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ISO122 Precision Lowest Cost Isolation Amplifier (Rev. A)
ISO122 Precision Lowest Cost Isolation Amplifier (Rev. A)

... SBOS160A – NOVEMBER 1993 – REVISED JANUARY 2015 ...
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ISO122 - Texas Instruments

... SBOS160A – NOVEMBER 1993 – REVISED JANUARY 2015 ...
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INA12x-HT Precision, Low-Power Instrumentation Amplifiers (Rev. F)

LM150/LM350A/LM350 3-Amp Adjustable Regulators (Rev. B)
LM150/LM350A/LM350 3-Amp Adjustable Regulators (Rev. B)

... adjustment or output capacitors are used but the above values will eliminate the possibility of problems. The adjustment terminal can be bypassed to ground on the LM150 to improve ripple rejection. This bypass capacitor prevents ripple from being amplified as the output voltage is increased. With a ...
Testing stator cores of turbo generators using the ring flux method
Testing stator cores of turbo generators using the ring flux method

Checklist to EN 60204-1
Checklist to EN 60204-1

MAX4670 Integrated T1/E1/J1 Short-Haul and Long-Haul Protection Switch General Description
MAX4670 Integrated T1/E1/J1 Short-Haul and Long-Haul Protection Switch General Description

... the transformer, as represented in Figures 7–10. Table 2 lists the applicable surge protection setups for E1 interfaces. The MAX4670 surge test was performed per IEC 61000-4-5 Class 2 specifications and passed at ±1kV with only an in-line transformer and primary surge suppressor. The transformer was ...
AN-3005 Design Fundamentals for Phototransistor Circuits
AN-3005 Design Fundamentals for Phototransistor Circuits

... coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purp ...
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LM10010 VID Voltage Programmer for Point of

... Four pins are used to communicate with the LM10010. VIDC, VIDB, and VIDA are data lines, while VIDS is a latching strobe that programs in the LM10010 data. As shown in the Timing Diagram in Figure 2, the falling edge of VIDS latches in the data from VIDC, VIDB, and VIDA as the lower three LSB of the ...
LM137QML 3-Terminal Adjustable Negative
LM137QML 3-Terminal Adjustable Negative

... Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The en ...
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No Slide Title

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SN75LVCP412CD 数据资料 dataSheet 下载

AN97 - Accurate Measurement of LT5514 Third Order Intermodulation Products
AN97 - Accurate Measurement of LT5514 Third Order Intermodulation Products

... signal generator’s automatic level control (ALC) bandwidth, the signal generator will try to cancel the “interfering” signal by modulating the amplitude of the desired signal. This results in the signal generator no longer producing a single signal at the required frequency, but also producing side ...
I2C Bus Pullup Resistor Calculation
I2C Bus Pullup Resistor Calculation

... I2C communication standard is the mostly widely used inter-chip communication standard in today’s electronic systems. It is an open-drain/open-collector communication standard which implies integrated circuits (IC’s) with different voltage supply rails can be connected for communication. Pullup resi ...
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8-Ch Parallel 1-A High-Side Digital Output

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Service Manual TR 210 Huntron Tracker 071-0113-00 - To-Way

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TPS92691 Boost and Boost-to-Battery LED Driver Evaluation Board

... The TPS92691EVM-752 evaluation module (EVM) helps designers evaluate the operation and performance of the TPS92691-Q1 and TPS92691, a multi-topology controller designed for automotive lighting and general illumination applications. The TPS92691EVM-752 uses the TPS92691-Q1 (AEC Q100) IC; however, for ...
FMR19N60E - Fuji Electric America
FMR19N60E - Fuji Electric America

... products may become faulty. When using Fuji Electric semiconductor products in your equipment, you are requested to take adequate safety measures to prevent the equipment from causing a physical injury, fire, or other problem if any of the products become faulty. It is recommended to make your design ...
TBU-KE Series
TBU-KE Series

... operation at lower junction temperatures with a corresponding benefit of reliability. All pads should soldered to the PCB, including pads marked as NC or NU but no electrical connection should be made to these pads. For minimum parasitic capacitance, it is recommended that signal, ground or power si ...
A new method for measuring contact resistance
A new method for measuring contact resistance

STP 3 & 4 2.0  Design Certification ITAAC
STP 3 & 4 2.0 Design Certification ITAAC

... 7. Alarms and displays exist or can be retrieved in the main control room as defined in Section 2.7.5. ...
ANALYTICAL TEST STRUCTURE MODEL FOR DETERMINING
ANALYTICAL TEST STRUCTURE MODEL FOR DETERMINING

... Abstract. Contact test structures where there is more than one non-metal layer, are significantly more complex to analyse compared to when there is only one such layer like active silicon on an insulating substrate. Here, we use analytical models for complex test structures in a two contact test str ...
40 GHz ON-WAFER MEASUREMENTS WITH THE HP 8510
40 GHz ON-WAFER MEASUREMENTS WITH THE HP 8510

General Service Technician Program Task List
General Service Technician Program Task List

... updated in February 2009 by a committee of individuals representing the major automobile manufacturers, automobile repair shop owners and technicians, automobile instructors and trainers, and automobile equipment and parts suppliers. The General Service Technician Program task list is a subset of th ...
SERVICE MANUAL SD Series Scales
SERVICE MANUAL SD Series Scales

... values are within +2% of full capacity. Above 2%, the range is limited to full capacity by ...
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Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
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