NI PXIe-5171R Specifications
... configured using LabVIEW Instrument Design Libraries for Reconfigurable Oscilloscopes (instrument design libraries). ...
... configured using LabVIEW Instrument Design Libraries for Reconfigurable Oscilloscopes (instrument design libraries). ...
Test and Debug in Deep-Submicron Technologies
... was shown to be able to greatly reduce test data volume by sifting out the easily detectable faults [30]. Test application and test data compression techniques using embedded processors [15] or reusing on-chip processors [11] [31] [14] have been suggested. BIST techniques have gained acceptance for ...
... was shown to be able to greatly reduce test data volume by sifting out the easily detectable faults [30]. Test application and test data compression techniques using embedded processors [15] or reusing on-chip processors [11] [31] [14] have been suggested. BIST techniques have gained acceptance for ...
Page 1 (Notes: Default switch settings are shown in grey. See the
... device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. The user is cautioned that changes or modifications not expressly approved by Honeywell could void the user’s authority to operate this equ ...
... device may not cause harmful interference, and (2) this device must accept any interference received, including interference that may cause undesired operation. The user is cautioned that changes or modifications not expressly approved by Honeywell could void the user’s authority to operate this equ ...
ADD71 Manual
... Voltage Load Test .......................................................................... - 37 Resistance, what is it? .................................................................. - 38 Voltage Drop, What is it? .............................................................. - 38 Voltage Drop ...
... Voltage Load Test .......................................................................... - 37 Resistance, what is it? .................................................................. - 38 Voltage Drop, What is it? .............................................................. - 38 Voltage Drop ...
7850000D01 ITS Jobs 785
... visual indication system that monitors the weakest link in each mode and shows normal operation or failure status. Hardwired type units shall also include one and also provides one set of dry contacts to export transmit this status information to other monitoring systems. Ensure that these units hav ...
... visual indication system that monitors the weakest link in each mode and shows normal operation or failure status. Hardwired type units shall also include one and also provides one set of dry contacts to export transmit this status information to other monitoring systems. Ensure that these units hav ...
REACTIVITY OF NO-CLEAN FLUX RESIDUES IN
... soldering products providing excellent performance to endusers while leaving safe residues on the board. However, the increasing complexity of microelectronic components paired with the integration of new assembly processes sets challenging targets on the assembly products roadmap. Noclean pastes ne ...
... soldering products providing excellent performance to endusers while leaving safe residues on the board. However, the increasing complexity of microelectronic components paired with the integration of new assembly processes sets challenging targets on the assembly products roadmap. Noclean pastes ne ...
SN65HVD26x Turbo CAN Transceivers for CAN FD (Flexible Data
... This CAN transceiver meets the ISO1189-2 High Speed CAN (Controller Area Network) physical layer standard. It is designed for data rates in excess of 2 Mpbs (megabits per second) for CAN FD (CAN with flexible data rate), greater than 1 Mbps for CAN in short networks, and enhanced timing margin and h ...
... This CAN transceiver meets the ISO1189-2 High Speed CAN (Controller Area Network) physical layer standard. It is designed for data rates in excess of 2 Mpbs (megabits per second) for CAN FD (CAN with flexible data rate), greater than 1 Mbps for CAN in short networks, and enhanced timing margin and h ...
数字功率钳表使用说明书
... tester is comprised of three channels including voltage, current, and power as well as a micro single chip system, and it is equipped with a powerful software for measurement and data processing functions; it can measure, calculate, and display voltage, current, active power, power factor, apparent ...
... tester is comprised of three channels including voltage, current, and power as well as a micro single chip system, and it is equipped with a powerful software for measurement and data processing functions; it can measure, calculate, and display voltage, current, active power, power factor, apparent ...
MMBTH24 Datasheet
... coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purp ...
... coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purp ...
TL4242 数据资料 dataSheet 下载
... obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the speci ...
... obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the speci ...
fundamentals of esd
... flows as the charge moves along the conductive circuitry of the device and the typically very high voltage levels of the charge overheat the delicate traces of the integrated circuits, melting them or even vaporizing parts of them. When examined by microscope the damage caused by electro-static disc ...
... flows as the charge moves along the conductive circuitry of the device and the typically very high voltage levels of the charge overheat the delicate traces of the integrated circuits, melting them or even vaporizing parts of them. When examined by microscope the damage caused by electro-static disc ...
TLC555-Q1 Used as a Positive and Negative Charge Pump
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
... applications using TI components. To minimize the risks associated with Buyers’ products and applications, Buyers should provide adequate design and operating safeguards. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask ...
5 Timing parameters
... Table 5-1: Timing parameters............................................................................................... 16 Table 6-1: Control parameters and detailed application of categories................................... 20 Table B-1 : ESD classes........................................... ...
... Table 5-1: Timing parameters............................................................................................... 16 Table 6-1: Control parameters and detailed application of categories................................... 20 Table B-1 : ESD classes........................................... ...
TS3DV520E 5-Channel Differential 10:20 Multiplexer Switch (Rev. B)
... Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. ...
... Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI website at www.ti.com. ...
1 - Telecommunications Industry Association
... (10) Connect the EUT to the test circuit of Figure 9.16-2, and set the passband of the filter to measure broadband energy in the frequency range 270 kHz to 30 MHz (see comment 4 and 5). (11) Condition the EUT to the on-hook state. (12) Set the digital oscilloscope to provide: (a) ...
... (10) Connect the EUT to the test circuit of Figure 9.16-2, and set the passband of the filter to measure broadband energy in the frequency range 270 kHz to 30 MHz (see comment 4 and 5). (11) Condition the EUT to the on-hook state. (12) Set the digital oscilloscope to provide: (a) ...
PCM175x-Q1 24-Bit 192-kHz Sampling
... The PCM175x-Q1 family of devices is a CMOS, monolithic, integrated circuit, which includes stereo digital-to-analog converters and support circuitry in a small 16-lead SSOP package. The data converters use TI's enhanced multilevel delta-sigma architecture, which employs 4th-order noise shaping and 8 ...
... The PCM175x-Q1 family of devices is a CMOS, monolithic, integrated circuit, which includes stereo digital-to-analog converters and support circuitry in a small 16-lead SSOP package. The data converters use TI's enhanced multilevel delta-sigma architecture, which employs 4th-order noise shaping and 8 ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.