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DCP01B Series - Texas Instruments
DCP01B Series - Texas Instruments

... The DCP01B series is a family of 1-W, isolated, unregulated DC/DC converter modules. Requiring a minimum of external components and including onchip device protection, the DCP01B series of devices provide extra features such as output disable and synchronization of switching frequencies. ...
S270-20-5 (Discontinued)
S270-20-5 (Discontinued)

... The sectionalizer is a self-contained, circuit-opening device used in conjunction with source-side protective devices, such as reclosers or reclosing circuit-breakers, to automatically isolate faulted sections of electrical distribution systems. The sectionalizer senses current flow above a preset l ...
Low-Voltage 4-Bit 1-of-2 FET Multiplexer
Low-Voltage 4-Bit 1-of-2 FET Multiplexer

EVSTF09-10-TF6-01
EVSTF09-10-TF6-01

... may be possible to the manufacturer himself but not to a Technical Service without risking damage to the test object or putting operator health and safety at risk, and may furthermore result in statuses non-representative for the actual vehicle operation. HEVs generally try to maintain their SOC aro ...
0.1Hz to 10Hz Noise Filter
0.1Hz to 10Hz Noise Filter

... The objective of this circuit is to amplify low frequency noise to a level that can be measured by a typical oscilloscope. This measurement is a common figure of merit given in amplifier data sheets. The standard bandwidth used in these measurements is 0.1Hz to 10Hz. Many precision amplifiers will h ...
Hickok 539C Calibration V4.1
Hickok 539C Calibration V4.1

DI-718BX Data Logger/Data Acquisition System Hardware Manual
DI-718BX Data Logger/Data Acquisition System Hardware Manual

... Events) that may be accessed using the Built-In Remote Control Jack (see "Built-In Remote Control Jack" on page 17). Remote Control configuration and setup is easily accessible in both WINDAQ Acquisition software and in the Dataq Instruments Hardware Manager (when configuring the instrument for Stan ...
Taser Model M26 Test Concepts
Taser Model M26 Test Concepts

... purpose of disrupting nerve impulses. These parameters would be relevant for a burn or heating situation, but not for the Taser. Nerve impulse disruption depends primarily on delivered current, not power or energy. Figure 12 and Figure 13 illustrate conceptual ways that these two parameters could be ...
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US Proposal for BMS Functionality

DI-718B Series DI-718Bx Series
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Accelerated Neutron SER Testing and Calculation of Terrestrial

... circuit described in this document. Any information provided in this document, including any sample design information or programming code, is provided only for reference purposes. It is the responsibility of the user of this document to properly design, program, and test the functionality and safet ...
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Low Offset and Drift, Low-Noise, Precision

... Figure 7. Common-Mode Rejection Ratio vs Temperature ...
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Quick Guide DS1000Z Series Digital Oscilloscope

... Rear Panel Overview .......................................................................... 9 Front Panel Function Overview .......................................................... 11 ...
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BAT54S Datasheet

... coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purp ...
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Reading and Understanding an ESD Protection

... obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the speci ...
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... This Technical Specification has been produced by the 3GPP. The contents of the present document are subject to continuing work within the TSG and may change following formal TSG approval. Should the TSG modify the contents of this TS, it will be re-released by the TSG with an identifying change of ...
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Voltage Protection For Two-, Three-, or Four-Cell Li
Voltage Protection For Two-, Three-, or Four-Cell Li

... For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environme ...
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... definition, extinguishers and their uses. Usage of Drawing different types of Fundamental and Precautions while working at - Fire extinguishers lines. derived units, system of height. units- FPS, CGS, MKS - Safety appliancesGas safety and SI. Unit of some personal protective important parameters – e ...
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ISO122 Precision Lowest Cost Isolation Amplifier (Rev. A)

... SBOS160A – NOVEMBER 1993 – REVISED JANUARY 2015 ...
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Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
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