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Absorption Measurements in Microfluidic Devices using Ring-down Spectroscopy
Absorption Measurements in Microfluidic Devices using Ring-down Spectroscopy

... then fed into a fast lock-in amplifier (Stanford Research Systems, SR 844) and referenced to the driving current of the laser diode. To reduce radio frequency interference, all the cables are shielded. The laser dye ADS805(American Dye Source) was used without further purification and had an absorp ...
Recent advances in transformation optics
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... chemical constituents, but rather on the internal, specific structures of the building blocks of metamaterials. These building blocks function as artificial ‘‘atoms’’ and ‘‘molecules’’, in analogy to those in natural materials. Through regulated interactions with electromagnetic waves, they can prod ...
Recent advances in transformation optics
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... chemical constituents, but rather on the internal, specific structures of the building blocks of metamaterials. These building blocks function as artificial ‘‘atoms’’ and ‘‘molecules’’, in analogy to those in natural materials. Through regulated interactions with electromagnetic waves, they can prod ...
Principles of Interference
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... phenomena and the notion of coherence is defined by the correlation properties between the various quantities of an optical field. The optical coherence is related to the various forms of the correlations of the random processes (Born and Wolf 1984; Mandel and Wolf and Wolf 1995). The interference p ...
OPTIMIZATION OF THE FIBER-OPITC FABRY-PEROT INTERFEROMETER CONSTRUCTION Małgorzata Jędrzejewska-Szczerska,
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Refractive-Index-Matched Indium--Tin
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... To verify the simulation experimentally, ITO film with nITO ¼ 1:5 is necessary. Even though the refractive index is one of the unchangeable material characteristic properties, a recently developed nano-structured deposition technique showed that the refractive index can be varied by controlling the p ...
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... scatterers.5,6 Exciting new techniques have emerged based on shaping of the light field itself to match a given scattering configuration, either through time reversal7,8 or iterative schemes.9,10 The method of wavefront shaping is based on the general concept that the transmission through any medium ...
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Fabry-Perot Interferometer
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Light propagation in dry and wet softwood
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Multipolarization Dynamic Light Scattering of Nonspherical
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... G2 S-TWIN microscope with a 200 kV accelerating voltage. For TEM imaging, the drop containing nanoparticles was dried on a special grid. For each sample, TEM images are presented in Figure S2 (SI). Image processing was made using ImageJ software.22 MP DLS Measurements. MP DLS measurements were carri ...
Effect of ABCD transformations on beam paraxiality
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Digital Fourier Microscopy for Soft Matter Dynamics
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... somehow restrictive conditions [34], the analysis of microscope images in the Fourier space - from here on Digital Fourier Microscopy (DFM) - of a sample can provide quantitative information about its structure and dynamics similar to the one obtained in SLS and DLS experiments. The reader should be ...
Theoretical derivation of the depth average of remotely sensed
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Final Report DURIP AFOSR Grant FA9550-06-1
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... Since the waveguides in optical integrated circuits are typically only a few micrometers thick, observation of the optical mode profile across a given dimension cannot be accomplished without a relatively elaborate experimental set-up, featuring at least 1000× magnification. One such system [9], whi ...
General equation for the differential pathlength factor of the frontal
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... the frontal human head, incorporating dependency on wavelength and age, based on published data. We validated the equation using different data sets of experimentally determined DPFs from six independent studies. © The Authors. Published by SPIE under a Creative Commons Attribution 3.0 Unported Lice ...
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... enterprise and data center networks. These higher speeds might lead system designers to believe that single-mode optical fiber enjoys an increasing advantage over multimode optical fiber in premises applications. However, higher Ethernet speeds do not automatically mean that singlemode optical fiber ...
Direct welding of fused silica with femtosecond fiber laser
Direct welding of fused silica with femtosecond fiber laser

... welding area. Figure 6 illustrates laser glass multi line welding results. Both of the sample substrates dimensions are 10 mmx10 mm with 1 mm thick. The welded line starts from one edge of the sample to the end of the other edge and each of the welding lines is 10 mm long. From the camera picture as ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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