• Study Resource
  • Explore
    • Arts & Humanities
    • Business
    • Engineering & Technology
    • Foreign Language
    • History
    • Math
    • Science
    • Social Science

    Top subcategories

    • Advanced Math
    • Algebra
    • Basic Math
    • Calculus
    • Geometry
    • Linear Algebra
    • Pre-Algebra
    • Pre-Calculus
    • Statistics And Probability
    • Trigonometry
    • other →

    Top subcategories

    • Astronomy
    • Astrophysics
    • Biology
    • Chemistry
    • Earth Science
    • Environmental Science
    • Health Science
    • Physics
    • other →

    Top subcategories

    • Anthropology
    • Law
    • Political Science
    • Psychology
    • Sociology
    • other →

    Top subcategories

    • Accounting
    • Economics
    • Finance
    • Management
    • other →

    Top subcategories

    • Aerospace Engineering
    • Bioengineering
    • Chemical Engineering
    • Civil Engineering
    • Computer Science
    • Electrical Engineering
    • Industrial Engineering
    • Mechanical Engineering
    • Web Design
    • other →

    Top subcategories

    • Architecture
    • Communications
    • English
    • Gender Studies
    • Music
    • Performing Arts
    • Philosophy
    • Religious Studies
    • Writing
    • other →

    Top subcategories

    • Ancient History
    • European History
    • US History
    • World History
    • other →

    Top subcategories

    • Croatian
    • Czech
    • Finnish
    • Greek
    • Hindi
    • Japanese
    • Korean
    • Persian
    • Swedish
    • Turkish
    • other →
 
Profile Documents Logout
Upload
Conjugated gammadion chiral metamaterial with uniaxial optical
Conjugated gammadion chiral metamaterial with uniaxial optical

... The most interesting region is around η = 0, which will give the “pure” optical activity effect (i.e., for the linearly polarized incident wave, the transmission wave will still be linearly polarized, just with the polarization plane rotated by an angle of θ ). This design possesses very strong opti ...
Calibration of Optical Tweezers
Calibration of Optical Tweezers

... of the dichroic mirror is used to view the optical trap. The sample slide is mounted onto X-Y-Z stages that allow us to bring the sample into focus and drag the trapped particles through the medium. National Instrument’s Vision Assistant software is used to record and analyze live image-feeds obtain ...
Journal of Modern Optics Slow and fast light: fundamentals and
Journal of Modern Optics Slow and fast light: fundamentals and

... where n is the refractive (phase) index and ! is the angular frequency of the carrier wave of the light field. One refers to light as being slow light for vg  c, fast light for vg 4 c [15], and backwards light for vg negative. Extreme values of the group velocity (that is, vg appreciably different ...
The effect of detector size on the signal-to
The effect of detector size on the signal-to

... A confocal microscope may be converted into a polarization-sensitive instrument merely by placing a polar in the illumination path and a suitably crossed analyser in the detection path. The confocal microscope is particularly suitable for polarised light studies since it possesses an infinite extinc ...
A Project Report on- *OPTICAL FIBRE CABLE*
A Project Report on- *OPTICAL FIBRE CABLE*

... Because the infrared light used in communications can not be seen, there is a potential laser safety hazard to technicians. In some cases the power levels are high enough to damage eyes, particularly when lenses or microscopes are used to inspect fibers which are inadvertently emitting invisible IR. ...
Optical Materials for LWIR Applications
Optical Materials for LWIR Applications

... temperatures in the -30 to 90 °C range have peak emittance in the LWIR. One major limitation optical engineers face when designing imaging systems for the LWIR is the lack of available optical materials. An engineer designing a visible system has hundreds of different materials at his/her disposal w ...
X-ray Optics - Studentportalen
X-ray Optics - Studentportalen

... A schematic multilayer structure and a typical measured reflectivity spectrum. Layer A usually consists of a strongly absorbing material (metal). Layer B is a spacer made of a low-density material. ...
Influence of polarization direction, incidence angle, and geometry on
Influence of polarization direction, incidence angle, and geometry on

... the LFF decreases from ∼3.7777 at ε1 = 1 to ∼ 2.4082 at ε1 = 5. The increased ε1 should reduce the induced charge in the inner surface of the Au shell, which leads to the decreased near field.[24] Finally, we discuss the state when the polarization direction is parallel to the incidence plane. When ζ ...
PDF
PDF

... as it propagates through the fiber (unless care is taken to align the polarization of the injected light with respect to the principal axes of the birefringence). Polarization-maintaining (PM) fibers are designed to include birefringence in a particular axis of the fiber. By including a well-defined ...
The optics and performance of dual-focus fluorescence correlation
The optics and performance of dual-focus fluorescence correlation

... close to the infinite dilution limit. However, as pointed out in numerous publications, conventional single-focus FCS suffers from its sensitivity to a wide array of optical and photophysical factors such as laser beam quality, cover-slide thickness variation, refractive index mismatch, or optical s ...
PDF
PDF

