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IOSR Journal of Applied Physics (IOSR-JAP) e-ISSN: 2278-4861.
IOSR Journal of Applied Physics (IOSR-JAP) e-ISSN: 2278-4861.

... Pockels[8] effect and has a very weak Franz-Keldysh effect, Kerr effect [9,10] at optical communication wavelengths of 1.3 μm and 1.6 μm. Silicon also has high thermal coefficient (~2E-4)[11] which is not suitable for high speed operation of modulators. Recently, it has been shown that strained sili ...
Paper
Paper

... mitigated by producing mF 苷 0 atoms, quadratic Zeeman shifts may preclude precision experiments on such pulses. Magnetic trapping also imposes limitations on the study of Bose-Einstein condensates, because only the weak-field seeking atomic states are confined. Since the atomic ground state is alway ...
h and j aggregates - DST Unit of Nanoscience
h and j aggregates - DST Unit of Nanoscience

... yield  and  hence  there  structure  can  be  studied  using  Fluorescence  microscopy.  But  this  is  not  the  case  with  H  aggregates  since  they  have  low  quantum  yield.  There  is  one  more  technique  which  can  prove  to  be  useful  which  is  known  as  “Polarized  light  microscop ...
Abstract
Abstract

... between these materials correlates to an index difference of nearly Δn ≈ 2. This property allows for very small devices and tight bends in waveguides. The basic silicon waveguide is a rib waveguide where a silicon rib is raised above a silicon base resting on an insulating layer; these waveguides ar ...
Chapter 2 Introduction to Waveguide and Bragg Grating Theory 2.1
Chapter 2 Introduction to Waveguide and Bragg Grating Theory 2.1

... In general the properties of channel waveguides cannot be analytically evaluated without turning to numerical methods or making simplifying assumptions. Various methods of differing complexity and flexibility are possible but owing to its straightforward application the method selected to model simp ...
Subnanometer-accuracy optical distance ruler based on fluorescence quenching by transparent conductors R
Subnanometer-accuracy optical distance ruler based on fluorescence quenching by transparent conductors R

... inhomogeneous and reference environments, respectively. Furthermore, the decay rates in the reference and inhomogeneous environments are given by γ 0  1∕τ0 and γ  1∕τ, respectively. Then, in order to calculate the relative lifetime for a dipolar emitter near a planar interface [see the inset in Fi ...
Full-Text PDF
Full-Text PDF

... and in turn taking advantages of tunable optics to control or sense the fluid sample. The concept and implementation of using fluid to fabricate optical components and realize optical functions is not new. Stemming from the early 1900s, a deformable mirror was proposed and demonstrated by spinning f ...
DISPERSIVE BIREFRINGENT FILTERS Pochi YEH 1. Introduction
DISPERSIVE BIREFRINGENT FILTERS Pochi YEH 1. Introduction

... These include cadmium sulfide (5 150-5400 A) [8], magnesium fluoride (1150-l 500 A) [9] and sapphire (1430 - 1530 A) [9]. In fact, there is even a change of sign of the birefringence (zero-crossing) after passing through zero, in the case of magnesium fluoride and cadmium sulfide. The operation of b ...
Lenserf Reflection, Fresnel Reflection,
Lenserf Reflection, Fresnel Reflection,

... incident from a higher-index medium onto a planar interface looking into an unbounded, lower-index reflecting medium, with both media assumed to be lossless. We take as our physical model a horizontal interface between two unbounded or infinite half spaces, as shown in the figure on the right, with th ...
Components of Optical Networks
Components of Optical Networks

... ! Raman amplifiers (using the Raman scattering non-linear effect. Needs laser pump source but it can be used al all bands). ! Semiconductor optical amplifiers (earlier technology, using p-n junctions of semiconductors to amplify light. No pump source is needed). ...
IOSR Journal of Dental and Medical Sciences (IOSR-JDMS)
IOSR Journal of Dental and Medical Sciences (IOSR-JDMS)

... Zinc oxide (ZnO) is a semiconductor compound of the II-VI family, with wide and direct band gap of (3.37 eV) and large exiton binding energy (60 meV) at room temperature in the ultraviolet (UV) range[1]. ZnO has a great potential for applications in short wavelength optoelectronics, laser, detectors ...
GPS General Particle Source
GPS General Particle Source

