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Paper Title (use style: paper title)
Paper Title (use style: paper title)

... Under Duo-Binary modulation scheme B bits are transmitted per second using bandwidth for less than B/2 Hz. However inter symbol interface is present in duo-binary pulses [10]. In this format, the successive bits have opposite polarities. The level transition occurs only when the in between bits at c ...
Doppler-Free Spectroscopy MIT Department of Physics
Doppler-Free Spectroscopy MIT Department of Physics

... a tunable monochromatic source (such as certain lasers), a spectrum can be measured ’one wavelength at a time’ by measuring light intensity (fluorescence or transmission) as a function of the wavelength of the tunable source. In either case, physically important structures in such spectra are often ...
Optical switches
Optical switches

... • Chromatic dispersion (cont.) • dispersion is measured in ps/(nm*km), i.e. delay per wavelength variation and fiber length • Dispersion depends on the wavelength • at some wavelength dispersion may be zero • in conventional single mode fiber this typically occurs at 1.3 µm - below, dispersion is ne ...
Class 3b Laser Safety
Class 3b Laser Safety

... Class 4 Lasers 1. Enclose the entire laser beam path if at all possible. If this is done, the laser device could be considered to be a less hazardous classification. 2. Confine indoor laser operation to a light-tight room with interlocked entrances to assure that the laser cannot emit when a door i ...
Preview of “ZEISS Microscopy Online ...Aperture and Resolution”
Preview of “ZEISS Microscopy Online ...Aperture and Resolution”

... aperture  obtainable  with  a  standard  microscope  objective  would  theoretically  be  180  degrees, resulting  in  a  value  of  90  degrees  for  the  half-­angle  used  in  the  numerical  aperture  equation.  The sine  of  90  degrees  is  equal  to  one,  which  suggests  that  numerical  ap ...
Polarization of Light - University of Hawaii
Polarization of Light - University of Hawaii

... Stokes vectors and Mueller matrices cannot describe interference effects. If the phase information is important (radioastronomy, masers...), one has to use the Jones formalism, with complex vectors and Jones matrices: • Jones vectors to describe the • Jones matrices to represent polarization of ligh ...
Automotive Optical Solutions for the Automotive
Automotive Optical Solutions for the Automotive

... generation of near infrared-based active night vision systems, lane departure assistance, adaptive cruise control and head-up displays. Key components of near infrared-based night vision systems are based on precision technology from Optics Balzers. The active night vision system illuminates the roa ...
4Pi Microscopy
4Pi Microscopy

... properties of the dye to break the diffraction barrier. Using two lenses for STED, the axial resolution was improved down to 30 to 50 nm (Dyba and Hell, 2002; Dyba et al., 2003). However, as STED is still in its infancy and, unlike I5M and 4Pi microscopy, relies on the specific properties of the dye ...
Atomic Spectroscopy
Atomic Spectroscopy

... As you will recall from earlier in this discussion, absorption lines used in atomic absorption analysis are due to transitions from the ground state to a higher energy level. Atoms in the excited state are generally unstable and will rapidly revert to the ground state, losing the acquired energy in ...
MICROWAVE MANIPULATION OF COLD ATOMS
MICROWAVE MANIPULATION OF COLD ATOMS

ComplexLightBookChapterEG
ComplexLightBookChapterEG

... to beams of light where one or more parameters are changed within the beam of light. In particular, spatial modes have received much attention, generated either directly from lasers or by manipulation of the wavefront via diffractive optical elements. These studies have led us to Laguerre-Gauss beam ...
PDF
PDF

Silicon-on-Insulator Grating Duplexer for Fiber-to-the
Silicon-on-Insulator Grating Duplexer for Fiber-to-the

... mode. This overlap integral is evaluated for both wavelength channels, while varying the fiber centerline position, leading to the average fiber coupling efficiency as a function of fiber position and grating length, as plotted in figure 3. From this simulation we can conclude that there exists an o ...
chapter 6
chapter 6

... convergent lens. (A) - the object is between the lens and its front focal point, (B) - the object is far away in front of the front focal point. Consider the point A of a given object emitting light rays which refract through a lens to gather at the point A', called an image of the point A. Fig. 6.2 ...
Analysis of optical interferometric displacement detection in nanoelectromechanical systems
Analysis of optical interferometric displacement detection in nanoelectromechanical systems

Collective effects in the radiation pressure force
Collective effects in the radiation pressure force

... of view, and as far as diffraction effects are concerned, the atomic cloud can be described as a dielectric medium with an effective complex refractive index, even when the atoms are separated by more than a wavelength. The real part of the index corresponds to the coherent scattering of the inciden ...


Photoinduced handedness switching in terahertz chiral metamolecules ARTICLE
Photoinduced handedness switching in terahertz chiral metamolecules ARTICLE

Coating Materials - Umicore Thin Film Products
Coating Materials - Umicore Thin Film Products

... the stability of the tablet. Extreme differences in temperature within a tablet during electron beam evaporation lead to significant heat stress. In such cases cracks in the tablet can not be completely avoided, and disintegration can only be prevented by keeping the porosity of the tablet sufficien ...
5. INTERFERENCE. Introduction.
5. INTERFERENCE. Introduction.

... waves from different sources or more frequently different parts of the same source, and the need is to find the resultant field in a particular region of space by invoking the superposition of fields. In that superposition it is essential to take account of the vector nature of the field by formally ...
Generalized shifts and weak values for polarization components of
Generalized shifts and weak values for polarization components of

... internal reflection (where θ is greater than the critical angle arcsin n), in which case the reflection coefficient is complex and unimodular, |r| = 1. In the other case, partial reflection (which also has some transmission, which not considered here), sin θ < n, so r is real. Although the formulæar ...
Metamaterials: a new frontier of science and technology Chem. Soc. Rev 40
Metamaterials: a new frontier of science and technology Chem. Soc. Rev 40

Paper - University of Queensland
Paper - University of Queensland

... the Rayleigh model of the sky. In the Rayleigh model, light scattered from a particle in a direction orthogonal to the axis of propagation becomes linearly polarized. This ballistic scattering from the many particles in the atmosphere creates a polarization pattern in both DoLP and AoP across the sk ...
V. experimental setup of all-optical tunable delay
V. experimental setup of all-optical tunable delay

... property. Our delay technique has the combined advantages of continuous control of a wide range of delays picoseconds to nanoseconds and an output signal wavelength and bandwidth that are the as that of the input. The bit error rate performance of the delay element was characterized for a 10-Gb/s re ...
Full text in DIVA
Full text in DIVA

... on nonlinear absorption followed by fluorescence emission, i.e., the emitted photons are normally not coherent with the absorbed ones. However, when combined, the two measurement modes provide an important tool for imaging tissue intravitally in vivo or in sections.1,7,15,16 In the present work, a m ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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