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3D–2D–3D photonic crystal heterostructures fabricated by direct
3D–2D–3D photonic crystal heterostructures fabricated by direct

... structure. Such samples can obviously no longer be easily characterized by electron microscopy, but they can be characterized by optical spectroscopy. It is clear that for incidence of light normal to the 2D plane, the structure is just a Fabry–Perot cavity. The corresponding spectra can then be dir ...
of optical-fiber dispersion
of optical-fiber dispersion

... Fig. 4, which illustrates the calculated reflection response and dispersion-delay response of a linearly chirped Bragg grating that has been apodized. In this case, AO= 1550 nm, L = 3.0 cm, KL = 7.0, reflectivity at AO= 99.6%, and the chirp is 0.015%. The application of chirped Bragg gratings to dis ...
Semiconductor Laser Diodes
Semiconductor Laser Diodes

... Key Points to Remember • Semiconductor laser diodes are cheap and easy to use compared to other types of lasers. • They can be used for many applications, and have the ability to be produced in a wide range of wavelengths and powers. • The most important electronic consideration is the fact that a ...
Noncollinear parametric amplification in the near
Noncollinear parametric amplification in the near

Optical Springs at the 40m
Optical Springs at the 40m

... compensating for this by adjusting the demod phase, the shape of the response changes. May also be some overall gain change due to imperfect normalization Optical Springs at the 40m ...
PDF
PDF

... with respect to the beam axis and the l-value represents the OAM state, which is usually but not necessarily an integer [1,2]. Light-carrying OAM has found many applications, such as in optical communications where the spatially orthogonal OAM states are utilized to provide another multiplexing dime ...
Disorder-Enhanced Imaging with Spatially Controlled Light
Disorder-Enhanced Imaging with Spatially Controlled Light

... metrology for disordered materials that opens the way for high speed nanometerscale position detection. With scattering lenses made out of gallium phosphide it is possible to achieve sub-100 nm optical resolution at visible wavelengths using the high refractive index of the material; High Index Reso ...
Optical contrast and clarity of graphene on an
Optical contrast and clarity of graphene on an

... original reflection coefficient r, which becomes r⬘ after depositing the film. We find that r⬘ is determined solely by r and by the optical properties of the film. The details of the substrate structure are not required to derive r⬘. This finding allows us to identify the value r of the substrate th ...
Optical Reconstruction of Holographic Images
Optical Reconstruction of Holographic Images

... object-wave term R O  RC O will produce an image at the original z-distance away from the hologram. Equivalently, we can simulate the propagation of a wave field equal to H digitally. Of course, R is never exactly a uniform plane wave, so distortion and noise are thereby introduced. The other terms ...
Pulse Delay Chromatic Dispersion Measurements in Single Mode
Pulse Delay Chromatic Dispersion Measurements in Single Mode

... where it is used in laparoscopic surgery and also in laser surgery. Other uses such as the transmitting of high power laser beams and fibre optic sensors also rely on optical fibre. However nonlinear effects, attenuation of the optical signal, polarization mode dispersion and chromatic dispersion ca ...
Optical Components and Devices for Next-Generation
Optical Components and Devices for Next-Generation

... sensitivity of the modulation bandwidth was reduced. Figure 12 (c) shows the 10.31 Gb/s eye diagram at 25 and 90°C. For both temperatures, the bias current was 30 mA and the modulation current was 35 mApp. The dynamic extinction ratios were 6.8 and 7.3 dB at 25 and 90°C, respectively. Thanks to the ...
A Michelson interferometric technique for measuring refractive index
A Michelson interferometric technique for measuring refractive index

... resultant electric field at any point in that region is the vector sum of the electric field of each wave. This is the principle of superposition. (it is assumed that all waves have the same polarization). If two beams emanate from a common source, but travel over two different paths to a detector, ...
Three-Dimensional Mapping of Near-Field Interactions via Single-Photon Tomography Benjamin D. Mangum,
Three-Dimensional Mapping of Near-Field Interactions via Single-Photon Tomography Benjamin D. Mangum,

