H10
... portion of the test circuit should generate a sequence of all possible inputs, while the second portion should combine the output of all NAND gates under test with the known good signal. The output of the overall test circuit should illuminate one LED if any fault is detected. Assume that a 1KHz TTL ...
... portion of the test circuit should generate a sequence of all possible inputs, while the second portion should combine the output of all NAND gates under test with the known good signal. The output of the overall test circuit should illuminate one LED if any fault is detected. Assume that a 1KHz TTL ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.