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Nondegenerate optical Kerr effect in semiconductors
Nondegenerate optical Kerr effect in semiconductors

... as the weak probe ( tp ::::: 58 ps ). Using this arrangment, we measure n 2 (2w; w) and {3(2w; w). At these wavelengths, the choice of the above materials is appropriate for examining the various dispersion regimes of n2 as predicted by the theory. An important parameter in the experiment is the sum ...
High refractive index Fresnel lens on a fiber fabricated by
High refractive index Fresnel lens on a fiber fabricated by

... increase by a factor of three (from Δn=0.12 to Δn=0.36). This leads to better light control in general, in particular in a tighter focal spot, which is advantageous for many applications. For example, in the case of optical trapping, a tighter focal spot allows trapping of smaller nanoparticles and ...
IOSR Journal of Humanities and Social Science (JHSS)
IOSR Journal of Humanities and Social Science (JHSS)

Broad Band Two-Dimensional Manipulation of Surface Plasmons
Broad Band Two-Dimensional Manipulation of Surface Plasmons

Second harmonic generation via total internal reflection quasi
Second harmonic generation via total internal reflection quasi

... reflection angle. We followed this launching approach instead of the side evanescent wave coupling in order to focus this initial work on the operational principle rather than on technical issues such as the design of side coupling sections. At this reflection angle, we avoid open-loop trajectories ...
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PDF

... orientation, which then promotes formation of self-assembled linear structures directed along the beam scanning direction. These structures are then shaped into desired patterns via continuous steering of the laser beam with intensity above a certain threshold value (Fig. 1a– c), as described in det ...
5. Optical fiber
5. Optical fiber

... spot is formed on the screen. 5. Measure the distance between the output end of the optical fiber and the screen. Let this be “L”. 6. Also measure the diameter of the circular spot formed on the screen. Use the “Reference spot size indicator” printed on the back side of the graph paper to know the e ...
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... which is important in many applications. only in restricted bands of wavelength, coThe tendency for different frequencies of inciding with the photonic band gaps. This light to travel at different speeds is a crucial feature limits the range of potential applifactor in the design of telecommunicatio ...
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... Such solutions to the Fresnel Maxwell theory, subject to a gauge constraint, were published first in 1979. After patents were secured, the full theory of singular solutions to Maxwell’s equations without gauge constraints was released for publication in Physical Review in 1991. R. M. Kiehn, G. P. Ki ...
Direct Imaging of Transient Interference in a Optical Microscopy
Direct Imaging of Transient Interference in a Optical Microscopy

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Imaging scanning tunneling microscope

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Soft-x-ray interferometer for single-shot laser linewidth measurements
Soft-x-ray interferometer for single-shot laser linewidth measurements

... visibility of the fringes.13 If several laser lines are emitting, their effect will be evident as modulations in the delay dependence of the visibility. All the spectral information is obtained in a single shot of the laser. The calibration of the path difference Dz of the system is given by Dz ­ 2x ...
IOSR Journal of Electrical and Electronics Engineering (IOSR-JEEE)
IOSR Journal of Electrical and Electronics Engineering (IOSR-JEEE)

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Imaging and Non-imaging System Modeling in ASAP

... expressed as resolution (modulation transfer function (MTF) and image size (magnification)). But if we dig more deeply into the origin and meaning of these requirements, we see that we can relate them to fundamental radiometric and photometric properties. Radiometry literally means the measurement a ...
Two-color cross-correlation in small-angle static light
Two-color cross-correlation in small-angle static light

... fluctuations and shows high contrast intensity space variations, as vividly evidenced by the presence of speckles in the scattered pattern @1,2#. At a fixed point, the time correlation function of the intensity scattered by a sample is simply related to the dynamic properties of the scatterers. This ...
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12. CONFOCAL MICROSCOPY • Confocal microscopy can render

...  However, even with an instrument that is capable in principle of producing high resolution images, the amount of information in the final image depends also on how different the various regions of instrument appear, i.e. on contrast. ...
Device for projecting and viewing stereoscopic pictures
Device for projecting and viewing stereoscopic pictures

... the backward rays, but also of the lateral sess the disadvantage that they have a right rays which are usually lost. In this manner and a wrong side, one of theends having about twice as many rays are utilized and to be placed before the eyes: if the other end the intensity obtained on the project-i ...
A new approach for retrieving the UV–vis optical properties of
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... coupler allows two or more optical signals to be combined into one signal. The coupler can also be used to split the signals apart again. The fused coupler is the most common of the fibre couplers and the principle behind the fused couplers is that when two or more fibre cores are brought to within ...
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... Then, we discuss the issue on focus recovery. There exist some problems in optical image processing like aberrations of camera, structure of zoom lens, blurring model and geometric optics and so on. Later, we will make a introduction to Fourier Optics and optics analyzed by the linear canonical tran ...
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Construction Of Multiple-beam Optical Traps

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1 L4: Interference L4 INTERFERENCE Objectives Aims When you

... The key to understanding interference is the principle of superposition which says simply that the combined effect of several waves at any place at a particular instant of time is given by the sum (vector sum if the wave property is a vector) of the wave property for the individual waves. The contri ...
Effect of pores on transmission properties of transparent ceramics
Effect of pores on transmission properties of transparent ceramics

... can be hardly eliminated even the pore size is very small. It has been shown that ceramics are opaque when the porosity is more than 1% [12-13]. Thus, scattering by residual pores is considered as the main cause of preventing the transparency of ceramics. The pores are nanosized in the nano-ceramics ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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