Corrosion Resistance of Electric Wire Terminals Used in Harsh
... laden environments on off-shore oil rigs. Engineers designing industrial control equipment must apply sound judgment in material selection and clamp design along with rigorous test methods to ensure reliable long term performance under harsh field conditions. Industrial control equipment typically h ...
... laden environments on off-shore oil rigs. Engineers designing industrial control equipment must apply sound judgment in material selection and clamp design along with rigorous test methods to ensure reliable long term performance under harsh field conditions. Industrial control equipment typically h ...
TPS25925x, TPS25926x Simple 5-V/12-V
... only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values, except differential voltag ...
... only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. All voltage values, except differential voltag ...
Design Considerations for Avoiding Timing Errors during High
... Advantages of LVDS Over Single-Ended Standards The differential data transmission method used in LVDS is less susceptible to common-mode noise than single-ended schemes like CMOS. Differential transmission uses two wires with opposite current and voltage swings instead of the one wire used in CMOS t ...
... Advantages of LVDS Over Single-Ended Standards The differential data transmission method used in LVDS is less susceptible to common-mode noise than single-ended schemes like CMOS. Differential transmission uses two wires with opposite current and voltage swings instead of the one wire used in CMOS t ...
BDTIC
... determine the ESD robustness of a particular device. These models are used to qualify products and a number of standards exist to outline each testing method. HBM is the most widely accepted ESD test. With HBM testing the failure modes typically comprise junction damage, melting of metal layers and ...
... determine the ESD robustness of a particular device. These models are used to qualify products and a number of standards exist to outline each testing method. HBM is the most widely accepted ESD test. With HBM testing the failure modes typically comprise junction damage, melting of metal layers and ...
WAPI Porting Guide v1.0
... Simple Config Java Library for Android is named: simpleconfiglib.jar, it supplies developers with external APIs for Simple Config further development. Copy libsimpleconfiglib.so (and its parent folder) and simpleconfiglib.jar to the directory libs of your android project, then you can call the API d ...
... Simple Config Java Library for Android is named: simpleconfiglib.jar, it supplies developers with external APIs for Simple Config further development. Copy libsimpleconfiglib.so (and its parent folder) and simpleconfiglib.jar to the directory libs of your android project, then you can call the API d ...
Noise Measurement Post Amp
... TI Precision Designs are analog solutions created by TI’s analog experts. Reference Designs offer the theory, component selection, and simulation of useful circuits. Circuit modifications that help to meet alternate design goals are also discussed. ...
... TI Precision Designs are analog solutions created by TI’s analog experts. Reference Designs offer the theory, component selection, and simulation of useful circuits. Circuit modifications that help to meet alternate design goals are also discussed. ...
LMH664x Low Power, 130MHz, 75mA Rail-to
... Careful attention has been paid to ensure device stability under all operating voltages and modes. The result is a very well behaved frequency response characteristic (0.1dB gain flatness up the 12 MHz under 150 Ω load and AV = +2) with minimal peaking (typically 2dB maximum) for any gain setting an ...
... Careful attention has been paid to ensure device stability under all operating voltages and modes. The result is a very well behaved frequency response characteristic (0.1dB gain flatness up the 12 MHz under 150 Ω load and AV = +2) with minimal peaking (typically 2dB maximum) for any gain setting an ...
Odyssian Technology LLC
... Along with recalibrating the electronic system, the camera’s calibration was also tested. When looking at the thermal images, it clearly shows in the no fire tests that the glass substrate appears the hottest. Thermodynamic laws show that the thin film should be the hottest structure, so this sugges ...
... Along with recalibrating the electronic system, the camera’s calibration was also tested. When looking at the thermal images, it clearly shows in the no fire tests that the glass substrate appears the hottest. Thermodynamic laws show that the thin film should be the hottest structure, so this sugges ...
AN-2093 LMZ23610/8/6 and LMZ22010/8/6
... the 555 timer is disabled on both boards. With the clock disabled you can observe the parts performance when the devices are not synchronized, or you can supply an external clock through the SYNC post. J3 must be in place (555 disabled) on all boards to use an external clock on sync. The Sync pin of ...
... the 555 timer is disabled on both boards. With the clock disabled you can observe the parts performance when the devices are not synchronized, or you can supply an external clock through the SYNC post. J3 must be in place (555 disabled) on all boards to use an external clock on sync. The Sync pin of ...
The Pitfalls of Instrument Compatibility Mike Haney
... always be physical and behavioral differences in a modern replacement instrument and the obsolete instrument. Some of the differences will be obvious from a comparison of instrument specifications but other differences may not be ...
... always be physical and behavioral differences in a modern replacement instrument and the obsolete instrument. Some of the differences will be obvious from a comparison of instrument specifications but other differences may not be ...
ATL43x 2.5-V Low Iq Adjustable Precision
... stability over applicable automotive, commercial, and industrial temperature ranges. The output voltage can be set to any value between Vref (approximately 2.5 V) and 36 V, with two external resistors. These devices have a typical output impedance of 0.05 Ω. Active output circuitry provides a very s ...
... stability over applicable automotive, commercial, and industrial temperature ranges. The output voltage can be set to any value between Vref (approximately 2.5 V) and 36 V, with two external resistors. These devices have a typical output impedance of 0.05 Ω. Active output circuitry provides a very s ...
High PSRR, Low-Noise, 1-A Power Filter (Rev. B)
... Noise-reduction pin. When a capacitor is connected from this pin to GND, RMS noise can be reduced to very low levels. A capacitor greater than or equal to 10 nF must be tied from this pin to ground to assure stability. TI recommends connecting a 1-µF capacitor from NR to GND (as close to the device ...
... Noise-reduction pin. When a capacitor is connected from this pin to GND, RMS noise can be reduced to very low levels. A capacitor greater than or equal to 10 nF must be tied from this pin to ground to assure stability. TI recommends connecting a 1-µF capacitor from NR to GND (as close to the device ...
SN54ACT573, SN74ACT573 (Rev. D)
... Package thermal impedance, θJA (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70°C/W DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58°C/W N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69°C/W ...
... Package thermal impedance, θJA (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70°C/W DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58°C/W N package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69°C/W ...
3. Test Board
... 5. GabE Transceiver 1.0 ............................................................................................ 18 6. GabE Transceiver 2.0 ............................................................................................ 21 6.1. Design Changes ........................................ ...
... 5. GabE Transceiver 1.0 ............................................................................................ 18 6. GabE Transceiver 2.0 ............................................................................................ 21 6.1. Design Changes ........................................ ...
4 Requirements
... Table 5-1: Absorption at normal incidence............................................................................ 27 Table 5-2: Bandwidth and measurement time ...................................................................... 36 Table 5-3: Correspondence between test procedures and limits .. ...
... Table 5-1: Absorption at normal incidence............................................................................ 27 Table 5-2: Bandwidth and measurement time ...................................................................... 36 Table 5-3: Correspondence between test procedures and limits .. ...
S-series FOUNDATION Fieldbus I/O
... small form factor enclosure and installs on any I/O slot of the S-series horizontal carriers. The interface uses a separate terminal block to which the segment wires are connected. A single interface is used with the 1 wide terminal block in a simplex installation. Two H1 interfaces can be mounted i ...
... small form factor enclosure and installs on any I/O slot of the S-series horizontal carriers. The interface uses a separate terminal block to which the segment wires are connected. A single interface is used with the 1 wide terminal block in a simplex installation. Two H1 interfaces can be mounted i ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.