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Innovation in Optical Engineering
3D Optical Profilometry
Film Thickness Measurement
Mobile Spectral Imaging
OPTONIKS is an optical technology company in the field of optical
engineering and precision metrology. OPTONIKS’s technology is
protected by eight patents.
We are working with: Intel and National Science Foundation (NSF)
OPTONIKS has completed a 3D profilometry system prototype for Intel
metrology lab which is responsible for measurement requirements and
requests from other departments within Intel and also develops and
assesses new metrology systems at Intel. Optonik’s next step is to
launch development of more 3D precision optical metrology systems for
the lab. OPTONIKS expects for this product to be utilized in production
lines that require no contact, real time precision metrology
measurements.
Optoniks is also developing a system for a portable and real-time
thickness assessment of highly scattering layers with rough surface
conditions developed under highly competitive National Science
Foundation (NSF) grant. NSF is a United States government agency that
supports fundamental research primarily in the non-medical fields of
science and engineering, but also has interagency projects funding
medical technology and clinical efforts. The project under NSF grant is
seeking to support the quantitative and spatially detailed inspection of
layer applications to airplanes and automobiles; in addition to provide a
tool that will offer a mechanism to real-time measurement of the
polymer film thickness during the application process for consumer
devices (e.g. conformal coating).
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Innovation in Optical Engineering
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3D Optical Profilometry
Film Thickness Measurement
Mobile Spectral Imaging
The patented optical 3DPT of OPTONIKS offers 3D profiling of objects
in situations like dark environment, dark objects and shiny objects.
OPTONIKS has already developed a 3D profilometry system prototype
for Intel metrology labs.
As another application, the vision system, based on this technology,
captures the 3D structure of the object regardless of its heat
distribution and can identify objects and faces in dark environment.
This 3D night vision offers the ability to obtain detailed features of a
person under no light conditions.
3D profilometry has potential applications ranging from design
verification to vision under total darkness. Design verification is a
quality assurance must-have for every company in production.
What this Means
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Significant advance in automated quality control.
Major licensing opportunity.
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Innovation in Optical Engineering
•
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3D Optical Profilometry
Film Thickness Measurement
Mobile Spectral Imaging
Non-contact, real-time, and in-process measurement of film’s thickness has been a major
challenge for a broad range of industry for decades that is remained unresolved. In many
industries, despite the higher cost, the films are thickened to make sure that the films have
the required thickness, which other than cost may result in compromising the performance,
increasing the waste of materials and increasing environmental footprints.
OPTONIKS’ patented noise reduction technique enables a novel optical measurement system
to perform film thickness determination on layers that are constructed with scattering
material. Due to scattering nature of these films the current thickness measurement
techniques either fail to make reliable measurements or they are very expensive and slow
instruments. The developed system will be a nondestructive and non-contact measurement
system that precisely measures the thickness of different layers where other non-contact
techniques fail.
What this Means
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OPTONIKS’ thickness measurement system addresses a major pain and
bottleneck in semiconductor IC packaging.
The bottleneck is driven by demands generated by growing market of
cellphones, tablets and other mobile devices.
Clear Glass
Etched Glass
Polymer Coating
The etched glass is a layer
with rough surface and the
polymer coating is a layer with
scattering material and rough
surface. All three layer
thickness can be measured
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using patented technology.
Innovation in Optical Engineering
•
•
3D Optical Profilometry
Film Thickness Measurement
Mobile Spectral Imaging
The patented OPTONIKS’ SIT is a combined hardware-software technology
that computationally separates the wavelength content of the object/scene
into spectral sub-bands. The advantages of such spectral imaging system
over current systems includes:
 Minimum change to convert a conventional imaging system into a
spectral imaging system.
 Fast measurement; it captures the image instead of raster scan the
whole image point by point which is time.
 Improving the wavelength resolution of the system without losing the
spatial resolution of the images.
Applications in law enforcement (crime scene, home land security), in
medical (identifying cancer cells and concentration), semiconductor
industry (identification of microscopic defects), military (information
withheld)
We are developing a miniaturized
version to make available this
power to all.
What this Means
•
Cellphone-mount camera technology that reveals hidden details invisible to
the naked eye.
A crime scene and the
spectral image corresponding
to the bloodstain’s spectral
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signature
3D Optical Profilometry
Film Thickness Measurement
Mobile Spectral Imaging
Innovation in Optical Engineering
Revenue Projection
Technology
2017
2018
2019
Mobile Spectral
Imaging
$0M
$1M
$33M
Film Thickness
Measurement
$1M
$3M
$15M
3D Optical
Profilometry &
Others
$1M
$2M
$2M
Total
$2M
$6M
$50M
Optoniks has three
technologies with
customized computation
and data processing. The
combination of optical
technology and
integrated proprietary
computation and signal
processing makes all
technologies protected
from reverse engineering,
protecting the Optoniks
market.
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