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a PDF of the paper on this project published in the OCEANS 2005
a PDF of the paper on this project published in the OCEANS 2005

... micro-organisms, which would rapidly move out of the focal that are perpendicular to optical axis of the illuminating beam, plane of conventional, 2D imaging techniques. Digital but are substantially less accurate in the beam direction due to holographic cinematography can follow the same subject as ...
Shedding Light on Hybrid Optics: A Tutorial in
Shedding Light on Hybrid Optics: A Tutorial in

... optics to minimize losses. The standard industry technique is to first focus the light from a device to a spot about the same size as the waveguide MFD. The waveguide is then precisely positioned in free space until the endface of the waveguide is at the focal point. Since telecommunications systems ...
Improving fluorescence detection in lab on chip devices
Improving fluorescence detection in lab on chip devices

... catalytic activity or binding affinity.17 Finally, high-resolution fluorescence imaging can reveal structural qualities of macromolecular polymers such as stiffness, shape, and entanglement.18–20 Present state of the art LOC devices are typically fabricated out of glass or PDMS and connected to a fluid ...
HeNe The Helium-Neon Laser - University of Toronto Physics
HeNe The Helium-Neon Laser - University of Toronto Physics

... lens, in order to avoid overloading the detector. Make a search at higher sensitivity for other possible lasing lines between 500 and 650 nm. If none are found, set upper limits on the intensities of such lines. 2. Transverse modes and cavity alignment. Essential to the operation of this laser is a ...
Microsoft Word Format - University of Toronto Physics
Microsoft Word Format - University of Toronto Physics

... A laser is an optical oscillator and thus consists of an amplifier with positive feedback. The amplification in a He-Ne laser arises in the glow discharge while feedback of the optical radiation is provided by two highly reflecting, well aligned mirrors. The conditions necessary for amplification ar ...
Extraordinary optical transmission by interference of diffracted
Extraordinary optical transmission by interference of diffracted

... interference) and a valley will be detected when these interfering beams are out of phase (destructive interference). In the infinite fringe mode condition (bright field) all the three waves will travel along the same line and the same optical paths, i.e., φ = ψ = 0 which means a is of the order of ...
IOSR Journal of Electrical and Electronics Engineering (IOSR-JEEE)
IOSR Journal of Electrical and Electronics Engineering (IOSR-JEEE)

... of the fact that the optical control of microwave devices offers high isolation between the controlling optical beam and the controlled microwave signal, short response time, high-power handling capacity, immunity to electromagnetic interference and low cost [1]. Optical control of microwave devices ...
ELECTRO-OPTICS
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... Section 18.3 is devoted to the electro-optic properties of liquid crystals. An electric field applied to the molecules of a liquid crystal causes them to alter their orientations. This leads to changes in the optical properties of the medium, i.e., it exhibits an electro-optic effect. The molecules ...
Optical sampling technique applied to high resolution
Optical sampling technique applied to high resolution

... The gate window τ2 must be shorter than the activating pulse width τ to preserve the instrumental spatial resolution. ...
Chapter 2: Propagation of Laser Beams
Chapter 2: Propagation of Laser Beams

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the Workshop Document (3)

... boundary between a liquid and an isotropic solid. In general, for sound waves there are three polarizations, longitudinal and two polarizations of shear; and hence, there could be two reflected waves in addition to the two transmitted waves shown. In this case however, liquid does not support shear ...
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Overlay Network Andreas Holmqvist, Alexander Kronstrand Information Coding

... Nowadays, optical fiber is widely used in several areas, especially in communication networking. The main reason is that optical fiber has low attenuation and high bandwidth. However, the switching functionality is performed in the electrical domain (inside the router), thus we have transmission del ...
JOURNAL OF T O THE EUROPEAN OPTI CAL SOCI ETY
JOURNAL OF T O THE EUROPEAN OPTI CAL SOCI ETY

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The Phenomenon of Total Internal Reflection and Acceleration of

... reflection angle r. The concept acceleration is defined by the amount of order is defined by the where at speed over speed is considered as the amount at change of distances over the time [33] this paper discusses the acceleration optical fiber through the increasing amount in the reflection angle. ...
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Basics of Non-Linear Fiber Optics

... The refractive index profile along the length of the fiber is no more constant now but has a shape same as the pulse power profile. Since the refractive index profile is created by the pulse itself, it slides along with the pulse. The pulse energy has now preference to stay near its peak, as refract ...
Superior Pointing Stability Simplifies MPE Imaging
Superior Pointing Stability Simplifies MPE Imaging

... range of these hands-free lasers – 680 nm to 1080 nm in the case of the Coherent Chameleon series. For instance, the long wavelength is particularly useful for optimum excitation of red fluorophores such as mcherry. And more recently, the integration of smoothly and widely variable group velocity di ...
Chapter 2 Introduction to polarization of light - diss.fu
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... One can see that the parameter I is the intensity since E0x 2 + E0y 2 = I is fulfilled. Applying relations 2.17 allows to change the polarization state parameters like the ratio of principal axes and orientation in an independent way by ...
Advances in Environmental Biology  A. Afroozeh,
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lensed fiber
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... WT&T is offering great flexibility in lensed fiber assemblies design options. Many parameters, including lens or fiber type, fiber length, protection, termination , operating temperatures etc can be specified to ensure good system performance. Our company will process small or medium size orders in ...
AWG Parameters Definition and Discussion Anis Rahman, Ph. D.
AWG Parameters Definition and Discussion Anis Rahman, Ph. D.

... deployment of Mueller Matrix method [1]. Here the spectral response of an AWG is measured over four different polarization states and the minimum, the maximum, the average amplitude response and the polarization dependent loss (PDL) corresponding to each wavelength are recorded. The AWG parameters a ...
Top downloaded Optics Express article for March.
Top downloaded Optics Express article for March.

... We present the first experimental technique to encrypt a movie under a joint transform correlator architecture. We also extend the method to multiplex several movies in a single package. We use a Mach-Zehnder interferometer to encrypt experimentally each movie. One arm of the interferometer is the.. ...
Digital holography of total internal reflection
Digital holography of total internal reflection

... In digital holography [1], the holographic interference pattern is optically generated by the superposition of object and reference waves. But, instead of a photographic plate, the hologram is digitally sampled by a CCD camera and transferred to a computer as an array of numbers. The propagation of ...
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Resonant Total Internal Reflection Quasi

Optical properties of the human tissue
Optical properties of the human tissue

... This method includes inverse adding-doubling (IAD) method developed by Prahl et al (Prahl S.A., et al. // Appl. Opt., 1993, Vol. 32(4), P. 559-568) and inverse Monte Carlo simulations. The IAD method is widely used in tissue optics for processing the experimental data of spectrophotometry with integ ...
Mechanisms of structural colour in the Morpho butterfly: cooperation
Mechanisms of structural colour in the Morpho butterfly: cooperation

... experiment may be due to the spread of the tilt angles of the ridges (Vukusic et al. 1999). The random distribution of the ridge heights also contributes to the glittering speckles visible to the eye. That is, the ridges with random heights behave as incoherent scatterers and the scattered light acc ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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