
MDM750H65E2
... 1. The information given herein, including the specifications and dimensions, is subject to change without prior notice to improve product characteristics. Before ordering, purchasers are advised to contact Hitachi sales department for the latest version of this data sheets. 2. Please be sure to rea ...
... 1. The information given herein, including the specifications and dimensions, is subject to change without prior notice to improve product characteristics. Before ordering, purchasers are advised to contact Hitachi sales department for the latest version of this data sheets. 2. Please be sure to rea ...
DS10BR150 1.0 Gbps LVDS Buffer / Repeater
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
0319 - Three Axis Low-g Micromachined Accelerometer
... circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for an ...
... circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for an ...
How to Test the Voltage Drop Between the Battery
... The voltage drop between: the battery positive (+) terminal and the input pin to any load on the vehicle. How to Set the DVOM Meter, Leads, and Probes for Reading: The voltage drop between: the battery negative (-) terminal and the output pin or case ground from any load on the vehicle. How to Set t ...
... The voltage drop between: the battery positive (+) terminal and the input pin to any load on the vehicle. How to Set the DVOM Meter, Leads, and Probes for Reading: The voltage drop between: the battery negative (-) terminal and the output pin or case ground from any load on the vehicle. How to Set t ...
a CMOS, Low Voltage RF/Video, SPST Switch ADG751
... switches are open. The closed shunt switch provides a signal path to ground for any of the unwanted signals that find their way through the off capacitances of the series’ MOS devices. This results in improved isolation between the input and output than with an ordinary series switch. When the switc ...
... switches are open. The closed shunt switch provides a signal path to ground for any of the unwanted signals that find their way through the off capacitances of the series’ MOS devices. This results in improved isolation between the input and output than with an ordinary series switch. When the switc ...
S280-80-13
... use with a Kyle microprocessor electronic control. Reclosers manufactured prior to June 1989 are equipped with Type A bushing current transformers (CT’s). These reclosers were designed for use with Form 2, Form 3, and Form 3A controls. Kyle microprocessor-based controls, Form 4A, Form 4C, Form 5, an ...
... use with a Kyle microprocessor electronic control. Reclosers manufactured prior to June 1989 are equipped with Type A bushing current transformers (CT’s). These reclosers were designed for use with Form 2, Form 3, and Form 3A controls. Kyle microprocessor-based controls, Form 4A, Form 4C, Form 5, an ...
Galaxy Series
... Equipment should be mounted in locations and at heights where it will not readily be subjected to tampering by unauthorized personnel. 6. The use of accessory equipment not recommended by the manufacturer may cause an unsafe condition. 7. Caution: If optional Halogen cycle lamp(s), symbol (H—), are ...
... Equipment should be mounted in locations and at heights where it will not readily be subjected to tampering by unauthorized personnel. 6. The use of accessory equipment not recommended by the manufacturer may cause an unsafe condition. 7. Caution: If optional Halogen cycle lamp(s), symbol (H—), are ...
field test guide
... Total percent change in voltage = 21°C × -0.3%/°C = -6.3% (negative sign implies voltage decrease) Total voltage decrease = 39.4 V (.063) = 2.48 V Calculated Voc = 39.4 V - 2.48 = 36.9 V* * Calculated voltage should be ± 10% for modules ≤ 10 yrs of age Additonal derate factors may apply due to modul ...
... Total percent change in voltage = 21°C × -0.3%/°C = -6.3% (negative sign implies voltage decrease) Total voltage decrease = 39.4 V (.063) = 2.48 V Calculated Voc = 39.4 V - 2.48 = 36.9 V* * Calculated voltage should be ± 10% for modules ≤ 10 yrs of age Additonal derate factors may apply due to modul ...
Quartz Crystal
... • A full analysis on all crystal parameters, especially the reliability performance, requires a lot of effort and equipment. • The function of IQC is to check some critical parameters that may affect your products’ quality / performance, but NOT to act as your ...
... • A full analysis on all crystal parameters, especially the reliability performance, requires a lot of effort and equipment. • The function of IQC is to check some critical parameters that may affect your products’ quality / performance, but NOT to act as your ...
Fire and Smoke Control Systems - Functional Testing and Design
... damper will shut the damper automatically when temperature exceeds the installed closure device fixed temperature setting. Closure devices include: fusible links, resettable links, and single or multiple temperature switches (temperature switch devices typically associated with combined fire-smoke d ...
... damper will shut the damper automatically when temperature exceeds the installed closure device fixed temperature setting. Closure devices include: fusible links, resettable links, and single or multiple temperature switches (temperature switch devices typically associated with combined fire-smoke d ...
XAPP457 - Powering and Configuring Spartan-3 Generation FPGAs in Compliant PCI Applications
... successful power-on event for the system. All PCI-SIG technologies specify time limits for events in the system power-on sequence. In some implementations, these specifications can be difficult to satisfy. Failing to meet the specifications might result in system crashes or other fatal application e ...
... successful power-on event for the system. All PCI-SIG technologies specify time limits for events in the system power-on sequence. In some implementations, these specifications can be difficult to satisfy. Failing to meet the specifications might result in system crashes or other fatal application e ...
DEM-PCM2901/2903 EVM
... any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI wa ...
... any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI wa ...
History of System Lightning Requirements
... be significant. Additionally, the open circuit voltage associated with is within region where the withstand capability of the insulation medium (air, fiberglass, teflon, etc.) at equipment connectors or between equipment circuit paths could be exceeded. ...
... be significant. Additionally, the open circuit voltage associated with is within region where the withstand capability of the insulation medium (air, fiberglass, teflon, etc.) at equipment connectors or between equipment circuit paths could be exceeded. ...
Test Procedure for the NCL30051LEDGEVB Evaluation Board
... measure input power in watts, RMS line voltage, and power factor (PF). If the AC power source is able to measure these parameters accurately and is calibrated, the analyzer can be omitted. 3. Digital volt/amp meters to measure output current and voltage to the electronic load (internal meters in ele ...
... measure input power in watts, RMS line voltage, and power factor (PF). If the AC power source is able to measure these parameters accurately and is calibrated, the analyzer can be omitted. 3. Digital volt/amp meters to measure output current and voltage to the electronic load (internal meters in ele ...
RevF_093B
... analog scan rates must be adjusted accordingly. This can be achieved by multiplying the rates (table above) by the factor (3 seconds / tr) where / tr is the response time in seconds. For example, if tr is 30 seconds, (3 seconds / tr) is 0.1. The rate for the 1 kHz to 10 kHz range becomes 3.33 Hz/sec ...
... analog scan rates must be adjusted accordingly. This can be achieved by multiplying the rates (table above) by the factor (3 seconds / tr) where / tr is the response time in seconds. For example, if tr is 30 seconds, (3 seconds / tr) is 0.1. The rate for the 1 kHz to 10 kHz range becomes 3.33 Hz/sec ...
Automatic test equipment

Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.