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User Manuals - Fieldpiece Instruments
User Manuals - Fieldpiece Instruments

LM98640QML Dual Channel, 14-Bit, 40 MSPS
LM98640QML Dual Channel, 14-Bit, 40 MSPS

... Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not ensure specific performance limits. For ensured specifications and test conditions, see the Electrical Characteristics. The ensur ...
SN74GTLPH16916 数据资料 dataSheet 下载
SN74GTLPH16916 数据资料 dataSheet 下载

MRFE6VP6300HR5 Datasheet
MRFE6VP6300HR5 Datasheet

... implementers to use Freescale Semiconductor products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits or integrated circuits based on the information in this document. Freescale Semiconductor reserves the right to make changes witho ...
Nanotechnology Measurement Handbook
Nanotechnology Measurement Handbook

LM2830 - Texas Instruments
LM2830 - Texas Instruments

... The LM2830 regulator is a monolithic, highfrequency, PWM step-down DC-DC converter in a 5pin SOT-23 and a 6-Pin WSON package. The device provides all the active functions to provide local DCDC conversion with fast transient response and accurate regulation in the smallest possible PCB area. With a m ...
Fundamentals of PolySwitch Overcurrent and
Fundamentals of PolySwitch Overcurrent and

SN65C3221, SN75C3221 (Rev. E)
SN65C3221, SN75C3221 (Rev. E)

... with ±15-kV ESD protection pin to pin (serial-port connection pins, including GND). These devices provide the electrical interface between an asynchronous communication controller and the serial-port connector. The charge pump and four small external capacitors allow operation from a single 3-V to 5 ...
Conductor Protection (Wire Cable Protection) 1
Conductor Protection (Wire Cable Protection) 1

... 2. Short-circuit current tests with full L-L voltage on one pole of a circuit to insure the overcurrent protective device can protect conductors for various types of grounding schemes. L-G faults are very prevalent fault conditions. And full L-L system voltage can be present for single or multiple L ...
DS2411 Silicon Serial Number with VCC Input
DS2411 Silicon Serial Number with VCC Input

... The DS2411 requires strict protocols to ensure data integrity. The protocol consists of four types of signaling on one line: Reset Sequence with Reset Pulse and Presence Pulse, Write 0, Write 1, and Read Data. Except for the presence pulse the bus master initiates all these signals. The DS2411 can c ...
SP3222
SP3222

IV. Measuring Return Ratio at the Terminals of a Dependent Source
IV. Measuring Return Ratio at the Terminals of a Dependent Source

... suppressing all the independent network's sources, assigning a fixed value to the dependent source, and calculating the signal that returns to its controlling terminals. This procedure is not suitable, though, for simulating electronic circuits, where there is no access to circuit's dependent source ...
diagnosis and testing - Ford
diagnosis and testing - Ford

A5303 - Allegro Microsystems
A5303 - Allegro Microsystems

... when an alarm is signaled from an interconnected unit, and any local-alarm condition causes this pin to be ignored as an input. An internal NMOS device acts as a charge dump to aid in applications involving a large (distributed) capacitance, and is activated at the end of a local or test alarm. This ...
An interface-end defines one side of the realized
An interface-end defines one side of the realized

... a. The specification for each interface-end on the component b. The specification for each connector c. The specifications for the being exchanged items across the interface d. The specification for the interface medium (optional) e. The constraints associated with the above including protocol const ...
EA-10/15 - GEOCITIES.ws
EA-10/15 - GEOCITIES.ws

... 5.1.2.1 Sequence of operations performed on the instrument. This sequence can include, for example: functional verification (self-test), self-calibration (e.g. zero settings or calibration with respect to internal standards or linearisation of the converters), initial calibration, adjustment, final ...
Fieldbus Device Couplers Simplify Upgrade at
Fieldbus Device Couplers Simplify Upgrade at

... must also ensure that control systems provide reliable operation and a low cost of ownership over the life of installed assets. Although fieldbus-based control systems have been proven to optimize process operations, instrumentation and control engineers need effective solutions protecting the field ...
Characterisation of Schottky Varactor Diodes for - An
Characterisation of Schottky Varactor Diodes for - An

... interconnects in the backplane card which causes the Bias Voltage (V) loss of the high frequency components of the digital Figure 1 The Schottky diode CV characteristics. bit stream. To overcome this problem a digital bit stream is The schematic diagram and circuit diagram of the demultiplexed in th ...
An interface-end defines one side of the realized
An interface-end defines one side of the realized

Small Conductor Protection
Small Conductor Protection

... conditions. For Class CC, J, or T fuses, the maximum shortcircuit current energy permitted by UL for the 30A or less ampere ratings is below the ICEA thermal energy damage criteria. In the testing, special fuse limiters that purposely exceed the short-circuit current I2t umbrella limits for the appl ...
Whitepaper Accelerated lifetime-test for metallized film capacitors
Whitepaper Accelerated lifetime-test for metallized film capacitors

... electronics. Film capacitors in such applications are expected to have a life cycle of up to 20 years or more, compared to approx. 5-7 years in consumer electronics. Furthermore, significantly higher component temperatures may occur depending on the installation location of the product. Owing to the ...
Standard-compliant switchgear and controlgear production
Standard-compliant switchgear and controlgear production

... Rittal. With its broad, modular range of products, Rittal – The System. covers virtually all plant categories, thereby offering a comprehensive approach to the construction of a switchgear and controlgear assembly and conformity with the new standard. Rittal products already come supplied with much ...
TBU-DT085-100-WH
TBU-DT085-100-WH

... operated, the TBU® device will limit the current to less than the Itrigger value within the tblock duration. If voltage above Vreset is continuously sustained, the TBU® device will subsequently reduce the current to a quiescent current level within a period of time that is dependent upon the applied ...
USB3290 Small Footprint Hi-Speed USB 2.0 Device PHY with UTMI
USB3290 Small Footprint Hi-Speed USB 2.0 Device PHY with UTMI

FT245BM Designers Guide
FT245BM Designers Guide

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Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
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