... different OAM states. Besides its application in quantum information for high-dimensional entanglement [2], OAM has recently drawn significant attention for a wide range of classical applications such as high-capacity optical communications [3,4] and optical micromanipulations [5]. While free-space ...
Measurement of radiation-pressure
Measurement of radiation-pressure

... with microwave resonator readouts 关12兴 and in optical microcavities 关13兴. Kippenberg et al. observed PIs in ultrahighQ toroidal optical microcavities, at frequencies of 4.4– 49.8 MHz and modal masses of 10−8 – 10−9 kg. Enhancement or reduction of the damping of a microlever at a similar mass scale h ...
Cloaking at Optical Frequencies - Cornell ECE
Cloaking at Optical Frequencies - Cornell ECE

... operating in the optical regime. The cloak operates at a wide bandwidth and conceals a deformation on a flat reflecting surface, under which an object can be hidden. The device is composed of nanometer size silicon structures with spatially varying densities across the cloak. The density variation i ...
Polarization Model at 60 GHz
Polarization Model at 60 GHz

... Polarization Description Using Jones Vector • Wave polarization can be described using Jones calculus introduced in optics to describe polarized light. In general case Jones vector is composed from two components of electric filed of EM wave. • The Jones vector e is defined as the normalized two-dim ...
Lab 7: Fabry-Perot Interferometer
Lab 7: Fabry-Perot Interferometer

... successive sets of peaks in the transmitted spectrum. The resolving power of the device tells us the minimum difference between two wavelengths that can be distinguished. We will use the Rayleigh criterion to define this property. The criterion states that the separation of the peaks corresponding t ...
Magnetic hyperbolic optical metamaterials ARTICLE
Magnetic hyperbolic optical metamaterials ARTICLE

Reflection properties, anomalous group velocity and negative
Reflection properties, anomalous group velocity and negative

... In recent years, Photonic Crystal structures are the subject of intensive and widespread study because they can control the propagation of electromagnetic waves in a ways that conventional optics cannot [1-3]. Photonic Crystal, also known as Photonic Band Gap Material (PBG), are periodic arrangement ...
Gaussian Beam Propagation Code - LAS
Gaussian Beam Propagation Code - LAS

... With 2 x 2 ABCD Matrices only well aligned optical systems can be analyzed. However, for many purposes the analysis of small misalignment is interesting. This feature has not been implemented yet the LASCAD program, but it is under development, and will be available within the next months. ...
26 - Journal of Optoelectronics and Advanced Materials
26 - Journal of Optoelectronics and Advanced Materials

... Institute of Photovoltaics, Research Center Jülich, D-52425 Jülich, Germany Length measurement with nm-accuracy can be carried out by means of a new phase selective partly transparent detector (PSTD). The working principle bases on the sampling of a standing wave created in front of a movable mirror ...
Optical properties of the human tissue
Optical properties of the human tissue

... This method includes inverse adding-doubling (IAD) method developed by Prahl et al (Prahl S.A., et al. // Appl. Opt., 1993, Vol. 32(4), P. 559-568) and inverse Monte Carlo simulations. The IAD method is widely used in tissue optics for processing the experimental data of spectrophotometry with integ ...
Nondiffracting Light Beams for Long Ranges
Nondiffracting Light Beams for Long Ranges

... in free space using a transmission telescope of 10 cm diameter and a beam monitoring telescope of 50 cm diameter, we observed an unusual image with a striped pattern due to atmospheric back-scattering of the laser beam. The image provided an opportunity to examine this effect and found out the LRNB. ...
Strong Polarized Enhanced Raman Scattering via Optical Tunneling
Strong Polarized Enhanced Raman Scattering via Optical Tunneling

Direct measurement of standing evanescent waves with a photon
Direct measurement of standing evanescent waves with a photon

... that make it possible to record optical images of surfaces with visible light at a spatial resolution well below Abb6's diffraction limit of about half of a wavelength. One can achieve this by raster scanning a small aperture of subwavelength diameter in close proximity over the sample surface. Eith ...
Polarized Light Assessment of Complex Turbid
Polarized Light Assessment of Complex Turbid

... formidable challenges. Multiple scattering causes extensive depolarization that confounds the established techniques. Further, even if some residual polarization signal can be measured, multiple scattering also alters the polarization state, for example by scattering-induced diattenuation and by sca ...
measurement of three-dimensional temperature fields
measurement of three-dimensional temperature fields

... and later illuminated by L~,(s. -_).it acts as a complex diffraction grating from which emanates a fully detailed replica of I;,(s. 2). The reader may refer to monographs such as that by Collier, Burckhardt and Lin [ 121 for a detailed account of optical holography. Since the holographic recording p ...
< 1 ... 43 44 45 46 47 48 49 50 51 ... 108 >

Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
  • studyres.com © 2025
  • DMCA
  • Privacy
  • Terms
  • Report