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Sample pages 1 PDF
Sample pages 1 PDF

... radiation. This has the effect of removing the excess energy in the structure of the material as heat. There are some commercial fluorescent screens on the market which will fluoresce in ultraviolet light from a lamp; the glowing screen can be used to image an infrared laser beam falling on it. On the ...
Download PDF
Download PDF

Wavefront Technology
Wavefront Technology

... used in ocular aberrometers is to measure the deviation of individual rays of light passing through various locations in the pupil of the eye. This is done by measuring reflected light from the retinal spot created by the central reference beam. This spot serves as a point source that radiates light ...
NONLINEAR OPTICS BASICS Units and Nomenclature
NONLINEAR OPTICS BASICS Units and Nomenclature

Modes Effective Refractive Index Difference Measurement
Modes Effective Refractive Index Difference Measurement

... refractive indices across the wavelengths. The interferometer configuration was used to measure the index difference in few-mode optical fibers by some researchers [2][3]. The mode interference in the interferometer configuration caused the intensity change across the wavelengths. Based on the techn ...
S.72-227 Digital Communication Systems
S.72-227 Digital Communication Systems

... One should also estimate required margins with respect of temperature, aging and stability For rise-time budget one should take into account all the rise times in the link (tx, fiber, rx) If the link does not fit into specifications – more repeaters – change components – change specifications Often ...
Measurement of seawater refractive index and salinity by means of
Measurement of seawater refractive index and salinity by means of

... The aim of this work has been to construct and test a compact refractometer for accurate measurement of seawater refractive index and salinity. The specific goal was to measure the refractive index of the water sample with an accuracy of 10−6 refractive index units (RIU). The size goal was set to be ...
TEM - Department of Mechanical Engineering
TEM - Department of Mechanical Engineering

... into the vacuum with minimal increase in pressure in other areas of the microscope. The specimen holders are adapted to hold a standard size of grid upon which the sample is placed or a standard size of self-supporting specimen. Standard TEM grid sizes is a 3.05 mm diameter ring, with a thickness an ...
A NOVEL SENSOR FOR MONITORING SETTLEMENT Pingyu Zhu Hongyang Zeng
A NOVEL SENSOR FOR MONITORING SETTLEMENT Pingyu Zhu Hongyang Zeng

TIE-29 Refractive Index and Dispersion
TIE-29 Refractive Index and Dispersion

... in which refractive indices are listed in the data sheet of each glass. Interpolation is possible within these limits. The wavelengths used in the equation have to be inserted in µm with the same number of digits as listed in Table 1. For prac​tical purposes Equation (10) applies to refractive indic ...
Damping rates of the atomic velocity in Sisyphus cooling
Damping rates of the atomic velocity in Sisyphus cooling

... The last decades have witnessed an impressive progress in laser cooling techniques, and nowdays it is possible to prepare and manipulate very cold and dense atomic samples [1,2]. Sisyphus cooling [3] represents a milestone in the history of laser cooling, particularly because this new cooling proces ...
Backward Monte Carlo Calculations of the
Backward Monte Carlo Calculations of the

... gives an estimate of the Stokes vector for the scattered radiation at the receiver in the discrete direction 0,4 for photons that have undergone exactly n collisions. The method described above for evaluating Eq. (6) is denoted as the backward Monte Carlo method since the sampling of the photon traj ...
Chemically etched fiber tips for near-field optical microscopy:
Chemically etched fiber tips for near-field optical microscopy:

TIE-29 Refractive Index and Dispersion
TIE-29 Refractive Index and Dispersion

... in which refractive indices are listed in the data sheet of each glass. Interpolation is possible within these limits. The wavelengths used in the equation have to be inserted in µm with the same number of digits as listed in Table 1. For prac​tical purposes Equation (10) applies to refractive indic ...
Experimental realization of three-dimensional indefinite cavities at the nanoscale with
Experimental realization of three-dimensional indefinite cavities at the nanoscale with

Nonlinear Optics Third Edition
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... within a conventional one-semester course. For this reason, I am often asked for advice on how to structure a course based on the content of my textbook. Some of my thoughts along these lines are as follows: (1) I have endeavored as much as possible to make each part of the book self-contained. Thus ...
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... nanoantenna interaction, the signals obtained using our plasmonic nanopore are also almost 2 orders of magnitude higher compared to the signals obtained using a nanopore without plasmonic nanoantenna, making our method particularly suitable for profiling of low-intensity light beams. Future work may ...
Ab initio calculations of optical properties of silver clusters: Cross
Ab initio calculations of optical properties of silver clusters: Cross

... gations are often limited to few atoms clusters. These involve tight-binding calculations [20, 21, 22], and the timeThe readiness with which noble metal nanoparticles create dependent density functional theory (TDDFT) approach [22]. and support surface plasmons makes them useful in a wide A promisin ...
Pluggable Optical Interfaces and Their Compatibility with Xilinx FPGAs
Pluggable Optical Interfaces and Their Compatibility with Xilinx FPGAs

... The differences between multi-mode fiber and single-mode fiber are important. Single-mode fiber consists of a single strand of fiber that the data is transmitted across. Multi-mode fiber is composed of multiple strands of fiber bundled together, where light can pass across each strand. In either cas ...
Photoinduced Deformation of Crosslinked LiquidCrystalline Polymer
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... a thermal phase transition of the CLCP from LC to isotropy with a thermal contraction. However, both sensitivity and stability are very low for such an indirect photoactuation. In addition, it remains difficult to control and improve the orientation of mesogens in the CLCP due to the random dispersi ...
Silica-Based Highly Nonlinear Fibers and Their Applications
Silica-Based Highly Nonlinear Fibers and Their Applications

... maximized when the phase matching condition is satisfied among the probe, pump, and idler lights, because the idler light is always added with the same phase. If the pump wavelength is identical to the zero dispersion wavelength of the HNLF, the phase matching condition satisfies over a wide range o ...
Optical coherence tomography (OCT): a review
Optical coherence tomography (OCT): a review

... unrealistic assumption. However, models based on a modified version of this assumption provide a satisfactory description of OCT imaging in the eye and other transparent tissues composed of weakly reflecting layers that are flat over the cross section of the sample beam [22]–[25]. In this special ca ...
Order Parameters P2  , P4  , and P6   of Aligned Nematic Liquid
Order Parameters P2 , P4 , and P6 of Aligned Nematic Liquid

... probe in aligned liquid-crystalline polymer have been measured by the suggested procedure. It was shown that the procedure gives more reliable and complete characteristics of molecular order than does polarized UV−visible spectroscopy. ...
Understanding Microscopy And Filtering Techniques
Understanding Microscopy And Filtering Techniques

... Magnification, numerical aperture, working distance, and resolution are all related for infinity-corrected objectives. Magnification is calculated by dividing the focal length of the tube lens by the focal length of the objective. Numerical aperture (NA) is a function of the focal length of the entr ...
Normal-Incidence Photoemission Electron Microscopy (NI
Normal-Incidence Photoemission Electron Microscopy (NI

... of the SPP and the laser can then be discussed as three principal cases. For the case of positions like the one marked by “A” in Fig. 4, the fields of the laser pulse and the SPP are always of the same phase, which will result in constructive interference. One will find the largest electron yield at ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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