Lecture 21: IDDQ Current Testing
... Transistor sub-threshold conduction Harder to find IDDQ threshold separating good & bad chips IDDQ tests work: When average defect-induced current greater than average good IC current Small variation in IDDQ over test sequence & between chips Now less likely to obtain two conditions ...
... Transistor sub-threshold conduction Harder to find IDDQ threshold separating good & bad chips IDDQ tests work: When average defect-induced current greater than average good IC current Small variation in IDDQ over test sequence & between chips Now less likely to obtain two conditions ...
HX5000 ASIC Platform S150 (150 nm) ASICs
... Honeywell HX5000 test capabilities include wafer and packaged part level testing. Testing capabilities encompasses the complete Class S screening flow. The test platform is based on testers manufactured by Credence among others and includes the EXA3000-800 digital tester. The EXA3000-800 has a maxim ...
... Honeywell HX5000 test capabilities include wafer and packaged part level testing. Testing capabilities encompasses the complete Class S screening flow. The test platform is based on testers manufactured by Credence among others and includes the EXA3000-800 digital tester. The EXA3000-800 has a maxim ...
IEC 62271 – Series Standards for MV
... • Kind of measurement of the temperature and temperature-rise • Interpretation of the temperature-rise tests • Definition end of test (normal after five times the thermal time constant) More details about number of phases to be tested, value of test current, transfer of results to other frequencies ...
... • Kind of measurement of the temperature and temperature-rise • Interpretation of the temperature-rise tests • Definition end of test (normal after five times the thermal time constant) More details about number of phases to be tested, value of test current, transfer of results to other frequencies ...
N16-91 The Compact Muon Solenoid Silicon Tracker
... a centralized database. Visual inspections are as important as alignment checks and electrical and functional tests. The ...
... a centralized database. Visual inspections are as important as alignment checks and electrical and functional tests. The ...
LM2940QML 1A Low Dropout Regulator (Rev. B)
... It is important to note that for most capacitors, ESR is specified only at room temperature. However, the designer must ensure that the ESR will stay inside the limits shown over the entire operating temperature range for the design. For aluminum electrolytic capacitors, ESR will increase by about 3 ...
... It is important to note that for most capacitors, ESR is specified only at room temperature. However, the designer must ensure that the ESR will stay inside the limits shown over the entire operating temperature range for the design. For aluminum electrolytic capacitors, ESR will increase by about 3 ...
Polytechnic Instrumentation Engineering 2 Year Syllabus
... Polytechnic Instrumentation Engineering 2nd Year Syllabus Instrumentation engineering is the engineering specialization focused on the principle and operation of measuring instruments that are used in design and configuration of automated systems in electrical, pneumatic domains etc. They typically ...
... Polytechnic Instrumentation Engineering 2nd Year Syllabus Instrumentation engineering is the engineering specialization focused on the principle and operation of measuring instruments that are used in design and configuration of automated systems in electrical, pneumatic domains etc. They typically ...
Dark Current of Ge:Ga detectors from FM-ILT/IST. IMT 502
... edge of the field of view and are known to be affected by a poor alignment of the image slicer. This could be a hint that these modules catch (stray) light from other directions than from the cold calibration source. From the visual inspection of Fig. 2 there is the impression that column 10 is brig ...
... edge of the field of view and are known to be affected by a poor alignment of the image slicer. This could be a hint that these modules catch (stray) light from other directions than from the cold calibration source. From the visual inspection of Fig. 2 there is the impression that column 10 is brig ...
Rationale for the power flux test
... Rationale for the power flux test The purpose of a power flux test is to test the integrity of the insulation between the lamination plates in the core of a stator. The EL-CID (electromagnetic core imperfection detection) is the preferred test, but it was found that in some cases, there is still a n ...
... Rationale for the power flux test The purpose of a power flux test is to test the integrity of the insulation between the lamination plates in the core of a stator. The EL-CID (electromagnetic core imperfection detection) is the preferred test, but it was found that in some cases, there is still a n ...
QSP-2150 QCP-2150 - Ocean Networks Canada
... The 2150 is very simple to use. You need only plug it into a working and properly configured serial port. No batteries required! Communications with the sensor require no special application except a serial terminal emulator such as HyperTerminal, and all operations are performed through a simple me ...
... The 2150 is very simple to use. You need only plug it into a working and properly configured serial port. No batteries required! Communications with the sensor require no special application except a serial terminal emulator such as HyperTerminal, and all operations are performed through a simple me ...
Documentation for GAIN setup
... The program apd_TEST_V3.vi is the current version used to measure all apds for gain. It measures gain for 20 apds automatically and saves data in ascii text files on the local hard drive and also the cristal database. Typical settings on the front panel can be seen in the figure below. With these se ...
... The program apd_TEST_V3.vi is the current version used to measure all apds for gain. It measures gain for 20 apds automatically and saves data in ascii text files on the local hard drive and also the cristal database. Typical settings on the front panel can be seen in the figure below. With these se ...
AEC - Q100-004 - Rev-D - Automotive Electronics Council
... E-Test (Voltage Trigger Latch-up): It is a latch-up test in which positive and negative voltage trigger pulses are applied to a pin under test. The actual test procedure shall be performed per the I-test procedure, substituting a voltage trigger for the current trigger. VDD Tolerant I/O: Some applic ...
... E-Test (Voltage Trigger Latch-up): It is a latch-up test in which positive and negative voltage trigger pulses are applied to a pin under test. The actual test procedure shall be performed per the I-test procedure, substituting a voltage trigger for the current trigger. VDD Tolerant I/O: Some applic ...
TMS3705 Transponder Base Station IC (Rev. D)
... Related Products For information about other devices in this family of products or related products, see the following links. Products for Wireless Connectivity Connect more – Industry’s broadest wireless connectivity portfolio Products for NFC / RFID Texas Instruments provides one of the industry’s ...
... Related Products For information about other devices in this family of products or related products, see the following links. Products for Wireless Connectivity Connect more – Industry’s broadest wireless connectivity portfolio Products for NFC / RFID Texas Instruments provides one of the industry’s ...
TPS2458 ATCA? AdvancedMC? Controller With I2C Evaluation
... Connecting Loads to the TPS2458EVM Each of the power rails of the TPS2458EVM is supplied with some amount of load capacitance in the form of discrete electrolytics. The capacitors can be connected to or disconnected from their associated output nodes using 100-mil, 2-pin shunt jumpers across the on- ...
... Connecting Loads to the TPS2458EVM Each of the power rails of the TPS2458EVM is supplied with some amount of load capacitance in the form of discrete electrolytics. The capacitors can be connected to or disconnected from their associated output nodes using 100-mil, 2-pin shunt jumpers across the on- ...
Specification of Grade-1 colour production monitors
... Experts in video origination equipment grouped in the framework of the EBU Technical Committee have decided that it would he useful to publish in the form of an official EBU publication the results of their common experience in the field of grade-1 colour picture monitors. The specification set out ...
... Experts in video origination equipment grouped in the framework of the EBU Technical Committee have decided that it would he useful to publish in the form of an official EBU publication the results of their common experience in the field of grade-1 colour picture monitors. The specification set out ...
NB4N11MDTEVB Evaluation Board User's Manual for NB4N11M EVAL BOARD USER’S MANUAL
... are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor doe ...
... are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor doe ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.