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Diffraction Grating Handbook
Diffraction Grating Handbook

... composition of and processes in stars and planetary atmospheres, as well as offer clues to the large-scale motions of objects in the universe. In chemistry, toxicology and forensic science, grating-based instruments are used to determine the presence and concentration of chemical species in samples. ...
Thank you for attending CLEO/QELS. Look for your post
Thank you for attending CLEO/QELS. Look for your post

... Goethe-Univ., Germany, 2 Dept. of Terahertz Measurement and Systems, Fraunhofer Inst. for Physical Measurement Techniques IPM, Germany. We successfully realized electro-optical detection of nanosecond THz pulses based on a THz optical parametric oscillator. A maximum dynamic range of ~30 dB/sqrt(Hz) ...
Untitled
Untitled

My PhD - Photonics Research Group
My PhD - Photonics Research Group

Diffraction Grating Handbook
Diffraction Grating Handbook

... “No single tool has contributed more to the progress of modern physics than the diffraction grating …”1 Newport Corporation is proud to build upon the heritage of technical excellence that began when Bausch & Lomb produced its first high-quality master grating in the late 1940s. A high-fidelity repl ...
Nd:YAG Based Laser Sources for Targeting
Nd:YAG Based Laser Sources for Targeting

... A Q-switched diode-side-pumped Nd:YAG zig-zag geometry slab laser within a cross Porro prism resonator is investigated. This perturbation insensitive resonator design is used in laser systems operating over the full military environment of vibration and temperature. A number of aspects of the design ...
Optical Shop Testing
Optical Shop Testing

... merchantability or fitness for a particular purpose. No warranty may be created or extended by sales representatives or written sales materials. The advice and strategies contained herein may not be suitable for your situation. You should consult with a professional where appropriate. Neither the pu ...
Organic Broadband Terahertz Sources and Sensors
Organic Broadband Terahertz Sources and Sensors

... lasers providing shorter and shorter pulses (down to ∼12 fs, commercially available). The achievable bandwidth from most PDA-based THz systems is usually a few THz and is often attributed to the limit of the carrier lifetime of the photoconductor involved. In a few cases, however, ultrabroad bandwid ...
Frontiers in Optics 2010/Laser Science XXVI
Frontiers in Optics 2010/Laser Science XXVI

... The annual meeting serves as the venue for the Optical Society to announce its board election results. Donna T. Strickland of the University of Waterloo was elected as the 2011 vice president. Strickland will become president-elect the following year and serve as president of OSA in 2013. Naomi J. H ...
High Contrast Gratings for Integrated Optoelectronics
High Contrast Gratings for Integrated Optoelectronics

... energy harness, environmental sensing, biological and medical imaging, industry manufacture control etc. This revolutionary progress benefits from the advancement in light generation, manipulation, detection and its interaction with other systems. Device innovation is the key in this advancement. To ...
Fused Silica Transmission Gratings
Fused Silica Transmission Gratings

... could be rectangular, sinusoidal, trapezoidal or more complex, in each case being quantifiable by additional parameters that will not be described here. ...
generation and propagation of optical vortices
generation and propagation of optical vortices

... arbitrary distributions of optical vortex filaments for experimental exploration. Hydrodynamic analogies were used to develop an heuristic model which described the dependence of vortex motion on other vortices and the background beam, both qualitatively and quantitatively. We predicted that pair of ...
Waveguide lasers in ytterbium doped tantalum pentoxide for
Waveguide lasers in ytterbium doped tantalum pentoxide for

... ytterbium oxide was demonstrated with a laser cavity formed from a combination of high reflective mirrors with output couplers or reflections from the bare end-facets with Fresnel reflectivity of 12%. In a 5.4 µm wide waveguide, lasing was observed between 1015 nm and 1030 nm when endpumped with a 9 ...
CRANFIELD UNIVERSITY Edouard Berrocal MULTIPLE
CRANFIELD UNIVERSITY Edouard Berrocal MULTIPLE

... ability of the technique to simulate various detection conditions, to differentiate scattering orders and to generate real images of light intensity distributions with high spatial resolution is demonstrated. The model is used for the real case of planar Mie imaging through a typical hollow cone wat ...
Principles of Fiber Optic Communication
Principles of Fiber Optic Communication

... From the local area telephone exchange, at the receiving end, these signals travel via metallic wire pairs to the receiver telephone, where they are converted back into corresponding sound waves. Through such cabled wire-pair telecommunication systems, one can at most send 48 simultaneous telephone ...
OPTICAL ISOMERISM
OPTICAL ISOMERISM

... POLARIMETERS can be used to analyse the effect optical isomers have on plane polarised light: ...
Abstracts for OPTO 2014
Abstracts for OPTO 2014

... in each of the transmission orders can be found using a near-field to far-field transformation of the transmitted wave. We have used quartz as dielectric material due to its low loss in the ultraviolet region and the Sellmeier equation models its dispersive behavior. The material properties in the g ...
Investigating Naturally Occurring 3
Investigating Naturally Occurring 3

... suppression. In addition to this, theoretical modelling was performed on a variety of gyroid geometries. The gyroid photonic structure found in the wing scales of P. sesostris was determined to be highly optimised to reflect the largest range of frequencies possible from this geometry, also aiding i ...
OPTO - SPIE
OPTO - SPIE

... for improving the modulation characteristics [4-8]. This paper aims to theoretically investigate the impacts of carrier capture and relaxation rates on the intensity modulation (IM) response of injection-locked QD lasers. The model is based on a set of five rate equations: one for the ground state ( ...
STED Microscopy
STED Microscopy

Laser Sources for Confocal Microscopy
Laser Sources for Confocal Microscopy

... Compared to other sources emitting electro-magnetic radiation, such as hot filaments, arc lamps, and light-emitting diodes (LEDs), lasers have a number of unique properties, which make them an almost ideal light source for use in confocal microscopy. These properties are: ...
Introduction to DWDM Technology
Introduction to DWDM Technology

... traditional voice and leased line services to new applications, including data storage, distributed applications, and video. The long-haul, by contrast, is about big pipes. Another important way in which metropolitan networks today differ from trunk-oriented long haul networks is that they encompass ...
Laser Sources for Confocal Microscopy
Laser Sources for Confocal Microscopy

Preparation of highly visible-light active N
Preparation of highly visible-light active N

... equation. It is well known that particle sizes play a vital role in photocatalytic activity since smaller crystals offer greater surface area to volume ratios and thus induce better surface absorbability of hydroxyl/water, which in-turn acts as an active oxidizer in the photocatalytic reaction.14 It ...
Technical Guide
Technical Guide

... An integrating sphere combined with a photodetector of the appropriate spectral response can be used to directly measure the total geometric flux emanating from a light source or the flux density of an illuminated area. The geometric distribution of the light to be measured determines the appropriat ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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