... through a high numerical aperture objective (NA ) 1.4), and fluorescence signals are collected through the same objective and detected by an APD (Perkin-Elmer). The laser focus is aligned onto an AFM probe; when the excitation polarization is longitudinal, an enhancement in the optical intensity is ...
Mach Zehnder Interferometer and its Applications
Mach Zehnder Interferometer and its Applications

... length in both sensing and reference arms but has different optical path lengths because of modal dispersion as the beam passing through cladding experiences refractive index which is different from that of the core. Another way of making an in-line MZI is splicing two fibers with a minute lateral o ...
A method for controlling the bandwidth of high-energy, few
A method for controlling the bandwidth of high-energy, few

... and different thicknesses (1–3 mm). Nonetheless, the authors of Ref. [27] have claimed that the output pulse energy is still limited to the microjoule regime. In this work, we suggest a new direct method for generating tuneable-bandwidth (from the VIS to the near-IR) laser pulses of which energies r ...
Photonic crystal cavities in silicon dioxide
Photonic crystal cavities in silicon dioxide

... method enables high reflectivity mirrors even in silica, as QPC continuously increases with the addition of more PC mirror layers. In the case of a 1D nanobeam, Q is limited by loss in the directions where the mode is confined by total internal reflection, namely Q⬜ and Q储. As seen in Fig. 2共a兲, the ...
Full-Text PDF
Full-Text PDF

... The  XRD  patterns  for  as‐deposited  HfO2,  mixed  HfO2‐TiO2  and  TiO2  thin  films  are  shown  in  Figure 2. The hafnium dioxide, due to strong and wide diffraction lines, exhibited the nanocrystalline  The XRD patterns for as-deposited HfO2 , mixed HfO2 -TiO2 and TiO2 thin films are shown in s ...
IOSR Journal of Applied Physics (IOSR-JAP)
IOSR Journal of Applied Physics (IOSR-JAP)

... Synthesis, Characterization and Optical properties of PANI/ PVA Blends. 3.3 Optical properties 3.3.1 Absorption, transmission and reflection spectra of pure PVA and PANI / PVA blend films. The UV-VIS absorbance spectra in the region 200-1100 nm for PVA and PANI/ PVA blend are shown in fig. (3-a). T ...
Non-reciprocal ultrafast laser writing
Non-reciprocal ultrafast laser writing

... produced in opposite directions, in other words with the writing direction along the 2y and þy axes of LiNbO3 , respectively (Fig. 1). We observed different material modifications depending on the pulse energy and the writing direction. With pulses energies below 1.4 mJ, a positive phase change (Dw) ...
THz Materials
THz Materials

... PE is a light elastic crystallizing material. It can be heated up to 110° C and cooled down to -45 ÷ -120° C depending on grade. PE has good dielectric characteristics, chemical resistance, and radioresistance. However it is unstable to UV-radiation, fats, and oils. PE is biologically inert and easy ...
Characteristic properties of Mueller matrices. JJ Gil
Characteristic properties of Mueller matrices. JJ Gil

... regard to all possible incident polarization states2. Other conditions have been derived from the physical premise of the degree of polarization of outgoing light being less than or equal to unity (i. e. the Mueller matrix not “overpolarizing”)3. These and other relevant results have been obtained f ...
Active semiconductor-based grating waveguide structures
Active semiconductor-based grating waveguide structures

... Berlin GmbH, Einsteinufer 37, 10587 Berlin, Germany. Publisher Item Identifier S 0018-9197(01)05940-1. ...
Stabler, Graham (2005) High resolution wide field surface plasmon
Stabler, Graham (2005) High resolution wide field surface plasmon

S.72-227 Digital Communication Systems
S.72-227 Digital Communication Systems

... – no waveguiding – light coupling to multimode fibers easy Edge emitting LEDs: (ELED)   60  80 nm – like stripe geometry lasers but no optical feedback – easy coupling into multimode and single mode fibers Superluminescent LEDs: (SLD)   30  40 nm – spectra formed partially by stimulated emis ...
optical design of an echelle grating based atomic emission
optical design of an echelle grating based atomic emission

... photo-multiplier detectors (PMT) is used for simultaneous multi-element analysis[1-2]. This type of instrument has several drawbacks such as the number of spectral lines recorded are limited due to physical limitations in mounting many exit slits. The instrument also lacks the flexibility of changin ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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