Instrument Mechanic
... of CRO, functional block diagram of CRO, CRT power supply. Various types of probes. Applications of various types of CROs like dual beam CRO, Dual trace CRO, storage oscilloscope. Computer fundamentals: Introduction to Computer, Block diagram of PC, I/P and O/P and peripheral equipm ents, terminals, ...
... of CRO, functional block diagram of CRO, CRT power supply. Various types of probes. Applications of various types of CROs like dual beam CRO, Dual trace CRO, storage oscilloscope. Computer fundamentals: Introduction to Computer, Block diagram of PC, I/P and O/P and peripheral equipm ents, terminals, ...
introduction to esd
... laboratory you are supposed to use these kind straps which are available in the laboratory. You are not allowed to touch any electronic device (integrated circuits, Altera DE1 board etc.) without the strap. In each desk, there is one strap available. Therefore only one person in each group can touch ...
... laboratory you are supposed to use these kind straps which are available in the laboratory. You are not allowed to touch any electronic device (integrated circuits, Altera DE1 board etc.) without the strap. In each desk, there is one strap available. Therefore only one person in each group can touch ...
General Description Features Block Diagram Pin Assignment 831724
... PCIe Gen 3 Magnitude of Transfer Function For a more thorough overview of PCI Express jitter analysis methodology, please refer to IDT Application Note: PCI Express Reference Clock Requirements. ...
... PCIe Gen 3 Magnitude of Transfer Function For a more thorough overview of PCI Express jitter analysis methodology, please refer to IDT Application Note: PCI Express Reference Clock Requirements. ...
OPAx316 10-MHz, Low-Power, Low-Noise, RRIO, 1.8
... The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-board thermal resistance is obtained by simulating in an environ ...
... The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88. The junction-to-board thermal resistance is obtained by simulating in an environ ...
AM335x Sitara™ Processors Silicon Revisions
... In this case, there are two sources that need to be connected to the GPMC_WAIT0 terminal. The NAND READY or BUSY output must source the GPMC_WAIT0 terminal during NAND boot and the MII CRS or RMII CRS_DV output must source the GPMC_WAIT0 terminal when the application software is using port 2 of the ...
... In this case, there are two sources that need to be connected to the GPMC_WAIT0 terminal. The NAND READY or BUSY output must source the GPMC_WAIT0 terminal during NAND boot and the MII CRS or RMII CRS_DV output must source the GPMC_WAIT0 terminal when the application software is using port 2 of the ...
analog -digital multimeter user`s manual
... you have chosen a multimeter which provides you a very high degree of safety. The analog - digital Multimeters are manufactured and tested in compliance with the safety standaed IEC 61010-1:2001/ DIN EN 61010 - 1:2001. In case of incorrect use or careless handling, the safety of both user and multim ...
... you have chosen a multimeter which provides you a very high degree of safety. The analog - digital Multimeters are manufactured and tested in compliance with the safety standaed IEC 61010-1:2001/ DIN EN 61010 - 1:2001. In case of incorrect use or careless handling, the safety of both user and multim ...
MAX13342E/MAX13345E 3-Wire Interface Full-Speed USB Transceivers With/Without Internal Series Resistors General Description
... The MAX13342E/MAX13345E USB-compliant transceivers are designed to minimize the area and external components required to interface low-voltage ASICs to USB. The devices comply with USB 2.0 specification for full-speed-only (12Mbps) operation. The transceivers include an internal 3.3V regulator, an i ...
... The MAX13342E/MAX13345E USB-compliant transceivers are designed to minimize the area and external components required to interface low-voltage ASICs to USB. The devices comply with USB 2.0 specification for full-speed-only (12Mbps) operation. The transceivers include an internal 3.3V regulator, an i ...
Supplementary Protectors (UL1077 mini circuit breakers) 2
... protectors, according to their scope of evaluation, are not evaluated for performance to provide branch circuit protection. This consideration alters the content in the performance requirements and in general would allow for more flexibility in the requirements than what would be allowed for a devic ...
... protectors, according to their scope of evaluation, are not evaluated for performance to provide branch circuit protection. This consideration alters the content in the performance requirements and in general would allow for more flexibility in the requirements than what would be allowed for a devic ...
AN-037 ESD Handling Precautions
... diodes needs to be done using the actual PCB layout, board material, input signal sources, and components specified in the bill of materials to ensure that RF performance is not compromised. The addition of a few picofarads of capacitance or a few nanohenries of inductance can be significant at RF f ...
... diodes needs to be done using the actual PCB layout, board material, input signal sources, and components specified in the bill of materials to ensure that RF performance is not compromised. The addition of a few picofarads of capacitance or a few nanohenries of inductance can be significant at RF f ...
High-Speed EMC Optimized Can Transceiver
... If a high logic level is applied to the S pin of the SN65HVD1050, the device enters a listen-only silent mode during which the driver is switched off while the receiver remains fully functional. In silent mode, all bus activity is passed by the receiver output to the local protocol controller. When ...
... If a high logic level is applied to the S pin of the SN65HVD1050, the device enters a listen-only silent mode during which the driver is switched off while the receiver remains fully functional. In silent mode, all bus activity is passed by the receiver output to the local protocol controller. When ...
AN-037 ESD Handling Precautions
... diodes needs to be done using the actual PCB layout, board material, input signal sources, and components specified in the bill of materials to ensure that RF performance is not compromised. The addition of a few picofarads of capacitance or a few nanohenries of inductance can be significant at RF f ...
... diodes needs to be done using the actual PCB layout, board material, input signal sources, and components specified in the bill of materials to ensure that RF performance is not compromised. The addition of a few picofarads of capacitance or a few nanohenries of inductance can be significant at RF f ...
Lecture 5: Fault Modeling
... A multiple stuck-at fault means that any set of lines is stuck-at some combination of (0,1) values. The total number of single and multiple stuck-at faults in a circuit with k single fault sites is 3k-1. A single fault test can fail to detect the target fault if another fault is also present, howeve ...
... A multiple stuck-at fault means that any set of lines is stuck-at some combination of (0,1) values. The total number of single and multiple stuck-at faults in a circuit with k single fault sites is 3k-1. A single fault test can fail to detect the target fault if another fault is also present, howeve ...
4316C-part2
... NOTE 5: For example, a fail-safe temperature limiting device would indicate an out-of-control temperature if it were to fail. This might interrupt a process, but would be preferable to the device indicating that the temperature is within the control limits, regardless of the actual temperature, in c ...
... NOTE 5: For example, a fail-safe temperature limiting device would indicate an out-of-control temperature if it were to fail. This might interrupt a process, but would be preferable to the device indicating that the temperature is within the control limits, regardless of the actual temperature, in c ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.