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Ultrahigh-resolution optical coherence tomography
Ultrahigh-resolution optical coherence tomography

Optical, Confocal, and 4Pi Microscopy
Optical, Confocal, and 4Pi Microscopy

... are used to collect light from the sample. Typically, a standard compound microscope will have three objective lenses: a scanning lens, a low power lens, and a high power lens. Advanced microscopes have an additional lens called an oil immersion lens. The stage is placed below the objective lens and ...
Laser ranging: a critical review of usual techniques
Laser ranging: a critical review of usual techniques

... directions. On the horizontal axis are the physical dimensions of the ‘‘volume of view’’ along the X, Y, and Z directions, assuming that the volume of view is a cube. Vertically are the number of pixels 共voxels兲 resolved along the three-axis. A few typical laser wavelengths are shown. This graph can ...
Advanced Applications
Advanced Applications

... beam is identical to that of the pump beam but propagates in the opposite direction; thus the Doppler shift observed from this beam is of opposite sign. Hence, only atoms with zero velocity will be in resonance with both the pump and probe beams. If the laser frequency is in resonance with zero-velo ...
Practical Aspects of Mirror Usage in Optical Systems for
Practical Aspects of Mirror Usage in Optical Systems for

... be linearly polarized, meaning that the field vector points at a fixed angle with time in the plane perpendicular to the direction of propagation; or circularly polarized, when the tip of the vector traces a circular path with time in that plane; or, most generally of all, elliptically polarized, wh ...
Practical Aspects of Mirror Usage in Optical Systems for
Practical Aspects of Mirror Usage in Optical Systems for

... be linearly polarized, meaning that the field vector points at a fixed angle with time in the plane perpendicular to the direction of propagation; or circularly polarized, when the tip of the vector traces a circular path with time in that plane; or, most generally of all, elliptically polarized, wh ...
How optics has changed data communications
How optics has changed data communications

High-Repetition TDS System
High-Repetition TDS System

... signal, and (3) a dispersion-flattened dispersion-decreasing fiber (DF-DDF) for compressing the shaped optical pulse. When the MZM is driven by a sinusoidal RF signal (sin ωt) such that Equation (1) is satisfied, continuous wave light input at a wavelength of λ0 becomes the flat optical comb signal, ...
Optical Metrology vs SEM. Range, Accuracy, Repeatability
Optical Metrology vs SEM. Range, Accuracy, Repeatability

... limited to feature sizes generally larger than the measurement wavelength; so continued use of conventional techniques has depended on use of shorter wavelength illumination as features shrink. The use of SEMs is now increasing, but SEM tool cost is high and SEM measurements have a number of other d ...
Physical Optics
Physical Optics

... The study of light has been an important part of science from its beginning. The ancient Greeks and, prior to the Middle Ages, Islamic scholars provided important insights. With the coming of the Scientific Revolution in the 16th and 17th centuries, optics, in the shape of telescopes and microscopes ...
Optical Waveguides and Photodiodes in 0.18µm CMOS SOI with No Post-processing
Optical Waveguides and Photodiodes in 0.18µm CMOS SOI with No Post-processing

Wavelength Converters in Optical Communication Systems
Wavelength Converters in Optical Communication Systems

... converters while “10-20dBm” is needed for fiber based converters. Because of the low conversion efficiencies the signal-to noise ratio for the converted signals needs attention, especially if converters have to be cascaded. Experiments using SOA converters with very long cavities have, however, resu ...
Study on high signal-to-noise ratio (SNR) silicon p
Study on high signal-to-noise ratio (SNR) silicon p

... According to the foregoing scheme, shallow junction photodiode 2CU series (2CU stands for photodiode fabricated on the substrate of the n-type silicon) were manufactured using standard CMOS technology. Then the properties of these devices are tested and analyzed, and finally the approaches to enhanc ...
fabrication, characterization and application of dispersive gradient
fabrication, characterization and application of dispersive gradient

... One of the main characteristics of the short pulse is a broad spectral range. All these spectral components in the pulse have to be in a specific manner or, as it is called, “in phase” to form a transform limited pulse [5]. This means that the pulse is then travelling in a dispersive medium, and pha ...
4.1 Simulated Emission and Photon Amplification
4.1 Simulated Emission and Photon Amplification

... The principle of the LASER. (a) Atoms in the ground state are pumped up to the energy level E3 by incoming photons of energy hυ13 = E3 –E1 . (b) Atoms at E3 rapidly decay to the metastable state at energy level E2 by emitting photons or emitting lattice vibrations; hυ32 = E3 –E2 . (c) As the states ...
Second Harmonic Generation Technique and its Applications
Second Harmonic Generation Technique and its Applications

... dipolar or combination of both contributions. There exists a large class of phase matchable organic and inorganic single crystals, with large second order NLO susceptibilities. Some examples of currently used and commercialized non-centrosymmetric single crystals for the frequency up conversion, OPO ...
Noise-related resolution limit of dispersion measurements with white
Noise-related resolution limit of dispersion measurements with white

... lasers17,18 and semiconductor saturable absorber mirrors,19 narrowband phase oscillations might also occur, depending on the device design. Even for picosecond lasers, the dispersion effects can sometimes be important and may have to be measured. In general, dispersion characterization is a valuable ...
Effect of barrier height on linear and nonlinear
Effect of barrier height on linear and nonlinear

Optical Filters for Laser-based Fluorescence Microscopes
Optical Filters for Laser-based Fluorescence Microscopes

... DPSS laser in the future), nor for systems that use semiconductor lasers. The spectral output from diode and optically pumped semiconductor lasers can vary appreciably from laser to laser, with temperature, and as the lasers age. Therefore for most laser microscopy systems broader excitation filters ...
Characterisation of the Humidity and Temperature Responses of a
Characterisation of the Humidity and Temperature Responses of a

... characterised by high accuracy in the order of a fraction of a percent. However, such devices need a power source; they are relatively complex, expensive and bulky devices which include electronic components. Holographic sensors can find application where cheap, disposable relative humidity indicato ...
PCT form - 1 - DESCRIPTION OPTICAL MEASURING DEVICE AND
PCT form - 1 - DESCRIPTION OPTICAL MEASURING DEVICE AND

... which a particle group to be measured is dispersed; electrodes and a power supply used to apply an electric field having a space period to the sample in the sample storing unit; a light source irradiating light onto the sample in the sample storing unit; a detection optical ...
1 simultaneous polarization squeezing of all three stokes
1 simultaneous polarization squeezing of all three stokes

... relation but the individual fluctuations can be reduced and this gives the well known concept of squeezing. In classical optics the polarization state of light beam can be visualized as direction of a Stokes vector in Poincare sphere and is determined by the four Stokes parameters [1,2] S0 , S1 , S ...
Manuscript2 - Open Research Exeter
Manuscript2 - Open Research Exeter

... (<1000X limit) [7–9]. The cassegrain however typically has a lower acceptance angle due to the 2 reflective stages in comparison to the 1 refraction stage of the Fresnel lens [7,8]. There has been much research into the cassegrain type concentrator [10–18] for its greater compactness [16,19] and hig ...
Simultaneous calibration of optical tweezers spring constant and
Simultaneous calibration of optical tweezers spring constant and

... may be considerable variability in the axial position of the particle with respect to the tweezers center which affects the lateral calibration coefficients and which can only be minimized by sufficient averaging. This situation was remedied by Vermeulen et al. [8] who acquired the detector response ...
Optical tweezers using a diode laser
Optical tweezers using a diode laser

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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