IGC142T120T8RH IGBT4 High Power Chip
... Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automo ...
... Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automo ...
Probing Transistors at the Contact Level in Integrated Circuits
... under an optical microscope has been, for many years, the primary means of characterizing an ICs electrical performance. Since advances in IC technology follow Moores Law of decreasing scale, the complexity of producing and testing the more advanced ICs has increased. More powerful microscopes an ...
... under an optical microscope has been, for many years, the primary means of characterizing an ICs electrical performance. Since advances in IC technology follow Moores Law of decreasing scale, the complexity of producing and testing the more advanced ICs has increased. More powerful microscopes an ...
Static Control for Semiconductor Manufacturing Brochure - Simco-Ion
... Ionizing Guns Model 6115 AirForce Gun and the Top Gun provides handheld blow-off ionization. For voltage sensitive applications, Critical Environment Blower models provide ionization at 3V and down to 1V when used with a Novx monitor. ...
... Ionizing Guns Model 6115 AirForce Gun and the Top Gun provides handheld blow-off ionization. For voltage sensitive applications, Critical Environment Blower models provide ionization at 3V and down to 1V when used with a Novx monitor. ...
22900_draft_5c_(2016_03_15)
... Devices to be irradiated shall be mounted on test circuit boards together with any associated circuitry necessary for application of bias during irradiation or for in-situ measurements. Other than devices under test, components that are placed on the board(s) shall be insensitive to the required acc ...
... Devices to be irradiated shall be mounted on test circuit boards together with any associated circuitry necessary for application of bias during irradiation or for in-situ measurements. Other than devices under test, components that are placed on the board(s) shall be insensitive to the required acc ...
a nanometer profiling device with contact force
... It is known that in order to measure the surface profiles or the 3D topography, contact or noncontact type profiling devices can be considered. The non-contact type instruments are typically optical ones and rely on the reflected lights from the measured surfaces. Due to the lights being used, the n ...
... It is known that in order to measure the surface profiles or the 3D topography, contact or noncontact type profiling devices can be considered. The non-contact type instruments are typically optical ones and rely on the reflected lights from the measured surfaces. Due to the lights being used, the n ...
μ PA2379T1P Data Sheet
... 1. This device is very thin device and should be handled with caution for mechanical stress. The distortion applied to the device should become below 2000 × 10-6. If the distortion exceeds 2000 × 10-6, the characteristic of a device may be degraded and it may result in failure. 2. Please do not dama ...
... 1. This device is very thin device and should be handled with caution for mechanical stress. The distortion applied to the device should become below 2000 × 10-6. If the distortion exceeds 2000 × 10-6, the characteristic of a device may be degraded and it may result in failure. 2. Please do not dama ...
PI3CH3257
... 1. See test circuit and waveforms. 2. This parameter is guaranteed but not tested on Propagation Delays. 3. The switch contributes no propagational delay other than the RC delay of the On-Resistance of the switch and the load capacitance. The time constant for the switch alone is of the order of 0.3 ...
... 1. See test circuit and waveforms. 2. This parameter is guaranteed but not tested on Propagation Delays. 3. The switch contributes no propagational delay other than the RC delay of the On-Resistance of the switch and the load capacitance. The time constant for the switch alone is of the order of 0.3 ...
The IT (unearthed) power supply system
... Insulation monitoring devices are required in all IT power supply systems, according to standards IEC 60364-441: 1992. The product standard of the devices is described in IEC 61557-8:1999. Standard for insulation fault location systems A major factor for safe operation and availability of electrical ...
... Insulation monitoring devices are required in all IT power supply systems, according to standards IEC 60364-441: 1992. The product standard of the devices is described in IEC 61557-8:1999. Standard for insulation fault location systems A major factor for safe operation and availability of electrical ...
SIGC54T65R3E
... Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automo ...
... Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automo ...
STANDARD REVIEW PLAN
... in part, “No credible failure on the non-safety side of an isolation device shall prevent any portion of a safety system from meeting its minimum performance requirements during and following any design basis event requiring that safety function.” IEEE Std 279-1971, Clause 4.7.2, “Isolation Devices, ...
... in part, “No credible failure on the non-safety side of an isolation device shall prevent any portion of a safety system from meeting its minimum performance requirements during and following any design basis event requiring that safety function.” IEEE Std 279-1971, Clause 4.7.2, “Isolation Devices, ...
TrueAlert Multi-Candela Addr Amber VO (Strobe)
... current and ensuring a consistent current draw and voltage drop margin under both primary power and secondary battery standby. Efficiencies include wiring distances up to 2 to 3 times farther than with conventional notification, or support for more appliances per IDNAC SLC, or use of smaller gauge w ...
... current and ensuring a consistent current draw and voltage drop margin under both primary power and secondary battery standby. Efficiencies include wiring distances up to 2 to 3 times farther than with conventional notification, or support for more appliances per IDNAC SLC, or use of smaller gauge w ...
SN65EPT22 数据资料 dataSheet 下载
... Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant ...
... Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or service without notice. Customers should obtain the latest relevant ...
t GUIDE GUIDE 1.180 GUIDELINES
... Existing I&C equipment in nuclear power plants is currently being replaced with computer-based digital I&C systems or advanced analog systems. However, these technologies may exhibit greater vulnerability to the nuclear power plant EMI/RFI environment than existing I&C systems. This regulatory guide ...
... Existing I&C equipment in nuclear power plants is currently being replaced with computer-based digital I&C systems or advanced analog systems. However, these technologies may exhibit greater vulnerability to the nuclear power plant EMI/RFI environment than existing I&C systems. This regulatory guide ...
Gebrauchsanweisung ZEUS Defi
... To perform a test, execute the following steps: 1. Build up the experimental setup in accordance to the standards: block diagrams and instructions of the standards EN 60601-1, EN 60601-2-25. 2. Exclude all sources of danger for the tester. For example, be careful at the safety distances and prevent ...
... To perform a test, execute the following steps: 1. Build up the experimental setup in accordance to the standards: block diagrams and instructions of the standards EN 60601-1, EN 60601-2-25. 2. Exclude all sources of danger for the tester. For example, be careful at the safety distances and prevent ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.