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Reliability
 KPOH = Power-On hours for
MTBF (thousand)
 Vmax = Max permitted gatedielectric voltage without
overshoot
 Vos = Maximum permitted
overshoot voltage when used
with a maximum dc level of Vh
< Vmax
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Reliability for NFET
 Temperature = 25ºC
 Switching Probability to Vh =
50%
 Tos = 50% of a switching cycle
 Device Length = 50nm
 Temperature = 75ºC
 Vmax
– Inversely proportional to KPOH
– Inversely proportional to log of Device
Size
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Bias Generator for PVT variation
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Layout
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Cell Array
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Cell Array
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