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Jamie Ball, Retrieving the complex refractive index of volcanic ash
Jamie Ball, Retrieving the complex refractive index of volcanic ash

... could be seen entering the fragment, demonstrating that the ash had a higher refractive index than the liquid at this wavelength. cover slip. The slide was then placed on the microscope stage and illuminated from below by white light produced by a halogen lamp. One of the above listed filters was pu ...
Rayleigh scattering by gas molecules: why is the sky blue?
Rayleigh scattering by gas molecules: why is the sky blue?

... The molecule is therefore an oscillating charge dipole and, if it is spherically symmetric, we expect the amplitude of oscillation of the electrons to be independent of the direction of the incoming electric field. According to electromagnetic theory, the oscillating dipole must itself radiate light ...
PDF
PDF

... relative change in surface reflectivity (DR/R) caused by a change in temperature (DT), as described by the relationship DR/R ¼ jDT. The TR coefficient, j, is typically very small (105–103 K1), therefore a “four-bucket” lock-in technique is used to improve sensitivity.16,17 Since the spatial resol ...
Aalborg Universitet Slow-plasmon resonant-nanostrip antennas
Aalborg Universitet Slow-plasmon resonant-nanostrip antennas

... and gap SPPs,13,14 no estimate of the phase exists for the reflection of slow SPPs at thin metal film terminations. In this work, the latter phase shift is determined, albeit indirectly, from scattering spectra calculated for gold nanostrips. The calculations are validated by showing excellent agree ...
(full text)
(full text)

... nearly perfect absorptance in NbN thin films of the appropriate thickness illuminated at the angle of total internal reflection (TIR) by s-polarized light [5]. As the NbN nanowire arrays are similar to wire-grid polarizers, to analyze their polarization-dependent absorptance, rigorous coupled-wave a ...
Experimental investigation of the propagation properties of bloch
Experimental investigation of the propagation properties of bloch

... direction as shown in Fig. 1(a). Since a BSW is an evanescent mode, the near-field (NF) can be collected by a scanning near field optical microscopy (SNOM) with a subwavelength aperture probe (in collection mode) appended to a single mode fiber. The sample illumination system is placed in the object ...
Fiber Optic Communications
Fiber Optic Communications

All-dielectric subwavelength metasurface focusing lens
All-dielectric subwavelength metasurface focusing lens

... manufactured with relaxed tolerance, compared to precision diffractive structures. The objective was to create a sub-wavelength, fine-patterned meta-surface as a phase mask with a smooth radial dependence of phase increment on transmission, avoiding 2π phase steps. Quasi-parabolic radial gradients o ...
Student Study Guide
Student Study Guide

... Light is a result of excited atoms giving off energy. Atoms are the building blocks of matter and consist of a positively charged nucleus of protons and neutrons orbited by a cloud of negatively charged electrons. Heat, light, and electricity are among the things that can excite atoms. Once excited, ...
Holography - Princeton University
Holography - Princeton University

... Recall that in the derivation above we ignored the contribution of |ψ0 |2 in comparison with |ψ1 |2 ; that is, we assumed that the reference beam was more intense than the object beam. However, the derivation did not tell us how much more intense the reference beam should be. It has been found empir ...
Paper Title
Paper Title

... governing formulas are nearly the same. Namely, in the former case the optical path varies due to change of distance, and in the latter – due to change of wavelength. The resonance effects take place when λ ~ Λ where Λ is the corrugated surface structure (or refractive index variation) period. In th ...
Laser Cutting
Laser Cutting

... First a rotating drum made from an appropriate material, usually selenium or an organic photoconductor, is given a negative charge. A negative charge is created when an atom has more electrons that protons. This is achieved by removing energy from the atom and allowing an extra electron to fall into ...
OFC2016-TTD-v3 - School of Electrical Engineering and
OFC2016-TTD-v3 - School of Electrical Engineering and

