AS/NZS 3760:2003 STANDARDS AUSTRALIA/STANDARDS NEW
... equipment is not required by this Standard; (b) Where the flexible cable or cord is flexed on equipment which is moved for restocking, maintenance, cleaning, etc., is considered to require in – service testing. 1.2.4 Hire equipment 1.2.4.1 Responsibility for hire equipment at the commencement of hir ...
... equipment is not required by this Standard; (b) Where the flexible cable or cord is flexed on equipment which is moved for restocking, maintenance, cleaning, etc., is considered to require in – service testing. 1.2.4 Hire equipment 1.2.4.1 Responsibility for hire equipment at the commencement of hir ...
Full Chip LPE Rule File Generator
... Experiment (DoE) and scripting language, allows support for any full chip parasitic extractor. Exact delivers the most accurate interconnect models for nanometer semiconductor processes and generates full chip layout parameter extraction (LPE) rule files. • powerful 3d field solver supports non-planar ...
... Experiment (DoE) and scripting language, allows support for any full chip parasitic extractor. Exact delivers the most accurate interconnect models for nanometer semiconductor processes and generates full chip layout parameter extraction (LPE) rule files. • powerful 3d field solver supports non-planar ...
CC2541-Q1 - Texas Instruments
... The CC2541-Q1 is a power-optimized true Wireless MCU solution for both Bluetooth low energy and proprietary 2.4-GHz applications. This device enables the building of robust nework nodes with low total bill-of-material costs. The CC2541-Q1 combines the excellent performance of a leading RF transceive ...
... The CC2541-Q1 is a power-optimized true Wireless MCU solution for both Bluetooth low energy and proprietary 2.4-GHz applications. This device enables the building of robust nework nodes with low total bill-of-material costs. The CC2541-Q1 combines the excellent performance of a leading RF transceive ...
KSA114 2 PNP Epitaxial Silicon Transistor Absolute Maximum Ratings
... result in significant injury to the user. ...
... result in significant injury to the user. ...
2 general characteristics
... Thermal Sensors radiation, it is difficult to have the best initial adjustment for the different applications. Therefore some deviations could be found at first measuring. For all applications the optimised solution can be prepared and fixed based on the measurement in the application. Don't hesitat ...
... Thermal Sensors radiation, it is difficult to have the best initial adjustment for the different applications. Therefore some deviations could be found at first measuring. For all applications the optimised solution can be prepared and fixed based on the measurement in the application. Don't hesitat ...
Technical diagnostics for power apparatus
... timely interventions. There are different aims of diagnosis significant for the power equipment: The detection of pattern changes in used materials, the detection of humidity and pollution at components and apparatus, the detection of electrical discharges in apparatus, equipment and sytems, the det ...
... timely interventions. There are different aims of diagnosis significant for the power equipment: The detection of pattern changes in used materials, the detection of humidity and pollution at components and apparatus, the detection of electrical discharges in apparatus, equipment and sytems, the det ...
CP0316
... A mounting system consisting of either a self-supporting or bolt-in switch body. An operating/actuating system common to all switch assemblies, except the stored energy increases with increasing number of decks (phases) and increasing number of contacts engaged. A dielectric system of insulation and ...
... A mounting system consisting of either a self-supporting or bolt-in switch body. An operating/actuating system common to all switch assemblies, except the stored energy increases with increasing number of decks (phases) and increasing number of contacts engaged. A dielectric system of insulation and ...
LM565 - Engineering Electronics Shop
... help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and requirements. Nonetheless, such components are subject to these terms. No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) ...
... help enable customers to design and create their own end-product solutions that meet applicable functional safety standards and requirements. Nonetheless, such components are subject to these terms. No TI components are authorized for use in FDA Class III (or similar life-critical medical equipment) ...
Accurate Low-Resistance Measurements Start with Identifying
... Non-ohmic contacts are evident when the potential difference across the contact isn’t linearly proportional to the current flowing through it. They may occur in a low-voltage circuit as a result of oxide films or other non-linear connections and are likely to rectify any radio frequency energy (RFI) ...
... Non-ohmic contacts are evident when the potential difference across the contact isn’t linearly proportional to the current flowing through it. They may occur in a low-voltage circuit as a result of oxide films or other non-linear connections and are likely to rectify any radio frequency energy (RFI) ...
TUSB9261 Errata (Rev. B)
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
Common Mode Rejection Ratio Tester (CMRR 2.0) User
... From a testing point of view the series 100pF introduces significant complications, as it represents a very high impedance of about 30MΩ at 50/60Hz. This means that attempts to measure the applied voltage (10Vrms) with a normal multimeter will fail, because the meter has around 10MΩ input impedance. ...
