EMAC - A2LA
... “Verification” for the purpose of determining that the test equipment complies with specifications does not exist for equipment used in EMC testing. The only options are P102-compliant in-house calibrations, or external calibrations (2012 EMAC Meeting – Revised 2016 EMAC Meeting) Test systems that f ...
... “Verification” for the purpose of determining that the test equipment complies with specifications does not exist for equipment used in EMC testing. The only options are P102-compliant in-house calibrations, or external calibrations (2012 EMAC Meeting – Revised 2016 EMAC Meeting) Test systems that f ...
RITTER paper.p65
... Since the resistor and capacitor elements are fully integrated in the cofired series RC, the device resistance cannot be measured independently, but must be extracted from the device impedance characteristic. In a practical sense, determination of series resistance and capacitance must be made in a ...
... Since the resistor and capacitor elements are fully integrated in the cofired series RC, the device resistance cannot be measured independently, but must be extracted from the device impedance characteristic. In a practical sense, determination of series resistance and capacitance must be made in a ...
Cree Power White Paper: The Characterization of dV/dt
... Figure 3: Instantaneous power dissipation and turn-on energy loss for 50V/ns and 100V/ns The peak instantaneous power remains the same for the two cases. Additionally, the instantaneous power is the same during the current rise of the switching event (t = 5 ns to 10 ns). However, the time it takes ...
... Figure 3: Instantaneous power dissipation and turn-on energy loss for 50V/ns and 100V/ns The peak instantaneous power remains the same for the two cases. Additionally, the instantaneous power is the same during the current rise of the switching event (t = 5 ns to 10 ns). However, the time it takes ...
TPS6030x EVM-170 Single-Cell Charge Pump
... 42,0 x 33,0 mm2 (1386 mm2), which is much larger than required for the IC and its capacitors. The total space required for the IC and the capacitors on the EVM is only about 8 mm × 10 mm = 80 mm2. The capacitors are not optimized for space, but are optimized for performance. It is possible to use sm ...
... 42,0 x 33,0 mm2 (1386 mm2), which is much larger than required for the IC and its capacitors. The total space required for the IC and the capacitors on the EVM is only about 8 mm × 10 mm = 80 mm2. The capacitors are not optimized for space, but are optimized for performance. It is possible to use sm ...
Friction, Wear and Lubrication
... Tribology of Liquids Explorer’s Choice: The MCR Tribometer Building on decades of experience developing and manufacturing high-precision rheometers, Anton Paar has now created the unique MCR tribometer. The MCR tribometer expands traditional tribological tests by opening up entirely new measuring r ...
... Tribology of Liquids Explorer’s Choice: The MCR Tribometer Building on decades of experience developing and manufacturing high-precision rheometers, Anton Paar has now created the unique MCR tribometer. The MCR tribometer expands traditional tribological tests by opening up entirely new measuring r ...
CERN/EP/ATE/DQ TTCvx _____________________________________________________________________________________
... Input signal level converter and clock selection/generation The A and B inputs are DC-coupled and terminated by Thevenin networks, having a resulting impedance of 50 W. The External Clock input is AC-coupled and then terminated by 50 W. All inputs are biased to ECL "0" level when no input signal is ...
... Input signal level converter and clock selection/generation The A and B inputs are DC-coupled and terminated by Thevenin networks, having a resulting impedance of 50 W. The External Clock input is AC-coupled and then terminated by 50 W. All inputs are biased to ECL "0" level when no input signal is ...
DC Current Source AC and DC Current Source
... with exceptionally low current noise. Low current sourcing is critical to applications in test environments ranging from R&D to production, especially in the semiconductor, nanotechnology, and superconductor industries. High sourcing accuracy and built-in control functions make the Models 6220 and 6 ...
... with exceptionally low current noise. Low current sourcing is critical to applications in test environments ranging from R&D to production, especially in the semiconductor, nanotechnology, and superconductor industries. High sourcing accuracy and built-in control functions make the Models 6220 and 6 ...
AGILENT 34401A Limit Testing
... performed. The multimeter displays "OK" for each reading that is within the specified limits. It displays "HI" or "LO" for each reading that exceeds the upper or lower limit. If the front-panel beeper is enabled (default), the multimeter will beep once on the first occurrence of a failed reading aft ...
... performed. The multimeter displays "OK" for each reading that is within the specified limits. It displays "HI" or "LO" for each reading that exceeds the upper or lower limit. If the front-panel beeper is enabled (default), the multimeter will beep once on the first occurrence of a failed reading aft ...
arch_spec_SolaMaster_330DS
... 3. Flashing Insulator: Type FI, Thermal isolation material for use under the following flashing types; Type F4, F8, or F11. 4. Curb Insulator: Type CI, Thermal isolation material is for use under flashing Type FC. 5. Curb Cap Insulation: Type CCI, Nominal 1 inch thick thermal insulation pad to reduc ...
... 3. Flashing Insulator: Type FI, Thermal isolation material for use under the following flashing types; Type F4, F8, or F11. 4. Curb Insulator: Type CI, Thermal isolation material is for use under flashing Type FC. 5. Curb Cap Insulation: Type CCI, Nominal 1 inch thick thermal insulation pad to reduc ...
Electrical Appliances Testing Policy
... When power boxes are used that enable a number of appliances to be run from one power outlet, care must be taken to ensure that the circuit is not overloaded. Where possible, use power boxes with circuit breakers attached. However it is better to once again request more permanent power outlets. ...
... When power boxes are used that enable a number of appliances to be run from one power outlet, care must be taken to ensure that the circuit is not overloaded. Where possible, use power boxes with circuit breakers attached. However it is better to once again request more permanent power outlets. ...
... 2. The stator winding PD activity is often affected by hydrogenerator operating conditions such as winding temperature, load and voltage, as well as environmental humidity [1]. For example, if a winding is loose (i.e. the stator coils can vibrate in the slot), an increase in generator load will caus ...
EMC Conducted Immunity - Department of Electronic Engineering
... IEC 61000-4-11 : - Voltage dips, short interruptions and voltage variations immunity tests IEC 61000-4-13: - Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests IEC 61000-4-14: - Voltage fluctuation immunity test for equipment with input current n ...
... IEC 61000-4-11 : - Voltage dips, short interruptions and voltage variations immunity tests IEC 61000-4-13: - Harmonics and interharmonics including mains signalling at a.c. power port, low frequency immunity tests IEC 61000-4-14: - Voltage fluctuation immunity test for equipment with input current n ...
Components of Training for Bell Atlantic
... electrical static discharge during installation. Static discharge can, for example, result from handling electronic components or using packaging material improperly, neither of which is related to grounding. By contrast, a good ground will reduce damage in a lightning hit during installation by shu ...
... electrical static discharge during installation. Static discharge can, for example, result from handling electronic components or using packaging material improperly, neither of which is related to grounding. By contrast, a good ground will reduce damage in a lightning hit during installation by shu ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.