• Study Resource
  • Explore
    • Arts & Humanities
    • Business
    • Engineering & Technology
    • Foreign Language
    • History
    • Math
    • Science
    • Social Science

    Top subcategories

    • Advanced Math
    • Algebra
    • Basic Math
    • Calculus
    • Geometry
    • Linear Algebra
    • Pre-Algebra
    • Pre-Calculus
    • Statistics And Probability
    • Trigonometry
    • other →

    Top subcategories

    • Astronomy
    • Astrophysics
    • Biology
    • Chemistry
    • Earth Science
    • Environmental Science
    • Health Science
    • Physics
    • other →

    Top subcategories

    • Anthropology
    • Law
    • Political Science
    • Psychology
    • Sociology
    • other →

    Top subcategories

    • Accounting
    • Economics
    • Finance
    • Management
    • other →

    Top subcategories

    • Aerospace Engineering
    • Bioengineering
    • Chemical Engineering
    • Civil Engineering
    • Computer Science
    • Electrical Engineering
    • Industrial Engineering
    • Mechanical Engineering
    • Web Design
    • other →

    Top subcategories

    • Architecture
    • Communications
    • English
    • Gender Studies
    • Music
    • Performing Arts
    • Philosophy
    • Religious Studies
    • Writing
    • other →

    Top subcategories

    • Ancient History
    • European History
    • US History
    • World History
    • other →

    Top subcategories

    • Croatian
    • Czech
    • Finnish
    • Greek
    • Hindi
    • Japanese
    • Korean
    • Persian
    • Swedish
    • Turkish
    • other →
 
Profile Documents Logout
Upload
here
here

... flammability requirements in UL61058. Resistance to rusting: Ferrous parts, the rusting of which might impair safety, shall be adequately protected against rusting. Action required: Test required. Resistance to rusting: Ferrous parts, the rusting of which might impair safety, shall be adequately pro ...
7-Port Hub for the Universal Serial Bus w
7-Port Hub for the Universal Serial Bus w

... Provided Ganged or Per Port Supports Suspend and Resume Operations Suspend Status Pin Available for External Logic ...
CT235001EN
CT235001EN

... F. Accelerated Aging Procedure ............................... Per IEEE Std C62.11™-2005 standard, Par. 8.5 G. Duty Cycle ............................................................ Per IEEE Std C62.11™-2005 standard, Par. 8.14 H. Low-Current, Long-Duration ................................. Per IEE ...
Application Notes Reliability Testing Procedures SMD Soldering Recommendations Varistor Plus
Application Notes Reliability Testing Procedures SMD Soldering Recommendations Varistor Plus

... These reflow processes are typically associated with top-side component placement. This technique utilizes a mixture of adhesive and solder compounds (an sometimes fluxes) that are blended into a paste. The paste is then screened onto PCB soldering pads specifically designed to accept a particular s ...
SN65EL11 数据资料 dataSheet 下载
SN65EL11 数据资料 dataSheet 下载

Procedure Manual Template
Procedure Manual Template

... The output of the calibrator is shorted or the resistance of the load is too low for the calibrator to drive. Note that for the 2000 series the factory set for the current limit is set to 10mA for safety reasons, this may be adjusted by internal trimmer up to 25mA if required. 1.1.6. Note 2:Errors d ...
TVS short pulse dynamic resistance measurement and correlation
TVS short pulse dynamic resistance measurement and correlation

... A commonly used method to probe the dynamic characteristic of a TVS is the TLP (transmission line pulse). This uses square pulses with a duration between 75 ns to 200 ns with fast rise times of few nanoseconds. The equipment required is specific and expensive and is dedicated to the characterization ...
Diagnostic Fault Information Perform the Diagnostic System Check
Diagnostic Fault Information Perform the Diagnostic System Check

... Circuit/System Verification 1. Ignition ON, command the Fan 1 Relay output control ON and OFF with a scan tool. Verify the fan low speed function turns ON and OFF with each command. o If the fan low speed does not turn ON and OFF with each command, proceed with the Low Speed Inoperative diagnostic. ...
ADG719 数据手册DataSheet下载
ADG719 数据手册DataSheet下载

TPD1E10B09 Single Channel ESD Protection Device in 0402
TPD1E10B09 Single Channel ESD Protection Device in 0402

... supports a data rate up to 500 Mbps. This clamping device has a small dynamic resistance of 0.5 Ω typically. This makes the clamping voltage low when the device is actively protecting other circuits. For example, the clamping voltage is only 13 V when the device is taking 1-A transient current. The ...
MAX4989 Evaluation Kit Evaluates: General Description Features
MAX4989 Evaluation Kit Evaluates: General Description Features

