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Lectures on Theoretical Physics Linear Response Theory
Lectures on Theoretical Physics Linear Response Theory

... parameters. External parameters may be the region of space within which a certain number of particles are confined, mechanical stress, or the strength of an external electric or magnetic field. If temperature or the external parameters change slowly enough, the system can attain the new equilibrium ...
Polarization properties of coherent VUV light at 125
Polarization properties of coherent VUV light at 125

... Vacuum ultra-violet (VUV) light with a high and well known degree of polarization, in the 10 eV range (∼ 125 nm), is a powerful tool for a large amount of investigations. Many important properties of various materials may be revealed by experiments using either linearly or circularly polarized VUV r ...
Collective molecular rotation in water and other simple liquids
Collective molecular rotation in water and other simple liquids

... crystals w7,9,13x. Lattice vibrations which carry an electric dipole moment have radically different properties from nonpolar vibrations since the dipole moment couples the lattice vibrations to the radiation field in the crystal to form mixed excitation modes, part phonon and part photon, which hav ...
Section 3: Electromagnetic Waves 1
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... sweeps around in a circle at a frequencyω, as shown in Fig.2b. For the upper sign ( e1 + ie 2 ) , the rotation is counterclockwise when the observer is facing into the oncoming wave. This wave is called left circularly polarized in optics. In the terminology of modern physics, however, such a wave i ...
Download PDF
Download PDF

... laser to obtain images of corneal cells as well as information about the dimensions of the basal epithelial and endothelial cells. The endothelium is the deepest cellular layer of the cornea. It is in direct contact with the aqueous humour and represents the most important contributing layer to corn ...
Theory of Optical Tweezers
Theory of Optical Tweezers

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2. Spectral Stray Light

... measurements (Damm 2007) are illustrated in fig. 3. It can be seen that the spectral stray light can span 60 or more channels. The gap around channel 0 is due to the fact that only the out-of-band channels are shown (Damm 2007). While this method quantifies the stray light over “long ranges”, it is ...
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In-fiber microchannel device filled with a carbon

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Full Article PDF

Growth and characterization of Urea Lead nitrate
Growth and characterization of Urea Lead nitrate

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Fiber Optic Sensors and Their Applications
Fiber Optic Sensors and Their Applications

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Sun et al., Nature 493, 195 (2013).

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Ce e cu galben reprezinta corecturi de limba/topica/inteles/gramatica

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Transfer of Light Helicity to Nanostructures
Transfer of Light Helicity to Nanostructures

... interaction of structured light, such as radially polarized beams, with plasmonic or metallic structures [13–15]. However, these previous studies mostly focused on optical properties, such as mode selection, plasmon focusing, etc., of plasmonic or metallic structures, including photonic crystals as ...
Measuring cellular structure at submicrometer scale with light
Measuring cellular structure at submicrometer scale with light

... diluting the stock suspension with de-ionized and distilled water to obtain the required optical density. Fig. 3 summarizes the experimental results obtained for polystyrene particles. To demonstrate the symmetry of the A/LSS scattering patterns, the parallel-polarized component of the backscattered ...
Surface plasmon resonance sensors based on uniform
Surface plasmon resonance sensors based on uniform

... etching with hydrofluoric acid (HF) to eliminate fiber cladding.7,8 The mechanical strip of the fiber cladding has also been used.8 However, these methods only provide access to a relatively small intensity of the evanescent field, and some of these options increase the fragility of the fiber. Recen ...
Prediction of photothermal phase signatures from arbitrary
Prediction of photothermal phase signatures from arbitrary

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properties of laser beams
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Birefringent Thin Films for LCDs Pochi Yeh

... the plane of incidence. For normal incidence, the angles are 45 degrees. When the plane of incidence in 45 degrees from the absorption axes of the polarizers, the angle between the unit vector o1 and the normal vector s is an increasing function of the angle of incidence. The deviation from 45 degre ...
Effect of the refractive index change kinetics of
Effect of the refractive index change kinetics of

... described earlier [13] was used. The samples with thickness of 2 mm were prepared. These samples were UV-exposed using a 4 mW He–Cd laser at 325 nm. The procedure of exposure was similar to that described in [14] (Fig. 1). A stripe with Gaussian distribution of dosage and maximum dosage about 0.9 J∕ ...
Fiber optics for laser cooling and trapping
Fiber optics for laser cooling and trapping

... the FC-APC (angled physical contact) type for deterring back-reflections. Radiation splitting is achieved by using a cascade of rotary half-wave plates in combination with polarization beam splitters (Figure 2a). This provides a remarkable degree of flexibility and allows almost any desired splittin ...
Utilization of Birefringent Fiber as Sensor of Temperature Field
Utilization of Birefringent Fiber as Sensor of Temperature Field

... 0.75 rad.m-1°C-1. High sensitivity on the ambient temperature was also investigated during measurement of effect of torsion on the transient properties and so that has been measured more detailed [2]. Along the propagation of only one polarization mode, temperature dependence is not substantial in m ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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