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Microscopy Scale Lenses and the Bending of Light • light is refracted (bent) when passing from one medium to another • refractive index – a measure of how greatly a substance slows the velocity of light • direction and magnitude of bending is determined by the refractive indexes of the two media forming the interface Lenses • focus light rays at a specific place called the focal point • distance between center of lens and focal point is the focal length • strength of lens related to focal length – short focal length more magnification The Light Microscope • Types – – – – Bright-field microscope Dark-field microscope Phase-contrast microscope Fluorescence microscopes • Modern – Compound microscopes – Image formed by action of 2 lenses Image Quality • Resolution – Ability of a lens to separate or distinguish small objects that are close together – Factors • Wavelength – shorter wavelength greater resolution (450-500nm) • Numerical aperture 0.61 λ n sinθ • Working distance – distance between the front surface of lens and surface of cover glass or specimen • Brightness - How light or dark is the image? • Focus - Is the image blurry or well-defined? • Resolution - How close can two points in the image be before they are no longer seen as two separate points? • Contrast - What is the difference in lighting between adjacent areas of the specimen? The Bright-Field Microscope • Dark image against a brighter background • Stained Specimen • Several objective lenses (3-5) – Parfocal microscopes • Total magnification – Product of the magnifications of the ocular lens and the objective lens – 45x (objectice) X 10x (eye piece)= 450x Figure 2.4 Phase Contrast Microscopy • In phase contrast a phase plate is placed in the light path. • In a phase-contrast microscope, the annular rings in the objective lens and the condenser separate the light. • Barely refracted light passes through the center of the plate and is not retarded. Phase Contrast Microscopy • Highly refracted light passes through the plate farther from center. • The interference produced by these two paths produces images in which the dense structures appear darker than the background. The Phase-Contrast Microscope Orlando Science Center Phase Contrast Microscopy The Differential Interference Contrast Microscope • creates image by detecting differences in refractive indices and thickness of different parts of specimen Differential Interference Contrast Microscopy Differential Interference Contrast Microscopy • DIC works by separating a polarised light source into two beams which take slightly different paths through the sample. • The beams interfere when they are recombined. Differential Interference Contrast Microscopy • This gives the appearance of a threedimensional physical relief corresponding to the variation of optical density of the sample, emphasizing lines and edges though not providing a topographically accurate image. The Fluorescence Microscope • exposes specimen to ultraviolet, violet, or blue light • specimens usually stained with fluorochromes • shows a bright image of the object resulting from the fluorescent light emitted by the specimen Dark Phase Microscopy Dark Phase Microscopy • Opaque disc is placed underneath the condenser lens • Only light that is scattered by objects on the slide can reach the eye. • Light is reflected by specimen on the slide. • Bright white against a dark background. • Pigmented objects-false colors Electron Microscopy • Use of electrons (short wavelength) • 100,000 time smaller wavelenght than light • 0.0037nm (light 400-700nm) • 1000 time better resolution • Magnetic field direct the path of electron • Increase in electron velocity • Decrease in wavelength • Resolution 0.1nm (100x more than light microscope) • denser regions in specimen, scatter more electrons and appear darker Types • Transmission electron microscope – internal structure – electrons pass through thin specimens (50-1000 nm). • scanning electron microscope – 3d structure – In scanning electron microscopy signals emitted from the surface of thick specimens. Transmission electron microscope Electron micrograph of a cell in a root tip Specimen preparation • Vaccum to prevent colliding of electron – dead specimen – insufficient electron density – electron dense salt (gold, uranium) • Embedded in a polymer for thin sections – microtome cut slices (micrometer thick) • Sprayed onto copper grid – viruses and macromolecules • Flash frozen (for cryo EM) • Artifact Specimen preparation