• Study Resource
  • Explore
    • Arts & Humanities
    • Business
    • Engineering & Technology
    • Foreign Language
    • History
    • Math
    • Science
    • Social Science

    Top subcategories

    • Advanced Math
    • Algebra
    • Basic Math
    • Calculus
    • Geometry
    • Linear Algebra
    • Pre-Algebra
    • Pre-Calculus
    • Statistics And Probability
    • Trigonometry
    • other →

    Top subcategories

    • Astronomy
    • Astrophysics
    • Biology
    • Chemistry
    • Earth Science
    • Environmental Science
    • Health Science
    • Physics
    • other →

    Top subcategories

    • Anthropology
    • Law
    • Political Science
    • Psychology
    • Sociology
    • other →

    Top subcategories

    • Accounting
    • Economics
    • Finance
    • Management
    • other →

    Top subcategories

    • Aerospace Engineering
    • Bioengineering
    • Chemical Engineering
    • Civil Engineering
    • Computer Science
    • Electrical Engineering
    • Industrial Engineering
    • Mechanical Engineering
    • Web Design
    • other →

    Top subcategories

    • Architecture
    • Communications
    • English
    • Gender Studies
    • Music
    • Performing Arts
    • Philosophy
    • Religious Studies
    • Writing
    • other →

    Top subcategories

    • Ancient History
    • European History
    • US History
    • World History
    • other →

    Top subcategories

    • Croatian
    • Czech
    • Finnish
    • Greek
    • Hindi
    • Japanese
    • Korean
    • Persian
    • Swedish
    • Turkish
    • other →
 
Profile Documents Logout
Upload
Proposed Revisions to Draft of TIA-968-B
Proposed Revisions to Draft of TIA-968-B

... signal level control shall provide not exceed the programmed levels given in Table 4.5 within +/1 dB. The voltages impressed on resistor Rp by the data equipment shall be such as not to cause power dissipation in Rp in excess of 50 milliwatts. The circuit shown below was used in calculating values o ...
3200 - transmille.net
3200 - transmille.net

Real-Time Controller with 256 MB DRAM, 2 GB Storage NI cRIO-9022
Real-Time Controller with 256 MB DRAM, 2 GB Storage NI cRIO-9022

... is designed for extreme ruggedness, reliability, and low power consumption with dual 9 to 35 VDC supply inputs that deliver isolated power to the CompactRIO chassis and a -20 to 55 °C operating temperature range. The cRIO-9022 accepts 9 to 35 VDC power supply inputs on power-up and 6 to 35 VDC power ...
Customer Premise Equipment
Customer Premise Equipment

High Slew Rate DC Electronic Load MODEL  63472 Key Features
High Slew Rate DC Electronic Load MODEL 63472 Key Features

... UUT output voltage and current readings are measured through two separate SMA connectors on the unit's front panel. This provides the user with the flexibility to locate the most desirable voltage measurement point on any particular main board. Doing so will maximize accuracy of the measurement valu ...
ETSO-C174
ETSO-C174

... battery temperature during battery-charging cycles, and remove power when over temperature limits are reached. Applications where excessive battery temperature cannot cause catastrophic events do not require monitoring. (r) If the BEPU contains a battery heater device, a single-fault failure redunda ...
Operating Instructions
Operating Instructions

N-channel 600 V, 0.440 typ., 8 A MDmesh™ DM2 Power MOSFET in
N-channel 600 V, 0.440 typ., 8 A MDmesh™ DM2 Power MOSFET in

... series. It offers very low recovery charge (Qrr) and time (trr) combined with low RDS(on), rendering it suitable for the most demanding high efficiency converters and ideal for bridge topologies and ...
Installation Instructions
Installation Instructions

Spectrometer Electronics
Spectrometer Electronics

EMI in the Workplace Environment
EMI in the Workplace Environment

... home and workplace environments have become very sophisticated to the point where interaction between some products and implanted devices can occur. Mechanical and electrical shielding designed into pacemakers and implantable cardioverter-defibrillators (ICDs), has, in most cases, enabled these medi ...
MasterCraft 2006 - Perfectpass.com
MasterCraft 2006 - Perfectpass.com

HIGH PRECISION SOURCE MEASURE UNIT MODEL 52400 SERIES
HIGH PRECISION SOURCE MEASURE UNIT MODEL 52400 SERIES

... PXI based SMU (Source Measurement Unit) card which can be used in both PXI and PXIe chassis. It is designed for highly accurate source or load simulation with precision voltage and current measurements. SMU combin es fo ur-qua dra nt-so u rce wit h precision and high speed measurement. This unique c ...
EMI in the Workplace Environment
EMI in the Workplace Environment

... home and workplace environments have become very sophisticated to the point where interaction between some products and implanted devices can occur. Mechanical and electrical shielding designed into pacemakers and implantable cardioverter-defibrillators (ICDs), has, in most cases, enabled these medi ...
N-channel 600 V, 0.370 typ., 10 A MDmesh™ DM2 Power MOSFET
N-channel 600 V, 0.370 typ., 10 A MDmesh™ DM2 Power MOSFET

... VGS = 10 V (see Figure 14: "Test circuit for resistive load switching times" and Figure 19: "Switching time waveform") ...
BE044345351
BE044345351

Version for North American and Japanese vehicles
Version for North American and Japanese vehicles

PolySwitch® PTC Devices Specification Status: Released
PolySwitch® PTC Devices Specification Status: Released

... 1. Users should independently evaluate the suitability of and test each product selected for their own application. 2. This product should not be used in an application where the maximum interrupt voltage or maximum interrupt current can be exceeded in a fault condition. Operation beyond the maximum ...
Lesson 15: Induction Motor Testing: Lock-Rotor and No
Lesson 15: Induction Motor Testing: Lock-Rotor and No

... and DC tests of a 3-phase, wye connected 40 HP, 60 Hz, 460 V, induction motor with a rated current of 57.8 A. The locked-rotor test is made at 15 Hz to minimize the errors due to saturation and skin effects. Determine the motor parameters and the total core, friction and windage losses. Draw the app ...
Excelta ST-1_JS1 (Page 1)
Excelta ST-1_JS1 (Page 1)

PDF 60kB - TDK
PDF 60kB - TDK

... 1. Output voltage regulation not to exceed ± 5% of initial (before test) value during test. 2. Output voltage to be within regulation specification after the test. 3. Along with 1 and 2, no discharge of fire or smoke, as well as no ...
1818 Configuring a Resistor Network Production Test System with
1818 Configuring a Resistor Network Production Test System with

... element in the network. Resistance measurements are made either by applying constant current or constant voltage. Performing these tests requires the use of switching hardware to switch the source and measurement signals to and from each element of the network. The Model 2400 SourceMeter® Instrument ...
1 Test Structures for Device Characterization
1 Test Structures for Device Characterization

University Physics III Practice Test II
University Physics III Practice Test II

... (b) Using therpotential function V (0,0,z) that you found in part (a), determine the components of the electric field E(0,0,z) at point P. ...
Swarm CEFI-LP Calibration Plan
Swarm CEFI-LP Calibration Plan

... - All fundamental ground calibrations of the electronics are done at LP level, i.e. on the bench in Uppsala. This includes the complete frequency response of the instrument and determination of temperature-dependent offsets. (Section 2) - Integrated ground tests (CEFI and Swarm level) are used mainl ...
< 1 ... 72 73 74 75 76 77 78 79 80 ... 98 >

Automatic test equipment



Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.
  • studyres.com © 2025
  • DMCA
  • Privacy
  • Terms
  • Report