... The application circuit is located at the top of the board. Jumpers JU1, JU2, and JU3 are used to control the switch connection (see Table 1). The MAX4989 is powered from the USB port that is connected to the USB host. To use a user-supplied power supply, connect a 5V supply to the VCC and GND pads. ...
Self-test GFCI with wire leads spec sheet
Self-test GFCI with wire leads spec sheet

... Flammability: Meets UL 94 requirements; V2 rated Temperature rating: -35ºC to 66ºC (-31ºF to 150.8ºF) Dielectric voltage: Withstands 2000V per UL 498 Current interrupting: Yes, at full-rated current Temperature rise: Max. 30ºC (86°F) after 100 cycles of overload @ 150% of rated current (DC) Trip ti ...
a CMOS, Low-Voltage, 3-Wire Serially-Controlled, Matrix Switches ADG738/ADG739
a CMOS, Low-Voltage, 3-Wire Serially-Controlled, Matrix Switches ADG738/ADG739

... each switch is independently controlled by an individual bit, this provides the option of having any, all, or none of the switches ON. This feature may be particularly useful in the demultiplexing application where the user may wish to direct one signal from the drain to a number of outputs (sources ...
File - J
File - J

... cables so that the UUT can be housed on the J-Testr ‘Top Mounting Plate’ or within a test fixture. The demo shows how this UUT can be 100% tested for functionality using JTAG tools (via the JTAG connection) or via any other software platform that can communicate via Ethernet (e.g. Winsock on Windows ...
Principles of Electronic Communication Systems
Principles of Electronic Communication Systems

... Voltage Measurements: RF Voltmeters  An RF voltmeter is a special piece of test equipment ...
g PWM Output Accelerometer ADXL212
g PWM Output Accelerometer ADXL212

... The ADXL212 is a high precision, low power, complete dual axis accelerometer with signal conditioned, duty cycle modulated outputs, all on a single monolithic IC. The ADXL212 measures acceleration with a full-scale range of ±2 g (typical). The ADXL212 measures both dynamic acceleration (such as vibr ...
C-14 DEE-III SEM
C-14 DEE-III SEM

... Ideal Voltage source , Ideal current source - Source transformation technique- Super position theorem- Thevenin’s Theorem -Norton’s Theorem- Maximum power transfer theorem with reference to D.C.-Problems on the above. 3.Fundamentals of A.C. Simple loop Generator –Relation between m & e -Relation b ...
ELECTRONIC MEASUREMENTS AND INSTRUMENTATION
ELECTRONIC MEASUREMENTS AND INSTRUMENTATION

... the personal handling the instrument or system for control or analysis purposes. The information conveyed must be in the form of intelligible to the personnel. The above function is done by data presentation element. The output or data of the system can be monitored by using visual display devices m ...
® PS-AT17LV010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEGABIT
® PS-AT17LV010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 1 MEGABIT

... Quality conformance inspection .................................................................................................................7 Group A inspection. ...................................................................................................................................... ...
PAT-800 PAT-805
PAT-800 PAT-805

... PAT-800 and PAT-805 digital meters are used to measure the parameters of portable electrical equipment (power tools, white goods, etc.) which determine their safety: resistance of protective conductors, insulation resistance, continuity of connections, leakage current, power. PAT-800 and PAT-805 can ...
9550 Onyx II - instructions for use - BOC e
9550 Onyx II - instructions for use - BOC e

SANS 1489-1:2005
SANS 1489-1:2005

... acceptable to the parties concluding the purchase agreement, but in relation to the inspection and testing carried out by a test laboratory , acceptable to this test laboratory ...
AN-683 - Fairchild
AN-683 - Fairchild

... coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purp ...
DS91M040 125 MHz Quad M-LVDS Transceiver DS91M040 FEATURES DESCRIPTION
DS91M040 125 MHz Quad M-LVDS Transceiver DS91M040 FEATURES DESCRIPTION

... M-LVDS (Multipoint LVDS) is a new family of bus interface devices based on LVDS technology specifically designed for multipoint and multidrop cable and backplane applications. It differs from standard LVDS in providing increased drive current to handle double terminations that are required in multip ...
Klystrons
Klystrons

... K were they rapidly allowed the cavities to reach gradients of 35 MV/m. Another 60 TTF-III couplers have been purchased by DESY for the TTF VUV-FEL (FLASH), X-FEL and ILC test modules. At least 30 of these will be conditioned at Orsay before the end of 2008. In addition to these conditioning studies ...
< 1 ... 31 32 33 34 35 36 37 38 39 ... 98 >

Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
  • studyres.com © 2025
  • DMCA
  • Privacy
  • Terms
  • Report