• Study Resource
  • Explore
    • Arts & Humanities
    • Business
    • Engineering & Technology
    • Foreign Language
    • History
    • Math
    • Science
    • Social Science

    Top subcategories

    • Advanced Math
    • Algebra
    • Basic Math
    • Calculus
    • Geometry
    • Linear Algebra
    • Pre-Algebra
    • Pre-Calculus
    • Statistics And Probability
    • Trigonometry
    • other →

    Top subcategories

    • Astronomy
    • Astrophysics
    • Biology
    • Chemistry
    • Earth Science
    • Environmental Science
    • Health Science
    • Physics
    • other →

    Top subcategories

    • Anthropology
    • Law
    • Political Science
    • Psychology
    • Sociology
    • other →

    Top subcategories

    • Accounting
    • Economics
    • Finance
    • Management
    • other →

    Top subcategories

    • Aerospace Engineering
    • Bioengineering
    • Chemical Engineering
    • Civil Engineering
    • Computer Science
    • Electrical Engineering
    • Industrial Engineering
    • Mechanical Engineering
    • Web Design
    • other →

    Top subcategories

    • Architecture
    • Communications
    • English
    • Gender Studies
    • Music
    • Performing Arts
    • Philosophy
    • Religious Studies
    • Writing
    • other →

    Top subcategories

    • Ancient History
    • European History
    • US History
    • World History
    • other →

    Top subcategories

    • Croatian
    • Czech
    • Finnish
    • Greek
    • Hindi
    • Japanese
    • Korean
    • Persian
    • Swedish
    • Turkish
    • other →
 
Profile Documents Logout
Upload
CHAPTER 1 Wave Nature of Light
CHAPTER 1 Wave Nature of Light

Intensity and Phase Noise of Optical Sources
Intensity and Phase Noise of Optical Sources

... part and the delayed part of the laser light. different lasers, or between the laser output and a delayed portion of it, often with an additional frequency shift provided by an acousto-optic modulator ( delayed self-heterodyne measurements, see Fig. 2). The delay is often achieved with a long optic ...
Optical negative refraction by four-wave mixing in thin metallic nanostructures LETTERS *
Optical negative refraction by four-wave mixing in thin metallic nanostructures LETTERS *

Optical coupling devices
Optical coupling devices

... the line of each roof apex (a re?ection of this in the a receiving ?bre as discussed in relation to FIG. 3 opposite face is equally counted.) The negligible pro 60 above. Emitted rays 49 and received rays 51 clearly portion of rays striking the vertex of the cube is ignored. illustrate bundle 48’s d ...
Advanced optics tutorials
Advanced optics tutorials

... The on-axis intensity can be very high due to the small area of the beam. Care should be taken in cutting off the beam with a very small aperture. The source distribution would no longer be Gaussian, and the far-field intensity distribution would develop zeros and other non-Gaussian features. Howeve ...
Superprism phenomena in planar photonic crystals
Superprism phenomena in planar photonic crystals

... for 100-GHz separation). To project the possible performance of the superprism in a WDM system, we extrapolated our result as follows. For a separation of the output waveguides of 3 m, the device would have to be 500 m long. Assuming the beam was collimated, it could be coupled into PhC waveguides s ...
Mechanical Properties and Microstructure of Zinc Oxide
Mechanical Properties and Microstructure of Zinc Oxide

... Zinc oxide varistors are strongly nonlinear resistors that have been used to regulate transient voltage surges of unwanted magnitude for high voltage and power-related applications, such as surge arresters in power transmission and distribution for the protection of electronic devices. The ZnO varis ...
Shifting the spherical focus of a 4Pi focusing system
Shifting the spherical focus of a 4Pi focusing system

... radially polarized field: an annular intensity distribution with intensity minimum in the center, i.e., both are still fields with radial polarization. In fact, it can be verified that the modulation function has a constant modulus, suggesting that modulation does not change the intensity distributi ...
The  Optical  and  Physical Advisor:  Peter Collings
The Optical and Physical Advisor: Peter Collings

Beam manipulation: prisms vs. mirrors
Beam manipulation: prisms vs. mirrors

... of reflection (figure 1). Combining several reflective planes with each other yields a higher number of potential applications. For example, two plane mirrors oriented at a given angle α to each other will reflect an incident beam of light by twice that angle, 2α, as long as the plane of incidence i ...
Quadriwave lateral shearing interferometry
Quadriwave lateral shearing interferometry

