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MDM750H65E2
MDM750H65E2

... 1. The information given herein, including the specifications and dimensions, is subject to change without prior notice to improve product characteristics. Before ordering, purchasers are advised to contact Hitachi sales department for the latest version of this data sheets. 2. Please be sure to rea ...
DS10BR150 1.0 Gbps LVDS Buffer / Repeater
DS10BR150 1.0 Gbps LVDS Buffer / Repeater

... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
0319 - Three Axis Low-g Micromachined Accelerometer
0319 - Three Axis Low-g Micromachined Accelerometer

... circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes without further notice to any products herein. Freescale Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for an ...
How to Test the Voltage Drop Between the Battery
How to Test the Voltage Drop Between the Battery

... The voltage drop between: the battery positive (+) terminal and the input pin to any load on the vehicle. How to Set the DVOM Meter, Leads, and Probes for Reading: The voltage drop between: the battery negative (-) terminal and the output pin or case ground from any load on the vehicle. How to Set t ...
a CMOS, Low Voltage RF/Video, SPST Switch ADG751
a CMOS, Low Voltage RF/Video, SPST Switch ADG751

... switches are open. The closed shunt switch provides a signal path to ground for any of the unwanted signals that find their way through the off capacitances of the series’ MOS devices. This results in improved isolation between the input and output than with an ordinary series switch. When the switc ...
S280-80-13
S280-80-13

... use with a Kyle microprocessor electronic control. Reclosers manufactured prior to June 1989 are equipped with Type A bushing current transformers (CT’s). These reclosers were designed for use with Form 2, Form 3, and Form 3A controls. Kyle microprocessor-based controls, Form 4A, Form 4C, Form 5, an ...
Valhalla Scientific, Inc
Valhalla Scientific, Inc

The A.U.M. Device (pronounced “Ohm”)
The A.U.M. Device (pronounced “Ohm”)

Galaxy Series
Galaxy Series

... Equipment should be mounted in locations and at heights where it will not readily be subjected to tampering by unauthorized personnel. 6. The use of accessory equipment not recommended by the manufacturer may cause an unsafe condition. 7. Caution: If optional Halogen cycle lamp(s), symbol (H—), are ...
field test guide
field test guide

... Total percent change in voltage = 21°C × -0.3%/°C = -6.3% (negative sign implies voltage decrease) Total voltage decrease = 39.4 V (.063) = 2.48 V Calculated Voc = 39.4 V - 2.48 = 36.9 V* * Calculated voltage should be ± 10% for modules ≤ 10 yrs of age Additonal derate factors may apply due to modul ...
Quartz Crystal
Quartz Crystal

... • A full analysis on all crystal parameters, especially the reliability performance, requires a lot of effort and equipment. • The function of IQC is to check some critical parameters that may affect your products’ quality / performance, but NOT to act as your ...
Fire and Smoke Control Systems - Functional Testing and Design
Fire and Smoke Control Systems - Functional Testing and Design

... damper will shut the damper automatically when temperature exceeds the installed closure device fixed temperature setting. Closure devices include: fusible links, resettable links, and single or multiple temperature switches (temperature switch devices typically associated with combined fire-smoke d ...
SN65LVCP202 数据资料 dataSheet 下载
SN65LVCP202 数据资料 dataSheet 下载

Low-Cost,Low-Power Level Shifting In Mixed
Low-Cost,Low-Power Level Shifting In Mixed

XAPP457 - Powering and Configuring Spartan-3 Generation FPGAs in Compliant PCI Applications
XAPP457 - Powering and Configuring Spartan-3 Generation FPGAs in Compliant PCI Applications

... successful power-on event for the system. All PCI-SIG technologies specify time limits for events in the system power-on sequence. In some implementations, these specifications can be difficult to satisfy. Failing to meet the specifications might result in system crashes or other fatal application e ...
the Flowgo manual
the Flowgo manual

DEM-PCM2901/2903 EVM
DEM-PCM2901/2903 EVM

... any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI wa ...
History of System Lightning Requirements
History of System Lightning Requirements

... be significant. Additionally, the open circuit voltage associated with is within region where the withstand capability of the insulation medium (air, fiberglass, teflon, etc.) at equipment connectors or between equipment circuit paths could be exceeded. ...
Test Procedure for the NCL30051LEDGEVB Evaluation Board
Test Procedure for the NCL30051LEDGEVB Evaluation Board

... measure input power in watts, RMS line voltage, and power factor (PF). If the AC power source is able to measure these parameters accurately and is calibrated, the analyzer can be omitted. 3. Digital volt/amp meters to measure output current and voltage to the electronic load (internal meters in ele ...
UNH InterOperability Lab
UNH InterOperability Lab

ADG781 数据手册DataSheet下载
ADG781 数据手册DataSheet下载

SMS-C 422 - ADYNA | smart technology
SMS-C 422 - ADYNA | smart technology

Instructions for Use
Instructions for Use

RevF_093B
RevF_093B

... analog scan rates must be adjusted accordingly. This can be achieved by multiplying the rates (table above) by the factor (3 seconds / tr) where / tr is the response time in seconds. For example, if tr is 30 seconds, (3 seconds / tr) is 0.1. The rate for the 1 kHz to 10 kHz range becomes 3.33 Hz/sec ...
RevF_093b
RevF_093b

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Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
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