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THE VARIATION O F .THE STRESS OPTICAL COEFFICIENT WITH
THE VARIATION O F .THE STRESS OPTICAL COEFFICIENT WITH

... Babcock (1968, 1969) demonstrated that certain physical properties vary linearly in primary phase fields and so can be accurately predicted by computer if the composition of the glass is known. ...
Acoustooptic interaction of two light beams in a paratellurite crystal
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Thermal Lensing in a Nd:YAG Laser Rod
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... brain, small currents flow in the neural system and produce a weak magnetic field which, nowadays, can be measured noninvasively by a SQUID magnetometer. A huge detector composed of flux-transformers (SQUIDs) and liquid helium for cooling is placed as close to the head of an human. This huge detecto ...
Continuous wave Nd:YAG channel waveguide laser produced by
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... pumped Nd:YAG channel waveguide fabricated by PBW. 2. Experiments in details The optically polished Nd:YAG (doped by 1 at. % Nd3+ ions) crystal used in this work was cut into dimensions of 10(x)×4.8(y)×1.5(z) mm3. The PBW process was carried out by using the facilities at the Center for Ion Beam App ...
Effect of TiO2 on optical properties of glasses in the soda
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... electronic isolators which do not absorb light in the visible spectral range, i.e., without going into details, the electronic orbitals, atoms, molecules or chemical bonds in glassy materials do not resonate with visible photons [1]. This in itself, however, is not a unique feature of glasses. More ...
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... locking function and polarization shifting function of modulation shifted by the polarization shifter of modu the modulation means were accomplished by separate 15 lator 310 in accordance with the binary value mani structural elements, consisting of mode-locking ele fested by the data bit stream app ...
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Experiment 24 - School of Physics
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... while the other half is reflected to the mirror M . A second glass plate called the compensator (C) is placed between B and M to ensure that the amount of glass in each path is the same.4 The two mirrors reflect the light back to B where the beams are recombined. The combined beams emerge from the i ...
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... Here, we use a Si3 N4 system—a membrane surrounded by air—that exhibits advantages such as transparency in the visible range and a significant refractive index (taken here fixed as n2 ¼ 2:05). We use two-dimensional (2D) PhCs [17] for an effect in all directions of the plane, and with a square latti ...
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... laser media. This research made it possible to improve the characteristics of the existing lasers and to develop new ones. Active glass optical fibers are one of the most efficient laser media. Fiber lasers have excellent beam quality and are the most efficient solid-state lasers. Until recently, on ...
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... scale, we instead use in this paper the gap appearing at the 0⫹ and 1⫺ branch intersections, which is controlled by the the first order of the grating. However, in order to probe this gap by the SPR technique, a prism needs to be used to increase the excitation light transverse momentum. As illustra ...
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... spectroscopy, and water contact angle measurement. We found that with increasing plasma power, film thickness is gradually increased while optical transmittance is drastically decreased. However, under the same plasma condition, water contact angle is decreased with increasing NH3 flow rate. The FT- ...
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... dip time increases as shown in Figures 5 and 7. This implies that at a higher dip time, transparent films are obtained which could be used as a transparent conducting oxide (TCO). The films also show high transmittance in the near infrared region and hence could be of use in devices that provide hea ...
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... results from a different far field light microscopical approach, spatially modulated illumination 共SMI兲 microscopy, are described, making use of ‘‘point spread function engineering’’ methods.25–27 It has been shown that using this technique, distances in the few nanometer range, and object size eval ...
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... vapor pressure of sodium and its atomic density. The absorption cross-section of the sodium D2 line (32 S1/2 → 32 P3/2 ) is shown in Figure 1 for temperatures of 170 K (mesosphere) and 383 K (laboratory). The highest cross-section peak is centered at the v0 frequency which corresponds to the 32 S1/2 ...
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... drift by imaging the luminescence from the recombination is possible. The key differences between this and cathodoluminescence (CL) is that the spatial resolution from the recombination is maintained. This has the advantage for cases in which the diffusion or drift of charge produces luminescence at ...
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Ultrashort-Pulse Generation and Ultrafast Phenomena

... with the same sample volume, and the mechanism for materials processing can differ from amplified pulses at kHz rates. In addition to superposing the effects of each pulse, investigators have reported that cumulative heating occurs when successive pulses interact within a microsecond time scale. Dev ...
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Plasmonic chirality of L-shaped nanostructure composed of two

... LSAN composed of two slices with different thickness are formed through rotating substrate azimuth and controlling deposited time. Experimental results show strong optical chirality of LSAN in visible and near-IR regions. With increasing thickness difference of LSAN, the intensity of CD spectrum is ...
Diffractive optical element and optical pickup apparatus
Diffractive optical element and optical pickup apparatus

... achieves compatibility With three different types of recording medium including a next-generation format, and that employs a diffractive optical element offering high diffrac tion e?iciency and easy to fabricate. [0014] In order to attain the above-mentioned objects, the folloWing six aspects of the ...
Diffuse Reflectance Spectroscopy
Diffuse Reflectance Spectroscopy

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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