BUS-12-114 PRODUCT SPECIFICATION Duplex Plated Bergstik® II
... Requalification Testing - If any of the following conditions occur, the responsible product engineer shall initiate requalification testing consisting of all applicable parts of the qualification test matrix, Table I. a. A significant design change is made to the existing product which impacts the p ...
... Requalification Testing - If any of the following conditions occur, the responsible product engineer shall initiate requalification testing consisting of all applicable parts of the qualification test matrix, Table I. a. A significant design change is made to the existing product which impacts the p ...
The RS-485 Unit Load and Maximum Number of
... any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI wa ...
... any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI wa ...
Using a Load Box to Verify a
... of the tester are functioning properly. To verify the Ground Bond portion, high current resistor values of 50mΩ and 150mΩ are used. Ground Bond (GB) verification is performed from the ground blade of the power entry adapter to the binding post. Typically, the maximum limit for Ground Bond is 100mΩ. ...
... of the tester are functioning properly. To verify the Ground Bond portion, high current resistor values of 50mΩ and 150mΩ are used. Ground Bond (GB) verification is performed from the ground blade of the power entry adapter to the binding post. Typically, the maximum limit for Ground Bond is 100mΩ. ...
ECP 11-0512c Schneider RN2, RN6, RN2c and
... Protection settings are displayed on the relay front panel (see section A.2) along with manual reset and trip flags. The CTs are connected to one of two sets of inputs to the relay, to give two different setting current ranges. It is important to ensure that the correct scale label (see section A.3) ...
... Protection settings are displayed on the relay front panel (see section A.2) along with manual reset and trip flags. The CTs are connected to one of two sets of inputs to the relay, to give two different setting current ranges. It is important to ensure that the correct scale label (see section A.3) ...
Wording for TIA-1083
... source not found., change the volume control setting, or move the probe to another location within the measurement area specified in step 3, or both, and repeat steps 4 through 8 above until all of the requirements are met or until the maximum volume control setting has been tested. 11. Repeat steps ...
... source not found., change the volume control setting, or move the probe to another location within the measurement area specified in step 3, or both, and repeat steps 4 through 8 above until all of the requirements are met or until the maximum volume control setting has been tested. 11. Repeat steps ...
electrometer - IDC Technologies
... original potential difference between the conductor and the uncharged electroscope. 2. Place an isolated, charged conductor in contact with the terminal. The proportion of the conductor's charge that ends up on the terminal depends on their relative capacitances. This charge remains on the electrosc ...
... original potential difference between the conductor and the uncharged electroscope. 2. Place an isolated, charged conductor in contact with the terminal. The proportion of the conductor's charge that ends up on the terminal depends on their relative capacitances. This charge remains on the electrosc ...
High Temperature Guide (Rev. E)
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
TrueAlert Addressable Notification Appliances
... drop margin under both primary power and secondary battery standby. Efficiencies include wiring distances up to 2 to 3 times farther than with conventional notification, or support for more appliances per IDNAC SLC, or use of smaller gauge wiring, or combinations of these benefits, all providing ins ...
... drop margin under both primary power and secondary battery standby. Efficiencies include wiring distances up to 2 to 3 times farther than with conventional notification, or support for more appliances per IDNAC SLC, or use of smaller gauge wiring, or combinations of these benefits, all providing ins ...
FAX Cover Sheet I To: Mr. Joe Birmingham
... A conduit run will be tested along with each tray as sketched below. The conduit run will simulate expoasre of (ray-run cables to a plume or hot gas layer (in that the cables within conduit are not directly subjected to flame impingement), as well as directly testing the potcntial for fire-induccd c ...
... A conduit run will be tested along with each tray as sketched below. The conduit run will simulate expoasre of (ray-run cables to a plume or hot gas layer (in that the cables within conduit are not directly subjected to flame impingement), as well as directly testing the potcntial for fire-induccd c ...
Fault Testing of Analog Circuits Using Web Site: www.ijaiem.org Email: ,
... computations increase with the cube of the system size. Therefore, in order to meet the needs of modern technology, a reliable and cost-efficient automatic test system for large scale electronic circuits should be developed. Electronic circuit testing can be broadly classified into digital circuit t ...
... computations increase with the cube of the system size. Therefore, in order to meet the needs of modern technology, a reliable and cost-efficient automatic test system for large scale electronic circuits should be developed. Electronic circuit testing can be broadly classified into digital circuit t ...
DS34LV86T 3V Enhanced CMOS Quad
... CMOS receiver that meets the requirements of both TIA/EIA-422-B and ITU-T V.11. The CMOS DS34LV86T features typical low static ICC of 9 mA which makes it ideal for battery powered and power conscious applications. The Tri-State enables, EN, allow the device to be disabled when not in use to minimize ...
... CMOS receiver that meets the requirements of both TIA/EIA-422-B and ITU-T V.11. The CMOS DS34LV86T features typical low static ICC of 9 mA which makes it ideal for battery powered and power conscious applications. The Tri-State enables, EN, allow the device to be disabled when not in use to minimize ...
8-Bit Parallel-Out Serial Shift Register (Rev. D)
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
NS5S1153MUGEVB DPDT USB 2.0 High Speed / Audio Switch with Negative
... are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marki ...
... are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marki ...
PCA9306 - Texas Instruments
... The PCA9306 device is a dual bidirectional I2C and SMBus voltage-level translator with an enable (EN) input and operates without use of a direction pin. The voltage supply range for VREF1 is 1.2 V to 3.3 V and the supply range for VREF2 is 1.8 V to 5.5 V. The PCA9306 device can also be used to run t ...
... The PCA9306 device is a dual bidirectional I2C and SMBus voltage-level translator with an enable (EN) input and operates without use of a direction pin. The voltage supply range for VREF1 is 1.2 V to 3.3 V and the supply range for VREF2 is 1.8 V to 5.5 V. The PCA9306 device can also be used to run t ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.