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Graded Index Fiber
Graded Index Fiber

... fiber axis when they travel through the fiber and they would not cross the fiber axis at any time. ...
Transformational Plasmon Optics Yongmin Liu, Thomas Zentgraf, Guy Bartal,
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... striking contrast, the scattering loss of the SPPs is below 4.5% over the entire wavelength region once the transformed dielectric cladding is applied, confirming the broad band functionality of the design (Figure 1f). The shown concept of transforming the surrounding dielectric to generate a virtua ...
Doppler-Free Saturated Absorption Spectroscopy of Rubidium Using a Tunable Diode Laser
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... a particular set of spectral lines. The mirrors in the saturated absorption spectroscopy setup were slightly adjusted to maximize the absorption peaks. The gain in the photodiode circuit was adjusted manually to adjust the DC offset of the signal. To further help with the offset, the vertical tilt o ...
Transformational Plasmon Optics Yongmin Liu, Thomas Zentgraf, Guy Bartal,
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... striking contrast, the scattering loss of the SPPs is below 4.5% over the entire wavelength region once the transformed dielectric cladding is applied, confirming the broad band functionality of the design (Figure 1f). The shown concept of transforming the surrounding dielectric to generate a virtua ...
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... 2. Theoretical background SHG is nowadays a very useful technique to access new wavelength ranges with the available laser sources. An efficient SHG process can be achieved only in media having a large value of the second-order susceptibility and, moreover, certain conditions over the wave vectors o ...
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... Optical fibers are becoming dominant transmission media in long distance transmission, optical fiber transmission is used from a short distance below 1ft up to transoceanic distances in undersea cable. In fact all currently future plans in transoceanic cables are fiber optic based. Advantages of fib ...
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... the sample plane. This focused light will be used for fluorescence excitation. For this alignment procedure, you will place a collimated light source and two mirrors behind the microscope, directing the light toward the microscope objective. You will coarsely align these three optical elements so th ...
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... thermal properties of the inorganic salt. Nonlinear optical (NLO) materials are used in optical computing, optical communication, harmonic generators, medical diagnostics, frequency mixing and optical switching (Prasad and Williams 1991, Iwai et al 1997, Lin et al 1999). The potential development of ...
Optical pumping of a lithium atomic beam for atom interferometry
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... a quantization axis. Usually, one takes the z-axis as the quantization axis, chosen parallel to the magnetic field B. However, as we will refer to previous works on our atom interferometer [31] in which the z-axis is always along the atomic beam propagation, we keep our choice of axis (see fig. 4) t ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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