... Elastic scattering including polarization of initial and final photons – The scattered photon direction is perpendicular to the new photon polarization in such a way that the final direction, initial and final polarization are all in one plane ...
A Brief History of the Microscope and its Significance
A Brief History of the Microscope and its Significance

... confocal microscope used in the ophthalmology clinic uses halogen lamps as a spatially incoherent light source. With spatially incoherent illumination, the phase relations between fields at nearby points are statistically random. Spatially coherent light sources have the important property that the ...
Effect of spatial distribution of partial information on the accurate
Effect of spatial distribution of partial information on the accurate

... For larger values of a, the broader response means that the input impulse will have an effect on a greater number of output points. Likewise, if we consider a given point at the output side, the larger the broadening, the value of light at that point will be affected by a greater number of input poi ...
Applications of Geometric Phase in Optics
Applications of Geometric Phase in Optics

... Geometric-phase-shifting can be used to measure the drift of an input signal. The interference of the signal and a phase-shifted reference beam from a local oscillator can be adjusted for maximum sensitivity by rotating the retarder using the error output signal of a detector that measures the inter ...
Observation of light below Cerenkov threshold in a 1.5 meter long
Observation of light below Cerenkov threshold in a 1.5 meter long

... where f is the focal length of mirror 1. The 1 mr annular iris blocked all light except rays for Cerenkov angles between 0.7mr and 1.0mr, (corresponding to @2) = 0.774 x 1 0 - 6). The shutter between mirrors 2 and 3 could be closed remotely. The closed shutter measurements 'were used to determine th ...
Document
Document

... On the right the 2nd harmonic is collected, the background is suppressed and the near field signal is restricted to a 20nm distance from the surface. ...
7_SNOM
7_SNOM

... On the right the 2nd harmonic is collected, the background is suppressed and the near field signal is restricted to a 20nm distance from the surface. ...
Plasmonic Nearfield Scanning Probe with High Transmission
Plasmonic Nearfield Scanning Probe with High Transmission

... provides smaller focus size, however, with reduced local intensity due to higher metal loss during the propagation. If the intensity is a more important concern, a longer wavelength should be used because the long SPP propagation length can support a larger plasmonic lens that focuses more energy to ...
2-2-1 Pulsed Laser Deposition of Thin Films
2-2-1 Pulsed Laser Deposition of Thin Films

... chemical vapor deposition, sol- gel method, and pulsed laser deposition. In this study pulsed laser deposition technique was used. One of the most important and enabling characteristics in PLD is the ability to realize stoichiometric transfer of ablated material from multication targets for many mat ...
Subcarrier multiplexing for high-speed optical transmission
Subcarrier multiplexing for high-speed optical transmission

... increase fiber transmission capacity. More sophisticated modulation formats may help to increase the bandwidth efficiency compared to the basic ON–OFF keying modulation. Optical subcarrier multiplexing (SCM) is a scheme where multiple signals are multiplexed in the radiofrequency (RF) domain and tra ...
Liquid Fundamental Measurements  on  an Aggregated  Dye Crystal
Liquid Fundamental Measurements on an Aggregated Dye Crystal

... phase only while in solution. However, they differ from other lyotropic liquid crystals in a number of ways. Chromonic molecules have a different shape than the typical lyotropic molecule shown in Fig. 1.3, tending to be plank-like or disk-like. Chromonic molecules generally are rigid, without a fle ...
Introduction to optical fibers
Introduction to optical fibers

... intermodal dispersion. Indeed, although different rays travel along different paths, they reach the detector approximately at the same time. This is possible since the rays propagating along the core axis in the core center (basic mode) have the shortest distance to travel, but their phase velocity ...
the Quantifying Scatter PDF
the Quantifying Scatter PDF

... Scatter signals can be easily quantified as scattered light power per unit solid angle (in watts per steradian); however, in order to make the results more meaningful, these signals are usually normalized, in some fashion, by the light incident on the scatter source. The three ways commonly employed ...
Rayleigh scattering. Scattering and absorption by aerosols and
Rayleigh scattering. Scattering and absorption by aerosols and

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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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