ADM1181A 数据手册DataSheet 下载
... Charge-Pump DC-to-DC Voltage Converter The charge-pump voltage converter consists of a 200 kHz oscillator and a switching matrix. The converter generates a ±10 V supply from the input 5 V level. This is done in two stages, using a switched capacitor technique, as illustrated in Figure 6 and Figure 7 ...
... Charge-Pump DC-to-DC Voltage Converter The charge-pump voltage converter consists of a 200 kHz oscillator and a switching matrix. The converter generates a ±10 V supply from the input 5 V level. This is done in two stages, using a switched capacitor technique, as illustrated in Figure 6 and Figure 7 ...
DM-300 Series Brochure
... Four Multimeters, Four Reasons To Buy Greenlee DM-300 Series Digital Multimeters... Improving testing one meter at a time Greenlee’s introduction of the DM-300 Series digital multimeters gives the electrician four more reasons to own a Greenlee test instrument and is an extension of the already bro ...
... Four Multimeters, Four Reasons To Buy Greenlee DM-300 Series Digital Multimeters... Improving testing one meter at a time Greenlee’s introduction of the DM-300 Series digital multimeters gives the electrician four more reasons to own a Greenlee test instrument and is an extension of the already bro ...
AC versus DC Measurement Methods for Low
... Regardless of the instruments used to carry out the AC measurements, the test current flows through the source connection leads and develops a voltage drop from the circuit ground to the connection to the DUT, denoted as Circuit Node A. Thus, the voltage at circuit node A moves up and down, with an ...
... Regardless of the instruments used to carry out the AC measurements, the test current flows through the source connection leads and develops a voltage drop from the circuit ground to the connection to the DUT, denoted as Circuit Node A. Thus, the voltage at circuit node A moves up and down, with an ...
BAX16 B A X
... This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. ...
... This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. ...
Insulation resistance
... resistance, which is measured between the active conductors and the protective earth conductor connected to earth. During this test the active conductors are allowed to be connected together electrically. The DC measuring voltage and the magnitude of the insulation resistance must comply with the re ...
... resistance, which is measured between the active conductors and the protective earth conductor connected to earth. During this test the active conductors are allowed to be connected together electrically. The DC measuring voltage and the magnitude of the insulation resistance must comply with the re ...
ICS83947I - Integrated Device Technology
... NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2. NOTE 4: These parameters are guaranteed by characterization. Not tested in production. ...
... NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2. NOTE 4: These parameters are guaranteed by characterization. Not tested in production. ...
NB3N5573DTGEVB Evaluation Board User's Manual EVAL BOARD USER’S MANUAL
... are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor doe ...
... are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor doe ...
Verify Performance and Safety of Arc-Flash Detection Systems
... compensates for any sacrifice in the current security. E. Consequences of Misoperation The consequences of misoperation of the arc-flash detection scheme depend on the process and arc suppression system. When isolating the fault with a standard circuit breaker, the result of a false trip (tripping w ...
... compensates for any sacrifice in the current security. E. Consequences of Misoperation The consequences of misoperation of the arc-flash detection scheme depend on the process and arc suppression system. When isolating the fault with a standard circuit breaker, the result of a false trip (tripping w ...
Automatic Resistance Measurements on High Temperature
... resistance. The voltage leads should be made of a material with a low Seebeck coefficient with respect to the sample. The sensitivity of the Model 2182 Nanovoltmeter is crucial to obtaining precision measurements because the application demands the ability to measure extremely low voltages. If the a ...
... resistance. The voltage leads should be made of a material with a low Seebeck coefficient with respect to the sample. The sensitivity of the Model 2182 Nanovoltmeter is crucial to obtaining precision measurements because the application demands the ability to measure extremely low voltages. If the a ...
CENTRAL STAFF TRAINING AND RESEARCH INSTITUTE MINISTRY OF LABOUR AND EMPLOYMENT
... Understand the basic principles of electricity, its various effects, types and functions of electrical components. Know about network theorem and apply it in solving simple numerical problems. Make simple electrical circuits and joints Know about various chemical effect of electricity, Charge batter ...
... Understand the basic principles of electricity, its various effects, types and functions of electrical components. Know about network theorem and apply it in solving simple numerical problems. Make simple electrical circuits and joints Know about various chemical effect of electricity, Charge batter ...
Optimizing 1200V IGBT Modules for High Frequency Applications
... I. INTRODUCTION The fundamental trade-off between turn-off switching loss (ESW(off)) and on state voltage drop (VCE(sat)) in IGBT chip design is well known. Standard industrial IGBT modules are typically optimized for motor drive and similar applications in which the carrier frequency is typically 1 ...
... I. INTRODUCTION The fundamental trade-off between turn-off switching loss (ESW(off)) and on state voltage drop (VCE(sat)) in IGBT chip design is well known. Standard industrial IGBT modules are typically optimized for motor drive and similar applications in which the carrier frequency is typically 1 ...
Word - ITU
... Total harmonic distortion (THD) may be measured using a single-tone test signal at 9 dBu0s, at frequencies in the range from 40 Hz to 1 kHz, and the result expressed as a “separation” value (i.e. the difference in level between the test signal and the harmonics, expressed in dB). Distortion may, al ...
... Total harmonic distortion (THD) may be measured using a single-tone test signal at 9 dBu0s, at frequencies in the range from 40 Hz to 1 kHz, and the result expressed as a “separation” value (i.e. the difference in level between the test signal and the harmonics, expressed in dB). Distortion may, al ...
CMOS Latched 4-/8-Channel Analog Multiplexers ADG528A/ADG529A
... address and enable inputs. The latches are level sensitive; therefore, while WR is held low, the latches are transparent and the switches respond to the address and enable inputs. This input data is latched on the rising edge of WR. Figure 2 shows the Reset Pulse Width, tRS, and Reset Turn-off Time, ...
... address and enable inputs. The latches are level sensitive; therefore, while WR is held low, the latches are transparent and the switches respond to the address and enable inputs. This input data is latched on the rising edge of WR. Figure 2 shows the Reset Pulse Width, tRS, and Reset Turn-off Time, ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.