AN-1318 LM3501 Evaluation Board (Rev. A)
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
Evaluating Microstrip with Time Domain Reflectometry
... In the world of high-speed digital design, clock rates are increasing at a dramatic pace. Gigabit per second data rates are creating signal integrity problems for printed circuit board structures such as backplanes, microstrip traces and interconnects. While simulation tools allow helpful insights i ...
... In the world of high-speed digital design, clock rates are increasing at a dramatic pace. Gigabit per second data rates are creating signal integrity problems for printed circuit board structures such as backplanes, microstrip traces and interconnects. While simulation tools allow helpful insights i ...
How to Test for Iron and Nickel – Canadian Conservation Institute
... Iron and nickel are industrial metals. Both are white metals, and both are magnetic, so they cannot be distinguished with a simple magnet test. Iron is much more susceptible to corrosion, so it is important to identify it. Nickel is often found in alloys, or as a plating layer. For example, nickel s ...
... Iron and nickel are industrial metals. Both are white metals, and both are magnetic, so they cannot be distinguished with a simple magnet test. Iron is much more susceptible to corrosion, so it is important to identify it. Nickel is often found in alloys, or as a plating layer. For example, nickel s ...
Technical Protocol
... ! Auto Zero ON (side effect: this doubles the measurement time!) The data transfer to the computer is initiated by the command: :READ? The instrument will respond with a text string giving the measured current in ampere. ...
... ! Auto Zero ON (side effect: this doubles the measurement time!) The data transfer to the computer is initiated by the command: :READ? The instrument will respond with a text string giving the measured current in ampere. ...
BDTIC 1N458A
... device or system whose failure to perform can be or (b) support or sustain life, or (c) whose failure to perform reasonably expected to cause the failure of the life support when properly used in accordance with instructions for use device or system, or to affect its safety or effectiveness. provide ...
... device or system whose failure to perform can be or (b) support or sustain life, or (c) whose failure to perform reasonably expected to cause the failure of the life support when properly used in accordance with instructions for use device or system, or to affect its safety or effectiveness. provide ...
CP9806
... Class, 200 Amp loadbreak elbows (LE225), which were assembled onto properly prepared XLPE insulated cables. Each insert/elbow assembly tested was mounted in a fixture with all normally grounded parts grounded in a manner approximating normal service conditions. Adjacent grounds consisting of a bushi ...
... Class, 200 Amp loadbreak elbows (LE225), which were assembled onto properly prepared XLPE insulated cables. Each insert/elbow assembly tested was mounted in a fixture with all normally grounded parts grounded in a manner approximating normal service conditions. Adjacent grounds consisting of a bushi ...
Installation Manual
... • Do not install the detector beyond the maximum recommended range, even if the AFT–100 simulator shows additional range - future changes in room acoustics could reduce the range. • Application on 24 hour loops should be avoided unless the location is unoccupied. • Test false alarm immunity by creat ...
... • Do not install the detector beyond the maximum recommended range, even if the AFT–100 simulator shows additional range - future changes in room acoustics could reduce the range. • Application on 24 hour loops should be avoided unless the location is unoccupied. • Test false alarm immunity by creat ...
Elf: computer automation and error correction for a
... which were modified to be voltage controlled sources. Choice three is the IEEE-488 controlled sweeper. Choice four is used with the voltage-controlled sweepers: it uses the counter to measure the extremes of the frequency sweep of the source. Selection five can then be used to choose a sub-range of ...
... which were modified to be voltage controlled sources. Choice three is the IEEE-488 controlled sweeper. Choice four is used with the voltage-controlled sweepers: it uses the counter to measure the extremes of the frequency sweep of the source. Selection five can then be used to choose a sub-range of ...
Calibration of AC resistance thermometry bridges traceable to
... generating a set of resistance values that exercise the bridge over its working range. This instrument was invented by Rod White of the New Zealand national laboratory. The RBC contains four precision resistors, which can be connected in various series and/or parallel combinations. ...
... generating a set of resistance values that exercise the bridge over its working range. This instrument was invented by Rod White of the New Zealand national laboratory. The RBC contains four precision resistors, which can be connected in various series and/or parallel combinations. ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.