3.3-V ECL Differential Receiver (Rev. A)
... Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are assured only over the declared operating temperature range. Functional operati ...
... Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are assured only over the declared operating temperature range. Functional operati ...
MS-4(E) - Fire
... • Maximum available current: 500 mA — appropriate for powering four-wire smoke detectors (see notes). • Power-limited circuitry. Notes: 1) Refer to the Fire•Lite Device Compatibility Document for a complete list of compatible devices. ...
... • Maximum available current: 500 mA — appropriate for powering four-wire smoke detectors (see notes). • Power-limited circuitry. Notes: 1) Refer to the Fire•Lite Device Compatibility Document for a complete list of compatible devices. ...
RF and Microwave Control Products in Silicon
... The GaAs process has integration limitations due to the device characteristics. In GaAs, the pHEMT device threshold voltage varies between –1 V and –3 V. Designing complex interface circuits like low voltage CMOS interfaces is not feasible, so external circuits are needed for GaAs devices. In the si ...
... The GaAs process has integration limitations due to the device characteristics. In GaAs, the pHEMT device threshold voltage varies between –1 V and –3 V. Designing complex interface circuits like low voltage CMOS interfaces is not feasible, so external circuits are needed for GaAs devices. In the si ...
BDTIC Zener 1N5231C Zener (1N5231C)
... 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, o ...
... 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, o ...
Part 4 - iaria
... Clearly define immunity test pass/fail (malfunction) criteria: – Equipment performs “as intended” ...
... Clearly define immunity test pass/fail (malfunction) criteria: – Equipment performs “as intended” ...
Unit V - SriRajkumar
... Transformer is one of the most expensive and important equipment in power system. If it is not suitably designed its failure may cause a lengthy and costly outage. Therefore, it is very important to be cautious while designing its insulation, so that it can withstand transient over voltage both d ...
... Transformer is one of the most expensive and important equipment in power system. If it is not suitably designed its failure may cause a lengthy and costly outage. Therefore, it is very important to be cautious while designing its insulation, so that it can withstand transient over voltage both d ...
5-V PECL/ECL 1:2 Fanout Buffer
... Maximum switching frequency is measured at an output amplitude of 300 mVpp. Within-device skew defined as identical transitions on similar paths through a device. Duty cycle skew is the difference between a tPLH and tPHL propagation delay through a device. VPP(min) is the minimum input swing for whi ...
... Maximum switching frequency is measured at an output amplitude of 300 mVpp. Within-device skew defined as identical transitions on similar paths through a device. Duty cycle skew is the difference between a tPLH and tPHL propagation delay through a device. VPP(min) is the minimum input swing for whi ...
SCAN92LV090 9 Channel Bus LVDS Transceiver w/ Boundary SCAN General Description
... 9 Channel Bus LVDS Transceiver w/ Boundary SCAN General Description The SCAN92LV090A is one in a series of Bus LVDS transceivers designed specifically for the high speed, low power proprietary backplane or cable interfaces. The device operates from a single 3.3V power supply and includes nine differ ...
... 9 Channel Bus LVDS Transceiver w/ Boundary SCAN General Description The SCAN92LV090A is one in a series of Bus LVDS transceivers designed specifically for the high speed, low power proprietary backplane or cable interfaces. The device operates from a single 3.3V power supply and includes nine differ ...
Calorimeter Electronics
... for the 20MHz sampling rate. The main functions of the post amplifier are: A: Receives the differential signal from the preamplifiers. The differential receivers with high common mode rejection ratio are adopted for the signals from the two preamplifiers A and B. Three choices can be made by the po ...
... for the 20MHz sampling rate. The main functions of the post amplifier are: A: Receives the differential signal from the preamplifiers. The differential receivers with high common mode rejection ratio are adopted for the signals from the two preamplifiers A and B. Three choices can be made by the po ...
A - C SUBMERSIBLE PUMP TEST
... 10 minute intervals until 3 are obtained with no over one-half of 1% variation at the 25º base. Compute the resistance at 25º from the resistance taken, deducting first the lead resistance and dividing by the factors given in Table 43012 at the corresponding ambient temperature. Record all data on Te ...
... 10 minute intervals until 3 are obtained with no over one-half of 1% variation at the 25º base. Compute the resistance at 25º from the resistance taken, deducting first the lead resistance and dividing by the factors given in Table 43012 at the corresponding ambient temperature. Record all data on Te ...
EM Test Switch installation manual
... 11. WIRING AND INTERLINKING Multiple Emergency Test Switches can be interlinked so that multiple emergency systems can be triggered at the same time when one or more lighting circuits fail. Up to 6x units can be connected together, allowing up to 30 main circuits to be monitored. The units being int ...
... 11. WIRING AND INTERLINKING Multiple Emergency Test Switches can be interlinked so that multiple emergency systems can be triggered at the same time when one or more lighting circuits fail. Up to 6x units can be connected together, allowing up to 30 main circuits to be monitored. The units being int ...
Human Machine Interface (HMI) Solution Guide
... HMIs require dynamically changing graphics which, in turn, require a highperformance solution that can achieve the 60 frame-per-second refresh rate that is required at the right resolution. They also have to support multiple connectivity and communications protocols to communicate between the ope ...
... HMIs require dynamically changing graphics which, in turn, require a highperformance solution that can achieve the 60 frame-per-second refresh rate that is required at the right resolution. They also have to support multiple connectivity and communications protocols to communicate between the ope ...
LM340LAZ-5.0/NOPB - Texas Instruments High
... applications. The LM140LA is an improved version of the LM78LXX series with a tighter output voltage tolerance (specified over the full military temperature range), higher ripple rejection, better regulation and lower quiescent current. The LM140LA regulators have ±2% VOUT specification, 0.04%/V lin ...
... applications. The LM140LA is an improved version of the LM78LXX series with a tighter output voltage tolerance (specified over the full military temperature range), higher ripple rejection, better regulation and lower quiescent current. The LM140LA regulators have ±2% VOUT specification, 0.04%/V lin ...
9.28 Output Pulse Template, 1.544 Mb/s TIA-968
... Line Build Out (LBO) controls the pulse shape in order to present a compatible signal input for some T1 line repeaters or to limit crosstalk on non-repeatered route junctions. Paragraph 4.5.8.2.3 requires that the equipment provide an option to set the amplitude of the T1 signal presented to the net ...
... Line Build Out (LBO) controls the pulse shape in order to present a compatible signal input for some T1 line repeaters or to limit crosstalk on non-repeatered route junctions. Paragraph 4.5.8.2.3 requires that the equipment provide an option to set the amplitude of the T1 signal presented to the net ...
White Paper for RG-IS2700G Switch Reliability
... Product reliability is classified into inherent reliability and work reliability. Inherent reliability is an inherent characteristic endowed to a product during design and manufacture, and can be controlled by product development personnel. Work reliability is a characteristic of performance maintai ...
... Product reliability is classified into inherent reliability and work reliability. Inherent reliability is an inherent characteristic endowed to a product during design and manufacture, and can be controlled by product development personnel. Work reliability is a characteristic of performance maintai ...
AN-1511 Cable Discharge Event Application Report
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.