Power MOSFET: Rg impact on applications
... flowing during switching-on and off. The “Driver” is composed of two Power MOSFETs in push-pull configuration. The D.U.T. turn-on is achieved when a positive gate-source voltage (VGS = VS) is applied to the gate, switching on the upper MOSFET; and vice-versa, the D.U.T. turns off when the lower MOSF ...
... flowing during switching-on and off. The “Driver” is composed of two Power MOSFETs in push-pull configuration. The D.U.T. turn-on is achieved when a positive gate-source voltage (VGS = VS) is applied to the gate, switching on the upper MOSFET; and vice-versa, the D.U.T. turns off when the lower MOSF ...
30A Range Bidirectional Current Shunt Monitor
... TI Designs – Precision are analog solutions created by TI’s analog experts. Verified Designs offer the theory, component selection, simulation, complete PCB schematic & layout, bill of materials, and measured performance of useful circuits. Circuit modifications that help to meet alternate design go ...
... TI Designs – Precision are analog solutions created by TI’s analog experts. Verified Designs offer the theory, component selection, simulation, complete PCB schematic & layout, bill of materials, and measured performance of useful circuits. Circuit modifications that help to meet alternate design go ...
Interrupting Capacity vs. Interrupting Rating
... side leads are connected to the test station through 4 feet of 1 AWG. The load side is shorted by 10 inch leads of rated conductor per pole. These “bus bar condition” tests still do not fully address the situation where a fault can occur less than 4 feet 10 inches from the circuit breaker. One point ...
... side leads are connected to the test station through 4 feet of 1 AWG. The load side is shorted by 10 inch leads of rated conductor per pole. These “bus bar condition” tests still do not fully address the situation where a fault can occur less than 4 feet 10 inches from the circuit breaker. One point ...
TPS27082L - Texas Instruments
... The TPS27082L IC is a high side load switch that integrates a Power PFET and its control circuit in a tiny TSOT23 package. TPS27082L supports up to 8V supply input and up to 3A of load current. The TPS27082L can be used in a variety of applications. The device has a programmable slew rate which help ...
... The TPS27082L IC is a high side load switch that integrates a Power PFET and its control circuit in a tiny TSOT23 package. TPS27082L supports up to 8V supply input and up to 3A of load current. The TPS27082L can be used in a variety of applications. The device has a programmable slew rate which help ...
LMT90 - Texas Instruments
... Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design impleme ...
... Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design impleme ...
Solid State Relay 24-V AC Switch With Galvanic
... overload, compared with electromechanical contacts, and their higher "on" state resistance. Unlike an electromechanical relay, an SSR provides only limited switching arrangements (single-pole, single-throw switching). The control signal must be coupled to the controlled circuit in a way that provide ...
... overload, compared with electromechanical contacts, and their higher "on" state resistance. Unlike an electromechanical relay, an SSR provides only limited switching arrangements (single-pole, single-throw switching). The control signal must be coupled to the controlled circuit in a way that provide ...
Independent Living Aids ILA Item 756246 Digital Multimeter With
... We have taken every precaution in designing this meter to ensure that it is as safe as we can make it. But safe operation depends on you, the operator. We recommend that you follow these simple safety rules. Never apply voltages to the meter that exceed the limits given in the specifications. Neve ...
... We have taken every precaution in designing this meter to ensure that it is as safe as we can make it. But safe operation depends on you, the operator. We recommend that you follow these simple safety rules. Never apply voltages to the meter that exceed the limits given in the specifications. Neve ...
SN65LVELT23 数据资料 dataSheet 下载
... obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the speci ...
... obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the speci ...
ILT 160 DC Fundamentals - Northeast Alabama Community College
... Define terms associated with DC electricity. Explain the function of each atomic component structure. Explain the function of electrical charges. State whether a potential difference exists between two charges given their magnitude and polarity. A2.1.5 State the direction of electron movement betwee ...
... Define terms associated with DC electricity. Explain the function of each atomic component structure. Explain the function of electrical charges. State whether a potential difference exists between two charges given their magnitude and polarity. A2.1.5 State the direction of electron movement betwee ...
Clarification
... initial operational requirements of the unit and the ELISA system. Tenderers are required to supply such consumables separately (which can be of different brand) for this item and since these articles are not indicated as separate items, the “Technical Documents to be provided during the ...
... initial operational requirements of the unit and the ELISA system. Tenderers are required to supply such consumables separately (which can be of different brand) for this item and since these articles are not indicated as separate items, the “Technical Documents to be provided during the ...
Common Failure Mechanisms in Microelectronics
... exerted to design units that are inherently reliable. This concept is known as "Designing for Reliability", or DFR. This consists of following all known design rules for making a device reliable, not only electrically, but visually and mechanically as well. These design rules must be updated regular ...
... exerted to design units that are inherently reliable. This concept is known as "Designing for Reliability", or DFR. This consists of following all known design rules for making a device reliable, not only electrically, but visually and mechanically as well. These design rules must be updated regular ...
ESD Device testing: The test determines the result
... is considered. Figure 8 shows the schematic diagram often used to describe ESD guns in the IEC 61000-4-2 and ISO 10605 system level ESD standards. The two standards use different values for the C1 and R1 components. IEC 61000-4-2 uses a 330- resistor and a 150-pF capacitor. ISO 10605 uses a 2000- ...
... is considered. Figure 8 shows the schematic diagram often used to describe ESD guns in the IEC 61000-4-2 and ISO 10605 system level ESD standards. The two standards use different values for the C1 and R1 components. IEC 61000-4-2 uses a 330- resistor and a 150-pF capacitor. ISO 10605 uses a 2000- ...
Electrical Surge-Protection Devices for Industrial
... in a medium voltage transformer. All conditions described above can lead to a catastrophic thermal breakdown of an SPD, turning it into a potential hazard for personnel and equipment in close proximity of the device. Some examples of catastrophic SPD failures will be presented later in this paper. T ...
... in a medium voltage transformer. All conditions described above can lead to a catastrophic thermal breakdown of an SPD, turning it into a potential hazard for personnel and equipment in close proximity of the device. Some examples of catastrophic SPD failures will be presented later in this paper. T ...
Megatest 5000 V Megohmmeter Product Manual
... The instrument applies the requested voltage to the object being tested (material or equipment or installation), measures the circulating current and calculates the relevant insulation resistance. While measuring, the instrument simultaneously detects and displays the resistance, making it possible ...
... The instrument applies the requested voltage to the object being tested (material or equipment or installation), measures the circulating current and calculates the relevant insulation resistance. While measuring, the instrument simultaneously detects and displays the resistance, making it possible ...
Variable-Speed Single-Phase Full-Wave Fan
... When the rotor is locked by external means or load conditions, The Lock detection feature helps to protect the circuit by not allowing the current to rise beyond control. A hiccup mechanism is also provided. The Lock detection is enabled by a connection to the lock detection capacitor. The constant ...
... When the rotor is locked by external means or load conditions, The Lock detection feature helps to protect the circuit by not allowing the current to rise beyond control. A hiccup mechanism is also provided. The Lock detection is enabled by a connection to the lock detection capacitor. The constant ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.