... multiplexer (WDM) and sent to a Mach-Zehnder modulator (MZM), where a microwave signal, generated by an electrical arbitrary waveform generator (AWG) to be radiated to free space, is modulated on the four wavelengths. The optical signals at different wavelengths at the output of the MZM is then laun ...
Downloaded
Downloaded

... of cylindrical prism in the experiment. Comparison with dispersion curves calculated for uncoupled TPP and SPP shows clear repulsion of hybrid state components in the crossing point of reflectivity dips. Fig. 3(a) shows Rðk; hÞ measured for the TE polarized light when SPP propagation is forbidden an ...
2. Measurement of refractive index of liquids using fiber optic
2. Measurement of refractive index of liquids using fiber optic

... displacement sensor. The sensor consists of two multimode step index fibers and a mirror. The output light intensity from the receiving fiber is measured as a function of displacement of the fiber with respect to mirror in various solvents. The study shows that the light peak intensity position depe ...
A nanometer notch filter with high rejection and throughput
A nanometer notch filter with high rejection and throughput

... f/50X 1 cm. Dielectric filters are available with - lo6 attenuation but with bandwidths of 2 10 nm, too broad in the context of forward scattering. Absorption filters of the same material as the lasing medium can offer considerably less than lo-nm bandwidth;lY2in the caseof ruby, the presence of two ...
Polarization-controlled contrasted images using dye
Polarization-controlled contrasted images using dye

... obtained for a binary phase object. The object was a square with a 0.5π rad phase change with respect to the surrounding area phase. In order to ensure optimal contrast, the fill factor i.e. the object area divided by the total illuminated area was 0.1 [5]. The filter phase distribution was obtained ...
Four Aces of Refractive Surgery: Aberrations
Four Aces of Refractive Surgery: Aberrations

Measurement of high order Kerr refractive index of major air
Measurement of high order Kerr refractive index of major air

... To validate the coefficients of Table 1, the simulation of the overall signal has been successfully compared to a set of data recorded in 1 bar of air. Our values are consistent with the ones measured by Nibbering et al. [2] for N2 , but differ for O2 and Ar. However, they are limited to a narrower ...
Fields and Waves I Lecture - Rensselaer Polytechnic Institute
Fields and Waves I Lecture - Rensselaer Polytechnic Institute

Photonics Workshop Program and Worksheets
Photonics Workshop Program and Worksheets

... it helps you see first-hand how light is reflected down the optical waveguide. Also keep in mind that when we measure or view any energy source such as light, voltage or electrical current, we must ‘tap’ a small amount of that energy. Therefore, there is no such thing as a loss-less energy measureme ...
Sample questions on optical fibre section of course
Sample questions on optical fibre section of course

... Discuss in detail the advantages / disadvantages of the three main types of fibre connection, fusion splice, mechanical splice and connectorisation. ...
Optical Properties of Aluminum Oxide
Optical Properties of Aluminum Oxide

... The energy dispersion was 0.1 eV, which corresponded to 100 eV width of the spectrum. For each measurement, two spectra (for 10 s each) were acquired, one covering the energy range −10 to 90 eV and the other 40 to 140 eV. Each spectrum was corrected for dark current and readout pattern (measured und ...
Optical Properties of Aluminum Oxide
Optical Properties of Aluminum Oxide

... The energy dispersion was 0.1 eV, which corresponded to 100 eV width of the spectrum. For each measurement, two spectra (for 10 s each) were acquired, one covering the energy range −10 to 90 eV and the other 40 to 140 eV. Each spectrum was corrected for dark current and readout pattern (measured und ...
Orbital angular momentum of light
Orbital angular momentum of light

... Gaussian beam, two Laguerre-Gaussian beams of higher order with opposite phases. This is a direct consequence of the conservation of angular momentum. Since a Gaussian beam has ` = 0, two LaguerreGaussian beams must be created with opposite `. These two beams travel at an angle with respect to the o ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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