a 3 in Chip Scale Package ADG758/ADG759
... 5.5 V make the ADG758 and ADG759 ideal for battery-powered, portable instruments. All channels exhibit break-before-make switching action preventing momentary shorting when switching channels. These switches are designed on an enhanced submicron process that provides low power dissipation yet gives ...
... 5.5 V make the ADG758 and ADG759 ideal for battery-powered, portable instruments. All channels exhibit break-before-make switching action preventing momentary shorting when switching channels. These switches are designed on an enhanced submicron process that provides low power dissipation yet gives ...
TXS01022-Bit Bidirectional Voltage
... TXS0102 2-Bit Bidirectional Voltage-Level Translator for Open-Drain and Push-Pull Applications 1 Features ...
... TXS0102 2-Bit Bidirectional Voltage-Level Translator for Open-Drain and Push-Pull Applications 1 Features ...
ZPE 2542228 000 06 EN Page 1 of 36
... (e.g. a manual arranged dimming level will not be changed) • There is a 30s lock time for PIR actions to give the opportunity to leave the room after switching off the light without new triggering. • If movement is detected the PIR event is send every 10s. ...
... (e.g. a manual arranged dimming level will not be changed) • There is a 30s lock time for PIR actions to give the opportunity to leave the room after switching off the light without new triggering. • If movement is detected the PIR event is send every 10s. ...
A SIMPLE FAULT DIAGNOSIS METHOD ... OF ELECTRONIC EMBEDDED SYSTEMS Zbigniew Czaja
... functional testing of the whole system [1], the software testing [2,3] and testing of particular blocks of the system [4]. One of these blocks, often applied in the embedded systems, is an analog part which is used mostly to adjust input analog signals usually coming from sensors and passed on to an ...
... functional testing of the whole system [1], the software testing [2,3] and testing of particular blocks of the system [4]. One of these blocks, often applied in the embedded systems, is an analog part which is used mostly to adjust input analog signals usually coming from sensors and passed on to an ...
Investigation Of Factors Affecting The Sustainability Of Arcs
... 5kA and a clearing time of two seconds would need an arc rated PPE system rated greater than 16 cal/cm2 if using the IEEE 1584 equations. However, if the equipment were fed by an 112.5KVA transformer, no analysis would be required and the worker might not wear arc rated clothing. If workers use the ...
... 5kA and a clearing time of two seconds would need an arc rated PPE system rated greater than 16 cal/cm2 if using the IEEE 1584 equations. However, if the equipment were fed by an 112.5KVA transformer, no analysis would be required and the worker might not wear arc rated clothing. If workers use the ...
Drive Module Testing Method Comparison Riku Naukkarinen for Drive Service Workshop
... may even have hidden faults that have occurred during the repair process or have existed before. If the test reveals these faults, they can be repaired during the test, before possibly inoperable unit is shipped to a customer from DSW. Current testing method for drive modules is rather slow and it l ...
... may even have hidden faults that have occurred during the repair process or have existed before. If the test reveals these faults, they can be repaired during the test, before possibly inoperable unit is shipped to a customer from DSW. Current testing method for drive modules is rather slow and it l ...
8-BIT PARALLEL-OUT SERIAL SHIFT
... These 8-bit shift registers feature AND-gated serial inputs and an asynchronous clear (CLR) input. The gated serial (A and B) inputs permit complete control over incoming data; a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock (CLK ...
... These 8-bit shift registers feature AND-gated serial inputs and an asynchronous clear (CLR) input. The gated serial (A and B) inputs permit complete control over incoming data; a low at either input inhibits entry of the new data and resets the first flip-flop to the low level at the next clock (CLK ...
Nonincendive Electrical Equipment for Use in Class
... The ISA Standards and Practices Department is aware of the growing need for attention to the metric system of units in general, and the International System of Units (SI) in particular, in the preparation of instrumentation standards. The Department is further aware of the benefits to USA users of I ...
... The ISA Standards and Practices Department is aware of the growing need for attention to the metric system of units in general, and the International System of Units (SI) in particular, in the preparation of instrumentation standards. The Department is further aware of the benefits to USA users of I ...
DLP3010 (Rev. B) - Texas Instruments
... The following power supplies are all required to operate the DMD: VSS, VDD, VDDI, VOFFSET, VBIAS, and VRESET. Recommended Operating Conditions are applicable after the DMD is installed in the final product. The functional performance of the device specified in this data sheet is achieved when operat ...
