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Diode Laser Characteristics
Diode Laser Characteristics

... net gain function which is periodic in frequency, as shown in Figure 5 (see Yariv 1991 or Möller 1988 for a discussion of optical cavities). The period is called the “free spectral range”, and is given by ∆ν F SR = c/2Ln, where c is the speed of light, n is the index of refraction (n ≈ 3.6 in the s ...
Governing the speed of light and its application to the
Governing the speed of light and its application to the

Practical realization of massively parallel
Practical realization of massively parallel

... in which every 共spatial兲 optical channel usually requires its own individual hardware. Therefore optical channels can be packed more densely in freespace systems. A planar-integrated imaging system that produces 2500 one-to-one interconnects on an area of 6.25 mm2 共Ref. 21兲 may serve as an example. ...
The Fundamentals of Infrared Spectroscopy
The Fundamentals of Infrared Spectroscopy

... Io = Intensity of incident radiation from the infrared source at that frequency I = Intensity of transmitted radiation that reaches the detector at that frequency An infrared spectrum is often viewed in absorbance, with the peaks pointing up from the baseline instead of downward. The relationship be ...
Planar Integrated Optical Waveguide Spectroscopy
Planar Integrated Optical Waveguide Spectroscopy

... A three-phase (media) planar waveguide is composed of the cladding material, the waveguiding layer, and the substrate material, with respective RIs n c , n wg , and n s , in which n wg > n s , n c . The thickness of the waveguiding layer is twg; the cladding and substrate are usually assumed to be i ...
Optical tweezers computational toolbox
Optical tweezers computational toolbox

... optical trapping and micromanipulation, since we are typically interested in the optical force and torque as a function of position within the trap, even if we are merely trying to find the equilibrium position and orientation within the trap. Thus, calculations must be performed for varying inciden ...
optical properties of skin, subcutaneous, and muscle tissues
optical properties of skin, subcutaneous, and muscle tissues

... single-scattering phase function for thin samples, or the e®ective light penetration depth for slabs. The parameters measured are the collimated light transmission Tc and the angular dependence of the scattered light intensity, IðÞ (W=cm 2 sr) for thin samples or the °uence rate distribution inside ...
Effective refractive index for determining ray propagation in an
Effective refractive index for determining ray propagation in an

... The ray-tracing technique can be employed to simulate the scattering of light by a dielectric particle whose characteristic dimension is much larger than the incident wavelength. When a scattering particle is absorptive, a localized electromagnetic wave refracted into the scatterer is inhomogeneous, ...
Summary of the Invention. The aim of scanning jet
Summary of the Invention. The aim of scanning jet

... quantum size electronic devises with extreme achievable operating parameters. Take into account that developing of lithographic technology with resolution less than 7.25 nm has no physical sense, since in work [3] was shown that in order to obtain low voltage (0.2-0.3 V) single-electron transistors ...
High-efficiency light coupling in a submicrometric
High-efficiency light coupling in a submicrometric

... beam-waist values. Results are plotted in Fig. 5. The difference between the power measured off resonance and at resonance corresponds to the injected light power. Once it is normalized to the incident power, it gives the coupling efficiency. The experimental values ␩exp are compared with the theore ...
physical optics - Sakshi Education
physical optics - Sakshi Education

... sources where as in Fresnel’s biprism two virtual images of same original source are used as two coherent sources. 31. In Lloyd’s one original source and its image are used as coherent sources. Interference of light : 32. When two light waves of nearly same amplitude, same frequency and traveling in ...
Light Microscopy [10 credits]
Light Microscopy [10 credits]

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Total Internal Reflection Spectroscopy for Studying Soft Matter
Total Internal Reflection Spectroscopy for Studying Soft Matter

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Nanosecond laser-induced breakdown in pure and - AS
Nanosecond laser-induced breakdown in pure and - AS

... amplifiers. We used a pulsed, single longitudinal mode, TEM00 laser at 1.064 µm, with 7.5-nsec pulse duration, focused to a 7.45-µm-radius spot inside a fused silica window, to measure the single shot optical breakdown threshold irradiances of 4.7E11 and 6.4E11 W/cm2 respectively for pure fused sili ...
Aalborg Universitet Transfer function and near-field detection of evanescent waves
Aalborg Universitet Transfer function and near-field detection of evanescent waves

... from below. For an incoming plane wave with a specific value of k储 ⫽ |k储|, we determined the amount of power coupled to the fundamental fiber mode. Varying the value of k储, we obtained the (spatial-) frequency-dependent transmission, which is again related to the squared magnitudes of the ACF compon ...
Physical and Optical Properties of Mn(II) doped P2O5-ZnO
Physical and Optical Properties of Mn(II) doped P2O5-ZnO

... preceding structural changes that are due to formation or modification process in glass network. Density of the glasses has decreased considerably with the MnO content. Structural compactness, modification of geometrical configuration of glassy network, and changes in coordination of glass forming i ...
Correction of sampling errors due to laser tuning
Correction of sampling errors due to laser tuning

... and group velocity dispersion [10, 11, 12], grating characterization [13, 14, 15], birefringence and polarization mode dispersion [16, 17, 18], and distributed temperature and strain sensing [19, 20, 21, 22, 23]. In some cases a single SWI system performs several such measurements simultaneously [24 ...
A new approach to sum frequency generation of single
A new approach to sum frequency generation of single

... Many applications within biophotonics and spectroscopy rely on visible laser sources with the possibility of selecting the desired wavelength. Such lasers can be challenging to develop with the exact requirements for the applications. Diode lasers in the visible spectral region are available in the ...
CfE Advanced Higher Physics – Unit 2 – Waves
CfE Advanced Higher Physics – Unit 2 – Waves

... Travelling waves can pass through each other without being altered. If two stones are dropped in a calm pool, two sets of circular waves are produced. These waves pass through each other. However at any point at a particular time, the disturbance at that point is the algebraic sum of the individual ...
EL26960968
EL26960968

A new integrated optical angular velocity sensor
A new integrated optical angular velocity sensor

... the range 1-200 °/s has been achieved with a theoretical angle random walk of 0.1 °/√h. The study of the cavity element for a resonant micro optic gyroscope has been proposed in [5]. The resonator consists of a circular waveguide fabricated by ion-beam deposition, designed to get a finesse equal to ...
Imaging of single-chromophore molecules in aqueous
Imaging of single-chromophore molecules in aqueous

... the readout of a 40 × 40 pixel CCD region. They measured 2-dimensional diffusion coefficients that were roughly 2 orders of magnitude smaller than that of a small single-chromophore molecule in bulk solution. Dickson, et al., used prism-coupled TIR to image single Nile red molecules in poly(acrylami ...
CHAPTER 10
CHAPTER 10

... From Eqs.(10.23) and (10.24) we can get, R T 1 ...
Image reconstruction in diffuse optical tomography based on
Image reconstruction in diffuse optical tomography based on

... optical parameters within the medium being imaged. The most commonly applied model for the estimation of NIR light propagation in tissue is achieved through the Diffusion Approximation (DA) to the Radiative Transport Equation (RTE) through its robustness in implementation and computational speed and ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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