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5 The Basics of Confocal Microscopy
5 The Basics of Confocal Microscopy

... are its high efficiency, its lack of moving parts and its flexibility in terms of using new laser lines simply by changing the software. While proper operation of the AOBS depends on the light input being parallel as it passes through the crystal light originating above or below the plane of the foc ...
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Light propagates in the form of waves

... Thus, the electromagnetic theory of light encompasses wave optics, which in turn, encompasses ray optics. Ray optics and wave optics provide approximate models of light which derive their validity from their successes in producing results that approximate those based on rigorous electromagnetic theo ...
here - Optoelectronics Research Centre
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Holography
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... No interference occurs if the directions of polarization are perpendicular to each other; the visibility is 0. For optimal visibility object and reference wave have to polarized parallel each other. Even by using linearly polarized light radiation this cannot always be achieved in practice since lig ...
Electronic Transport in Tin(IV) Oxide Nanocrystalline Films: Two
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... of their prominent gas sensing and catalytic properties.1,2 The charge transport in nanocrystalline TO structures is complex and is different from bulk charge transport in several aspects. In bulk semiconducting TO films, conduction originates from n-type carriers, which have been proposed to be due t ...
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... Broadband Multilayer AR Coatings (WAR) Dual Wavelength Band AR Coatings (DAR) Partial Reflective Coatings Single Wavelength Band PR Coatings (SPR) Broadband PR Coatings (BPR) Beamsplitter Coatings Laser Line Polarization Beamsplitter Coatings (LPS) Broadband Polarization Beamsplitter Coatings (BPS) ...
Physical properties of silver oxide thin films by pulsed laser deposition
Physical properties of silver oxide thin films by pulsed laser deposition

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Optical device having equal length waveguide paths

... in the medium and m is an integer order number, then the phase front of the light in coupler 12 forms a circular Wave converging on the coupler axis at P0. At a different Wave ...
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DESIGN AND CONSTRUCTION OF AN INTERFEROMETER SYSTEM FOR THE STUDY OF

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Microscopes - Biozentrum

... source, using an opal bulb, or placing an opal glass diffuser in front of the light source. However, all these techniques, although effective in reducing the filament image to a certain degree, had the effect of reducing the quality and uniformity of light reaching the sample. Reducing the power of ...
Power efficiency of a semiconductor laser with an external cavity
Power efficiency of a semiconductor laser with an external cavity

... measured on two 800-nm laser diodes (SDL 4510, Bonneville BW800-1-M); in the experiments, a 1200-lines/mm grating was used (total attenuation R3 ˆ 0:04, inclusive of the output tap), and the lasers were temperature stabilized with a standard Peltier controller. The cavity length (L  20 cm) was accu ...
OM1 - Faculty of Engineering
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Physics 136-3: General Physics Lab Laboratory Manual

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Long period grating based biosensor for the detection of Escherichia
Long period grating based biosensor for the detection of Escherichia

... the back scattering electron (BSE) mode of the SEM. The highenergy electrons originating in the incident electron beam back scatter form of the E. coli volume due to the elastic scattering interactions with the E. coli bacterium atoms, which are in turn recorded using an asymmetrical, directional BS ...
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Acousto-Optic Devices and Applications
Acousto-Optic Devices and Applications

... dispersion relation forms the basis of the AO spectrum analyzer, an important signal processing application to be discussed later. Referring to Fig. 1a , a change of incidence angle d θ i will introduce a change of acoustic frequency (or optical wavelength) for exact phase matching. Thus, this phase ...
engineering of complex optical fields and its
engineering of complex optical fields and its

Phononic Crystal Waveguiding in GaAs Golnaz Azodi Aval
Phononic Crystal Waveguiding in GaAs Golnaz Azodi Aval

13 - Atomic Physics
13 - Atomic Physics

... probed with x-rays. The experimental setup is described in detail in reference [1]. The main application is to make the pump laser beam visible to the X-ray detection system. The x-rays are detected by an ultrafast streak camera. When averaging the images from a number of shots, the synchronization ...
863875
863875

... and large area fabrication flexibility in a single step [20–25]. It has also been shown that optical field patterns belonging to all 14 Bravais crystallographic lattice 3D structures can be formed by designed plane wave interference [26, 27]. By means of a spatial light modulator (SLM-) assisted app ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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