... The following power supplies are all required to operate the DMD: VSS, VDD, VDDI, VOFFSET, VBIAS, and VRESET. Recommended Operating Conditions are applicable after the DMD is installed in the final product. The functional performance of the device specified in this data sheet is achieved when operat ...
Data Acquisition and Control
... external instruments to gather data and control external processes. These processes cover multiple industries and markets, including the fields of factory automation, semiconductors, optoelectonics, telecommunications, automotive, medical, computers, peripherals, aerospace, research, and education. ...
... external instruments to gather data and control external processes. These processes cover multiple industries and markets, including the fields of factory automation, semiconductors, optoelectonics, telecommunications, automotive, medical, computers, peripherals, aerospace, research, and education. ...
unit 1 PPT
... – After comparison and calibration, the National Standards Laboratory returns the secondary standards to particular industrial laboratory with a certification of measuring accuracy in terms of a primary standard. ...
... – After comparison and calibration, the National Standards Laboratory returns the secondary standards to particular industrial laboratory with a certification of measuring accuracy in terms of a primary standard. ...
SN74CBTLV3257-EP 数据资料 dataSheet 下载
... obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the speci ...
... obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI warrants performance of its hardware products to the speci ...
Non-isolated, Phase Dimmable, Buck PFC LED Driver with Digital
... The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-board thermal resistance is obtained by simulating in an environ ...
... The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-board thermal resistance is obtained by simulating in an environ ...
4-channel half-duplex m-lvds line transceivers
... Type-2 receiver for each of the channels. In addition, the driver rise and fall times are between 1 ns and 2 ns, complying with the M-LVDS standard to provide operation at 250 Mbps while also accommodating stubs on the bus. Receiver outputs are slew rate controlled to reduce EMI and crosstalk effect ...
... Type-2 receiver for each of the channels. In addition, the driver rise and fall times are between 1 ns and 2 ns, complying with the M-LVDS standard to provide operation at 250 Mbps while also accommodating stubs on the bus. Receiver outputs are slew rate controlled to reduce EMI and crosstalk effect ...
S270-20-2 (Discontinued)
... The sectionalizer is a self-contained, circuit-opening device used in conjunction with source-side protective devices, such as reclosers or reclosing circuit-breakers, to automatically isolate faulted sections of electrical distribution systems. The sectionalizer senses current flow above a preset l ...
... The sectionalizer is a self-contained, circuit-opening device used in conjunction with source-side protective devices, such as reclosers or reclosing circuit-breakers, to automatically isolate faulted sections of electrical distribution systems. The sectionalizer senses current flow above a preset l ...
Evaluates: MAX5432/MAX5433 MAX5432 Evaluation Kit General Description Features
... key to navigate through the GUI controls. The correct I 2 C write operation is generated to update the MAX5432 internal memory registers when any of these controls are executed. The software divides EV kit functions into logical blocks. The Interface group box indicates the EV kit’s Status, Device A ...
... key to navigate through the GUI controls. The correct I 2 C write operation is generated to update the MAX5432 internal memory registers when any of these controls are executed. The software divides EV kit functions into logical blocks. The Interface group box indicates the EV kit’s Status, Device A ...
proje_ana - barissanli.com
... Manufacturing process takes lots of time. When two kinds of chips are needed, manufacturing becomes twice as long. So, testing and modelling must be fast and cost effective. The fastest way to model a MOSFET transistor is through the data from the I-V and C-V plots. First of all I-V test is done and ...
... Manufacturing process takes lots of time. When two kinds of chips are needed, manufacturing becomes twice as long. So, testing and modelling must be fast and cost effective. The fastest way to model a MOSFET transistor is through the data from the I-V and C-V plots. First of all I-V test is done and ...
SN65HVD23x 3.3-V CAN Bus Transceivers
... High Speed CAN Physical Layer standard (transceiver). These devices are designed for data rates up to 1 megabit per second (Mbps), and include many protection features providing device and CAN network robustness. The SN65HVD23x transceivers are designed for use with the Texas Instruments 3.3 V µPs, ...
... High Speed CAN Physical Layer standard (transceiver). These devices are designed for data rates up to 1 megabit per second (Mbps), and include many protection features providing device and CAN network robustness. The SN65HVD23x transceivers are designed for use with the Texas Instruments 3.3 V µPs, ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.