... From a testing point of view the series 100pF introduces significant complications, as it represents a very high impedance of about 30MΩ at 50/60Hz. This means that attempts to measure the applied voltage (10Vrms) with a normal multimeter will fail, because the meter has around 10MΩ input impedance. ...
nAN27 Measuring the Dynamic Current of
... Understanding the peak current and average current of a device is necessary for maximizing battery lifetime. Battery size and lifetime are important factors in battery driven applications. Smaller batteries allow for smaller applications, while low average current helps maximize battery lifetime. Th ...
... Understanding the peak current and average current of a device is necessary for maximizing battery lifetime. Battery size and lifetime are important factors in battery driven applications. Smaller batteries allow for smaller applications, while low average current helps maximize battery lifetime. Th ...
particle impact noise detection (pind) combines
... data on devices identified as containing particles and the results of analysis on the devices were poor. [3]. Analysis of defects that passed sinusoidal vibration tests indicated that many contained particles. Additionally, the imposed mechanical stresses are believed to generate particles. This tes ...
... data on devices identified as containing particles and the results of analysis on the devices were poor. [3]. Analysis of defects that passed sinusoidal vibration tests indicated that many contained particles. Additionally, the imposed mechanical stresses are believed to generate particles. This tes ...
108-51089
... Samples shall be selected at random from current production. The number of test points will correspond to the number of positions on the connector. B. Test Sequence Qualification inspection shall be verified by testing samples as specified in Figure 1 and 2. C. Test sequence shall be serialised for ...
... Samples shall be selected at random from current production. The number of test points will correspond to the number of positions on the connector. B. Test Sequence Qualification inspection shall be verified by testing samples as specified in Figure 1 and 2. C. Test sequence shall be serialised for ...
- Pcpolytechnic
... As shown in fig.(1), F1, F2 are two identical circular, air cored coils. They are connected in series and these coils are placed in parallel to each other. They produced a uniform magnetic field. M is a light moving coils. It lies in the magnetic field produced by F1, F2. moving coil is supporte ...
... As shown in fig.(1), F1, F2 are two identical circular, air cored coils. They are connected in series and these coils are placed in parallel to each other. They produced a uniform magnetic field. M is a light moving coils. It lies in the magnetic field produced by F1, F2. moving coil is supporte ...
General Description Features
... The MAXADC-RTD board is a plug-n-play temperatureacquisition EV kit that connects to the PC through a USB cable. The MAXADC-RTD provides accurate temperature-measurement readings in the -15NC to +100NC range and does not require an external power supply or a USB device driver. The RTD is soldered on ...
... The MAXADC-RTD board is a plug-n-play temperatureacquisition EV kit that connects to the PC through a USB cable. The MAXADC-RTD provides accurate temperature-measurement readings in the -15NC to +100NC range and does not require an external power supply or a USB device driver. The RTD is soldered on ...
SCB-100 Installation Guide
... Measurement error is the result of inaccuracies in the MIO DAQ device, including gain and offset. If the MIO DAQ device is properly calibrated, the offset error should be zero. The only remaining error is a gain error of ±0.08% of full range (refer to the DAQ device specifications). If the input ran ...
... Measurement error is the result of inaccuracies in the MIO DAQ device, including gain and offset. If the MIO DAQ device is properly calibrated, the offset error should be zero. The only remaining error is a gain error of ±0.08% of full range (refer to the DAQ device specifications). If the input ran ...
AND8414 - Everything You Wanted to Know About Digital
... digitally controlled, (2) programmable, (3) cost effective in manufacturing (4) more reliable, (5) fast, (6) compatible with standard automated assembly techniques, (7) smaller size, and (8) lower weight. ...
... digitally controlled, (2) programmable, (3) cost effective in manufacturing (4) more reliable, (5) fast, (6) compatible with standard automated assembly techniques, (7) smaller size, and (8) lower weight. ...
Agilent Investigating Microvia Technology for 10 Gbps
... Telecom System Physical Layer Overview Typical 10 Gbps Telecom System During the late 1990s and early 2000s the focus of network OEMs was the delivery of high-performance technology-leading communication systems to meet the demands for ever greater telecom bandwidths. Chassis and backplane design w ...
... Telecom System Physical Layer Overview Typical 10 Gbps Telecom System During the late 1990s and early 2000s the focus of network OEMs was the delivery of high-performance technology-leading communication systems to meet the demands for ever greater telecom bandwidths. Chassis and backplane design w ...
relaycard-sdu - Sola/Hevi-Duty
... • One interface cable (DB-9 connector) • One 12 V dc power interconnection cable • Four M3 mounting screws ...
... • One interface cable (DB-9 connector) • One 12 V dc power interconnection cable • Four M3 mounting screws ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.