... measurement of the optical path length distribution that allows living cells to be described with a diffraction-limited transverse resolution and a sub-wavelength axial accuracy [9]. More recently, this method was applied to perform optical diffraction tomography of a pollen grain [10], and tomograp ...
Non-Collinear Second Harmonic Generation in
Non-Collinear Second Harmonic Generation in

... the nonlinear regime. All the properties of the newly generated light can be completely different from the properties of the incident beam. An increasing number of photonic applications based on these nonlinear effects are routinely in use, but for other desired and in principle possible new commerc ...
Polarimeter - ScholarWorks@UNO
Polarimeter - ScholarWorks@UNO

... indicates the number of the term in the Fourier series. 20 system may be considered as a separate matrix that In Table 2, the elements M of the Mueller matrix are includes constants and variables with the variables shown in terms of the values conducted to it by conduc being a simple product of the ...
Spatial amplitude and phase modulation using commercial twisted
Spatial amplitude and phase modulation using commercial twisted

... or a suitable subset, follows these two requirements. The setup used to decouple the phase and amplitude modulation is shown in Fig. 2. A monochromatic beam of light at a wavelength of 532 nm is incident normal to the SLM surface. The modulated light is reflected from the SLM. We choose an observati ...
Entangled Photons and Bell`s Inequality
Entangled Photons and Bell`s Inequality

... of the incident photons (on the order of 10−10 ) undergo spontaneous parametric down conversion. In spontaneous parametric down conversion, a single pump photon is split into two new photons called the signal and idler photons. In order to maintain a conservation of energy and momentum, these photon ...
Ultracompact high-efficiency polarizing beam splitter with a hybrid
Ultracompact high-efficiency polarizing beam splitter with a hybrid

... is designed to follow the direction of propagation of the TE-polarized light, which leads to a 0.75-mm shift of the horizontal output waveguide in the 2y direction from the input waveguide, as shown in Fig. 1(a). The magnitude squared of the time-averaged electric f ield (TM) and magnetic f ield (TE ...
Guided-Wave Optical Biosensors
Guided-Wave Optical Biosensors

... where ν is the light speed inside the medium, ν D = ν ( 3 ⋅ ( μ a + μ s ) ) is the optical diffusion ...
Multichip module with planar-integrated free-space
Multichip module with planar-integrated free-space

... Second, VM-type architectures involve point-tomultipoint 共fan-out兲 and multipoint-to-point 共fan-in兲 operations that cannot so easily be achieved with electronic or guided-wave optical hardware if the splitting or combining ratio is high.1 By contrast, elegant and comparatively simple implementations ...
Synchronization of Micromechanical Oscillators Using Light
Synchronization of Micromechanical Oscillators Using Light

Michelson Interferometer
Michelson Interferometer

... Now substitute white light for the Na light and look for white light fringes. White light fringes are localized fringes with a dark fringe at the centre and 5 or 6 coloured fringes on both sides. Turn the micrometer slowly until white light fringes appear at the centre of the field of view. Note dow ...
Uranium Oxide as a Highly Reflective Coating
Uranium Oxide as a Highly Reflective Coating

... Pros: high density and many electrons (92) for absorption, high theoretical reflectivity: low absorption and high index of refraction Con: chemically reactive (oxidizes in air to most abundant natural oxide UO2 at STP) We study different compounds of uranium, such as uranium dioxide (UO2) and uraniu ...
The Equation of Number the Total Internal of Reflection Angles
The Equation of Number the Total Internal of Reflection Angles

... close to the axis and at various angles, allowing efficient coupling of light into the fiber .However, this high numerical aperture increases the amount of dispersion as rays at different angles have different path length and therefore take different times to traverse the fiber.In graded – index fib ...
Focusing of light through a stratified medium: a practical
Focusing of light through a stratified medium: a practical

... A commonly used diffraction model for microscope objective is that of Gibson and Lanni [2]. It is based on scalar diffraction theory. One advantageous feature of this model is that it specifically introduces as parameters to compute the PSF the design conditions of use of the objective, as recommend ...
Total internal reflection holography for optical interconnections
Total internal reflection holography for optical interconnections

... the needs of optical interconnections. They are efficient and can serve as focusing elements, imaging elements, beam deflectors, and fan-out elements. Almost any shape of structure can be realized. This flexibility allows complex and compact interconnections. Two different types of diffractive optic ...
Application scenarios for optical OFDM
Application scenarios for optical OFDM

< 1 ... 28 29 30 31 32 33 34 35 36 ... 108 >

Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
  • studyres.com © 2025
  • DMCA
  • Privacy
  • Terms
  • Report