Multiple wavelength diffractive imaging - X
... Fig. 4!c", showing excellent agreement with the image in Fig. 4!a". The MEM refinement produces a much smoother image but some of the detail in the sample is lost, indicating that the algorithm is probably underfitting the data due to an overestimate of the noise level. The faint crosslike structure ...
... Fig. 4!c", showing excellent agreement with the image in Fig. 4!a". The MEM refinement produces a much smoother image but some of the detail in the sample is lost, indicating that the algorithm is probably underfitting the data due to an overestimate of the noise level. The faint crosslike structure ...
Direct detection of acoustic waves by laser light diffraction and
... of this study is to establish the optical technique to measure the extremely long wavelength, which has not ever been treated. In the present study, the Fraunhofer diffraction method, which was developed as a new means to detect the electromagnetic radiation scattered within the penetrating laser be ...
... of this study is to establish the optical technique to measure the extremely long wavelength, which has not ever been treated. In the present study, the Fraunhofer diffraction method, which was developed as a new means to detect the electromagnetic radiation scattered within the penetrating laser be ...
3D differential interference contrast microscopy using synthetic
... Differential interference contrast microscopy techniques visualize a specimen of weak contrast by converting the field gradient of a light into intensity variation. It has served as a label-free tool to image biological specimens.1,2 However, the intensity in the DIC image is determined by the coupl ...
... Differential interference contrast microscopy techniques visualize a specimen of weak contrast by converting the field gradient of a light into intensity variation. It has served as a label-free tool to image biological specimens.1,2 However, the intensity in the DIC image is determined by the coupl ...
Wollaston and Nomarski Prisms
... Birefringent Wollaston and/or Nomarski prisms are inserted in the optical pathway with their shear axis oriented at a 45-degree angle (northwest to southeast) to the polarizer and analyzer. The prisms are composed of two precisely ground and polished wedge-shaped slabs produced from high-grade optic ...
... Birefringent Wollaston and/or Nomarski prisms are inserted in the optical pathway with their shear axis oriented at a 45-degree angle (northwest to southeast) to the polarizer and analyzer. The prisms are composed of two precisely ground and polished wedge-shaped slabs produced from high-grade optic ...
Module Descriptor - What is FlexiLearn?
... This module covers the fundamentals of optic al design and image formation. The course will provide graduate students using optical systems with an in-depth knowledge of optical design. In particular, the course focuses on: Basic Concepts of Geometrical Optics Basic concepts of image formation ...
... This module covers the fundamentals of optic al design and image formation. The course will provide graduate students using optical systems with an in-depth knowledge of optical design. In particular, the course focuses on: Basic Concepts of Geometrical Optics Basic concepts of image formation ...
Problem Set 1 (due 2/21/06)
... 2. How do you collect a fluorescence emission spectrum? A fluorescence excitation spectrum? An absorption spectrum? Which two most closely resemble each other? A fluorescence emission spectrum is collected by illuminating the sample with a single wavelength and collecting a scan of the intensities o ...
... 2. How do you collect a fluorescence emission spectrum? A fluorescence excitation spectrum? An absorption spectrum? Which two most closely resemble each other? A fluorescence emission spectrum is collected by illuminating the sample with a single wavelength and collecting a scan of the intensities o ...
Ref_Note_final092911
... An additional characteristic of X-PEEM is the high surface sensitivity that is inherent with the detection of secondary electrons. In most materials, the low kinetic energy of the secondaries (typically <10 eV) limits the electron escape depth to 2 – 5 nm. This can be an advantage in some cases, how ...
... An additional characteristic of X-PEEM is the high surface sensitivity that is inherent with the detection of secondary electrons. In most materials, the low kinetic energy of the secondaries (typically <10 eV) limits the electron escape depth to 2 – 5 nm. This can be an advantage in some cases, how ...
