (1) up to 25 Mbps. The SN65HVD179 is fully enabled with no externa ...
ANSI_SCTE 06 2009
... Discrete Second Order (DSO): An individual, second order intermodulation product, produced when one or two carriers pass through a non-linear component. Composite Second Order (CSO): The sum of all DSO products that happen to fall at the same nominal frequency in a multi-tone system. CSO is defined ...
... Discrete Second Order (DSO): An individual, second order intermodulation product, produced when one or two carriers pass through a non-linear component. Composite Second Order (CSO): The sum of all DSO products that happen to fall at the same nominal frequency in a multi-tone system. CSO is defined ...
Reduction of EMC Emissions in Mixed Signal Integrated Circuits
... embedded memories was checked with respect to the clock speed and access time. total average current consumption of the digital block was The successfully decreased by 1/3 while maintaining the main clock frequency at 8 MHz. Figure 3 shows the peak current decoupling path which is too long and badly ...
... embedded memories was checked with respect to the clock speed and access time. total average current consumption of the digital block was The successfully decreased by 1/3 while maintaining the main clock frequency at 8 MHz. Figure 3 shows the peak current decoupling path which is too long and badly ...
evaluating dielectric condition in sf6 circuit breakers
... additional single-contact modules in series, per phase. The method of connection for the modules may vary. If it is possible, the preferred approach is to disconnect and test each module on an individual basis. If this is not practical, the proper test procedure will depend on the specific configura ...
... additional single-contact modules in series, per phase. The method of connection for the modules may vary. If it is possible, the preferred approach is to disconnect and test each module on an individual basis. If this is not practical, the proper test procedure will depend on the specific configura ...
TM4C123x Stepper Motor Control
... motion control and real-time connectivity. The TM4C123x Series MCUs integrate the ARM® Cortex®-M4 CPU with single-precision floating-point core operating up to 80 MHz and high-performance analog-todigital converters (ADC) while still providing low-power modes that consume as little 1.6 μA. With up t ...
... motion control and real-time connectivity. The TM4C123x Series MCUs integrate the ARM® Cortex®-M4 CPU with single-precision floating-point core operating up to 80 MHz and high-performance analog-todigital converters (ADC) while still providing low-power modes that consume as little 1.6 μA. With up t ...
Fundamentals of Signature Analysis
... The signatures shown in this document were obtained using ASA instruments manufactured by Huntron, Inc. For most of the signatures shown in this document, a simple two probe approach is used. Probes are held either directly across a component or from between a component pin and a common reference su ...
... The signatures shown in this document were obtained using ASA instruments manufactured by Huntron, Inc. For most of the signatures shown in this document, a simple two probe approach is used. Probes are held either directly across a component or from between a component pin and a common reference su ...
22900_draft_5d_(=_5c_mpmodif_plus_`rad`_and_`hour
... Devices to be irradiated shall be mounted on test circuit boards together with any associated circuitry necessary for application of bias during irradiation or for in-situ measurements. Other than devices under test, components that are placed on the board(s) shall be insensitive to the required acc ...
... Devices to be irradiated shall be mounted on test circuit boards together with any associated circuitry necessary for application of bias during irradiation or for in-situ measurements. Other than devices under test, components that are placed on the board(s) shall be insensitive to the required acc ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.