Download No Slide Title

Survey
yes no Was this document useful for you?
   Thank you for your participation!

* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project

Document related concepts

Gamma spectroscopy wikipedia, lookup

Magnetic circular dichroism wikipedia, lookup

Laser beam profiler wikipedia, lookup

Chemical imaging wikipedia, lookup

Microscopy wikipedia, lookup

Harold Hopkins (physicist) wikipedia, lookup

Vibrational analysis with scanning probe microscopy wikipedia, lookup

Ultrafast laser spectroscopy wikipedia, lookup

Scanning tunneling spectroscopy wikipedia, lookup

Photomultiplier wikipedia, lookup

Phase-contrast X-ray imaging wikipedia, lookup

Photon scanning microscopy wikipedia, lookup

Auger electron spectroscopy wikipedia, lookup

Diffraction topography wikipedia, lookup

Ultraviolet–visible spectroscopy wikipedia, lookup

X-ray photoelectron spectroscopy wikipedia, lookup

Reflection high-energy electron diffraction wikipedia, lookup

Low-energy electron diffraction wikipedia, lookup

Transmission electron microscopy wikipedia, lookup

Rutherford backscattering spectrometry wikipedia, lookup

Gaseous detection device wikipedia, lookup

Scanning electron microscope wikipedia, lookup

X-ray fluorescence wikipedia, lookup

Transcript
1. Free electrons are created in the Electron
Gun by heating a tungsten filament (Cathode)
2. Electrons are accelerated down the electron
optical column by means of a high voltage
potential at the Anode
Energy Dispersive X-ray
Analyzer:
3. The electron flux is shaped into a beam
by the Condenser Lenses
x-rays resolved on the
basis of their energies
4. The beam current is controlled by the Beam
Regulation Aperture (and the condenser lenses)
5. The beam current is measured with, or permitted
down the column by removing, the Faraday Cup
6. Beam ellipticity is corrected by the Stigmator
7. The beam is scanned or fixed into a probe spot
by the Final Condensing (“objective”) Lens
diffraction
crystal
8. The beam impacts the sample, giving rise to various
signals including secondary electrons, backscattered
electrons, x-rays, and cathodoluminescent energy.
Current absorbed by the sample also can be imaged.
x-rays
sample
scintillation
counter
Wavelength Dispersive
Spectrometer
x-rays resolved by diffraction,
through a regular periodic
solid, to a gas-filled counter
Secondary Electron Detector:
detects low-energy electrons liberated from near the sample
surface, providing an image of sample topography
Backscattered Electron Detector
detects higher-energy electrons “bounced out” of the sample,
providing an image based on average atomic mass (related to
density); hence, the image is based on the compositions of
Absorbed Current:Meter
constituent components
images electrical conductivity
within the sample
Press “Back” to return to the web page