TPS71533EVM LDO Regulator Evaluation Module
... any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI wa ...
... any product or service without notice. Customers should obtain the latest relevant information before placing orders and should verify that such information is current and complete. All products are sold subject to TI’s terms and conditions of sale supplied at the time of order acknowledgment. TI wa ...
Conference Paper - UCF EECS - University of Central Florida
... controller, and develop our own software interface that communicates with the instrument, acquires data, and processes the data for the user. The hardware required for the interfacing of the Vector Network Analyzer to the Data Acquisition System was the Agilent 82357B USB/GPIB Interface. This was ac ...
... controller, and develop our own software interface that communicates with the instrument, acquires data, and processes the data for the user. The hardware required for the interfacing of the Vector Network Analyzer to the Data Acquisition System was the Agilent 82357B USB/GPIB Interface. This was ac ...
This test is described in Section 5.4 of NEMA AB 4-1996
... The data will vary according to the breaker frame type, ampere rating and manufacturer. The manufacturer should be consulted to determine the acceptable level for the breaker under test. If the average test values on any pole of the breaker exceed the manufacturer’s data, a potential overheating con ...
... The data will vary according to the breaker frame type, ampere rating and manufacturer. The manufacturer should be consulted to determine the acceptable level for the breaker under test. If the average test values on any pole of the breaker exceed the manufacturer’s data, a potential overheating con ...
DMO200
... Optional 200A Kelvin lead set-current injected and sense voltage measured using one clamp. ...
... Optional 200A Kelvin lead set-current injected and sense voltage measured using one clamp. ...
Annex 4B
... The isolation resistance measurement shall be conducted by selecting an appropriate measurement method from among those listed in Paragraphs 1.1. through 1.2., depending on the electrical charge of the live parts or the isolation resistance, etc. If the operating voltage of the Tested-Device (Vb, Fi ...
... The isolation resistance measurement shall be conducted by selecting an appropriate measurement method from among those listed in Paragraphs 1.1. through 1.2., depending on the electrical charge of the live parts or the isolation resistance, etc. If the operating voltage of the Tested-Device (Vb, Fi ...
CP1302
... The samples were subjected to a series of preconditioning tests including power loss, internal partial discharge, residual voltage, terminal torque, and thermo-mechanical preconditioning. The specified long term load (SLL) of 1600 Nm was applied for 1000 cycles and validated on all three samples. Tw ...
... The samples were subjected to a series of preconditioning tests including power loss, internal partial discharge, residual voltage, terminal torque, and thermo-mechanical preconditioning. The specified long term load (SLL) of 1600 Nm was applied for 1000 cycles and validated on all three samples. Tw ...
SAFETY WARNINGS - AD INSTRUMENTS
... function switch to the A position and insert the red test lead plug into the (10A) jack. 3. For current measurements up to 400mA, set the function switch to the mA range and insert the red test lead banana plug into the (mA) jack. 4. For current measurements up to 10A AC, set the function switch to ...
... function switch to the A position and insert the red test lead plug into the (10A) jack. 3. For current measurements up to 400mA, set the function switch to the mA range and insert the red test lead banana plug into the (mA) jack. 4. For current measurements up to 10A AC, set the function switch to ...
PAT testing of equipment with high leakage current
... There is no specific requirement in legislation detailing that in-service maintenance consisting of inspecting or testing equipment must be performed on an annual basis. However the IEE gives guidance in its publication the ‘Code of Practice for In-service Inspection and Testing of Electrical Equipm ...
... There is no specific requirement in legislation detailing that in-service maintenance consisting of inspecting or testing equipment must be performed on an annual basis. However the IEE gives guidance in its publication the ‘Code of Practice for In-service Inspection and Testing of Electrical Equipm ...
DRTS 64 - isa test
... connected to the substation network are also called GOOSE. GOOSE messages describe binary status signals over the substation network and are also used for relays tripping. For relay testing applications within IEC61850 substations it is necessary to access these data. This new feature is performed b ...
... connected to the substation network are also called GOOSE. GOOSE messages describe binary status signals over the substation network and are also used for relays tripping. For relay testing applications within IEC61850 substations it is necessary to access these data. This new feature is performed b ...
Safety in electrical testing – service and repair HSE information sheet Introduction
... have you isolated the appliance from the supply? Remove the plug or fuse supplying the equipment. If the fuse is removed, steps should be taken to prevent another person inadvertently replacing it. Remember that there may be some components such as capacitors, and on older equipment even the cathode ...
... have you isolated the appliance from the supply? Remove the plug or fuse supplying the equipment. If the fuse is removed, steps should be taken to prevent another person inadvertently replacing it. Remember that there may be some components such as capacitors, and on older equipment even the cathode ...
A Modular High Temperature Measurement Set-Up for Semiconductor Device Characterization
... physical models as implemented in DESSIS, it is virtually impossible to find a single parameter set that would perfectly describe the device operation for all temperature values between room temperature and 400°C. An acceptable agreement between measurement and simulation could only be achieved afte ...
... physical models as implemented in DESSIS, it is virtually impossible to find a single parameter set that would perfectly describe the device operation for all temperature values between room temperature and 400°C. An acceptable agreement between measurement and simulation could only be achieved afte ...
Increase of internal quantum efficiency in small
... To separate the absorption of active absorber layers from absorption within transport layers and metal contact, we use a transfer-matrix-formalism to model the device optically [1]. Values of the optical constants n and k were derived by tting transmission and re ection spectra of thin lm layers o ...
... To separate the absorption of active absorber layers from absorption within transport layers and metal contact, we use a transfer-matrix-formalism to model the device optically [1]. Values of the optical constants n and k were derived by tting transmission and re ection spectra of thin lm layers o ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.