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... • Production of a magnified image of the lamp filament that is focused at the level of the aperture plane of the condensor. • Opening or closing this diaphragm controls the angle of the light cone that reaches the specimen, which is determining the image resolution along with the numerical aperture ...
Electromagnetic wave scatterings by anisotropic metamaterials
Electromagnetic wave scatterings by anisotropic metamaterials

... electric and/or magnetic type, and thus possess arbitrary values of permittivity and permeability dictated by such resonance structures.1 Many novel EM properties were predicted or discovered based on metamaterials, including the negative refraction,2 the zero-refraction-index band gap,3 the superle ...
Why Did John Herschel Fail to Understand Polarization
Why Did John Herschel Fail to Understand Polarization

... some particles is somehow augmented after breaking through the first surface of the convex lens, but the velocity of the others is somehow retarded. Consequently, the retarded particles are reflected by the plane plate and bright rings appear, but the accelerated particles are transmitted through th ...
Beam shaping based on intermediate zone diffraction of a micro
Beam shaping based on intermediate zone diffraction of a micro

... between the edge boundaries, which correspond to 2M maxima in principle. As it propagates forward through the slit, it evolves into degressive numbers (M – 1, M – 2, ..., 1) of maxima in the intermediate zone, which relate to far field diffraction beams of the same orders. Among the local maxima in ...
View/Open - Dora.dmu.ac.uk
View/Open - Dora.dmu.ac.uk

... the perfect replay condition to achieve the brightest image as a rule of thumb. Also if we notice the recording wavelength used to record this hologram was 632.8nm and the replay wavelength used is 650nm so there should be small shift in the angle. We approximately compensate this shift in angle by ...
Experimental characterization of the optical fiber sensors Andrei Stancalie, Gelu Ilie
Experimental characterization of the optical fiber sensors Andrei Stancalie, Gelu Ilie

... and the reference sensor, were simultaneously recorded in the laboratory. The calibration procedure of the optical fiber sensors aims to: a) study their parameters at constant temperature; the Bragg sensors parameters are stored in databases which contain also, the recorded Bragg peak shift, the fib ...
Beam steering with spatial light modulators: Quantisation effects
Beam steering with spatial light modulators: Quantisation effects

... in hologram computation. For this purpose, we created a Matlab program. Due to the SLM non-flatness [4], a modification to the described holograms has to be made: the full area of the SLM is not being used since the shape of the resulting spot became too deteriorated. We only selected central pixels ...
Paper
Paper

ABSTRACT Dissertation: STUDIES OF
ABSTRACT Dissertation: STUDIES OF

... Recently, there have been many studies of “negative refraction” phenomena on surface plamsons involving consideration of loss mechanisms, which have opened the door to an entire field of sub-wavelength imaging. What is a Surface Plasmon Polariton (SPP)? Let’s start with a more familiar object- a pla ...
Deposition and Characterization of Dielectric Distributed Bragg
Deposition and Characterization of Dielectric Distributed Bragg

... To improve the performance of VCSELs, mirrors with less optical loss can be used. VCSELs require mirrors with > 99 % reflectance, and Distributed Bragg Reflectors (DBRs) are used to achieve this. Today, epitaxially-grown semiconductor DBRs are used, however these have low refractive index contrast, ...
Angle-independent structural colors of silicon
Angle-independent structural colors of silicon

... properties in side-view. A TM electromagnetic wave is normal incident on the 1-D grating, and a periodic phase-matched Floquet (Bloch) boundary condition is used. Results from a commercial available solver (Comsol 4.2, COMSOL Inc., Burlington, Massachusetts) can be seen in Fig. 2. It seems that a co ...
Ocean optics estimation for absorption, backscattering, and phase
Ocean optics estimation for absorption, backscattering, and phase

... The sensitivity of the inverse algorithm to the number of quads used in the solution procedure of Hydrolight was first evaluated. This test was run with the best conditions possible for the inverse method— the scattering was described by the HG phase function, the wind speed was zero, and the data w ...
Unit 1.7 Optical networking and processing
Unit 1.7 Optical networking and processing

... Electrical input ...
Development of a New Optical Wavelength Rejection Filter
Development of a New Optical Wavelength Rejection Filter

... Index Headings: Instrumentation, emission spectroscopy; Filters; Ar + lasers; Light scattering; Optics; Reflectance; Raman spectroscopy; Techniques, spectroscopic; Visible UV spectroscopy; X-ray diffraction. ...
Optical Properties of Plasmonic Ag/Ni Square Nanostructures
Optical Properties of Plasmonic Ag/Ni Square Nanostructures

... The field of plasmonics is a rather new one, with its origin in the beginning of the 1900s. Besides shedding light on long existing phenomena such as the stained glass of churches and castles, the plasmons come with enticements of applications in a wide range of domains from more efficient computer ...
FILTERS AND BEAM SPLITTERS Several of the applications of
FILTERS AND BEAM SPLITTERS Several of the applications of

... Wavelength-selective filters are used to produce or select specific color or band of color from a white light source, to isolate a specific wavelength, or to reject a specific wavelength or band of wavelengths. We will study three general classes of wavelength-selective filters according to their us ...
Prism Design
Prism Design

... reflecting surfaces) are paraxial approximations of the true values that would be obtained by trigonometric ray tracing. Paraxially, angles in radians replace the sines of the angles. In most applications, this degree of approximation is adequate. For example, an angle of 7 deg is 0.12217 radians an ...
June 4 - The 7th International Conference on Surface Plasmon
June 4 - The 7th International Conference on Surface Plasmon

Document
Document

... The eye perceives light rays as if they came through the mirror. Imaginary light rays extended behind mirrors are called sight lines. The image is virtual since it is formed by imaginary sight lines, not real light rays. J.M. Gabrielse ...
Cavity Enhanced Reflector Based Hybrid Silicon Laser
Cavity Enhanced Reflector Based Hybrid Silicon Laser

... seamless integration of photonic and electronic functionality on the same chip will become available. This, on its turn, enables exciting new applications such as ultra-fast optical communication links between different chips on a circuit board or low-cost lab-on-a-chip solutions. Most optical compo ...
3D Finite Element Model for Writing Long
3D Finite Element Model for Writing Long

... show lower retro-reflection, higher sensitivity and robustness in sensing applications when compared with FBG [8]. A LPFG can be produced mechanically [9], chemically (etching) [10], by photonic processes (ultra-violet irradiation) [11] or thermally, either by applying an electric arc discharge [12] ...
Ray Diagrams Powerpoint
Ray Diagrams Powerpoint

... The eye perceives light rays as if they came through the mirror. Imaginary light rays extended behind mirrors are called sight lines. The image is virtual since it is formed by imaginary sight lines, not real light rays. J.M. Gabrielse ...
Resolution-and throughput-enhanced spectroscopy using high
Resolution-and throughput-enhanced spectroscopy using high

Diode Laser Characteristics
Diode Laser Characteristics

... net gain function which is periodic in frequency, as shown in Figure 5 (see Yariv 1991 or Möller 1988 for a discussion of optical cavities). The period is called the “free spectral range”, and is given by ∆ν F SR = c/2Ln, where c is the speed of light, n is the index of refraction (n ≈ 3.6 in the s ...
Governing the speed of light and its application to the
Governing the speed of light and its application to the

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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