First Trans-Rupter II Transformer Protector Installation in Brazil
... With limited monetary resources available, one regional electrical utility, Companhia Energética de Minas Gerais (CEMIG), sought ways to save on the purchased and installed costs of equipment. They turned to S&C Brasil for suggestions. ...
... With limited monetary resources available, one regional electrical utility, Companhia Energética de Minas Gerais (CEMIG), sought ways to save on the purchased and installed costs of equipment. They turned to S&C Brasil for suggestions. ...
True Three Phase TF Turn Ratio Tester 400kV
... of charge & will be planned soon after the supplies are made so as to make use of the testing equipments. Apart from the detailed demonstration at site, the supplier shall also have to arrange necessary training to HVPNL engineers. ...
... of charge & will be planned soon after the supplies are made so as to make use of the testing equipments. Apart from the detailed demonstration at site, the supplier shall also have to arrange necessary training to HVPNL engineers. ...
Tutorial 1
... 4. An average value of a set of voltage measurement is 30.15V. Calculate the precision of the measurement if one of the measurement readings is 29.9V. 5. A voltmeter has an accuracy of 98% in full-scale measurement readings. a. If the voltmeter gives measurement reading of 175V at range of 300V, cal ...
... 4. An average value of a set of voltage measurement is 30.15V. Calculate the precision of the measurement if one of the measurement readings is 29.9V. 5. A voltmeter has an accuracy of 98% in full-scale measurement readings. a. If the voltmeter gives measurement reading of 175V at range of 300V, cal ...
Subjective tests - Telecommunications Industry Association
... 5. Start the test by taking turns to speak for 30 seconds. Gradually try more and more double-talk and interrupting each other. In the extreme case of consistent double-talk, one person may count numbers and the other person may recite alphabets or read continuously. 6. Person 2 shall listen to whet ...
... 5. Start the test by taking turns to speak for 30 seconds. Gradually try more and more double-talk and interrupting each other. In the extreme case of consistent double-talk, one person may count numbers and the other person may recite alphabets or read continuously. 6. Person 2 shall listen to whet ...
Activity 3.1.1 inputs and Outputs
... 3. Select Test from the toolbar. The Connection box in the lower right corner of the interface test dialog box will be green, indicating that the interface is running. If the connection indicates simulation mode, check all connections and verify that USB is selected under COM/USB. Leave the Test Int ...
... 3. Select Test from the toolbar. The Connection box in the lower right corner of the interface test dialog box will be green, indicating that the interface is running. If the connection indicates simulation mode, check all connections and verify that USB is selected under COM/USB. Leave the Test Int ...
MMBTH 1 0 RG
... device or system whose failure to perform can be or (b) support or sustain life, or (c) whose failure to perform reasonably expected to cause the failure of the life support when properly used in accordance with instructions for use device or system, or to affect its safety or effectiveness. provide ...
... device or system whose failure to perform can be or (b) support or sustain life, or (c) whose failure to perform reasonably expected to cause the failure of the life support when properly used in accordance with instructions for use device or system, or to affect its safety or effectiveness. provide ...
CP1219
... The samples were subjected to a series of preconditioning tests including power loss, internal partial discharge, residual voltage, terminal torque, and thermo-mechanical preconditioning. The specified long term load (SLL) of 920 Nm was applied for 1000 cycles and validated on all three samples. Two ...
... The samples were subjected to a series of preconditioning tests including power loss, internal partial discharge, residual voltage, terminal torque, and thermo-mechanical preconditioning. The specified long term load (SLL) of 920 Nm was applied for 1000 cycles and validated on all three samples. Two ...
Push Performance and Power Beyond the Data Sheet White Paper
... TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and applications using TI components. To minimize the risks associated with customer products and applications, customers should provide adequate design and operating safeguar ...
... TI assumes no liability for applications assistance or customer product design. Customers are responsible for their products and applications using TI components. To minimize the risks associated with customer products and applications, customers should provide adequate design and operating safeguar ...
Coming Soon SuperSeal™ RJ45 CAT 6A ETHERNET
... millivolt level method (shall not exceed 0.025 ohms and 0.050 ohms during subsequent tests ...
... millivolt level method (shall not exceed 0.025 ohms and 0.050 ohms during subsequent tests ...
Understanding Quality of Experience
... Listening quality and conversational quality (MOS) scores Residual echo return loss scores Packet loss analysis Broadband signal quality IP and call processing message logs ...
... Listening quality and conversational quality (MOS) scores Residual echo return loss scores Packet loss analysis Broadband signal quality IP and call processing message logs ...
Columbia AC/DC Clamp-On Tong Test Ammeters
... Measures True RMS Values. The Columbia AC/DC Clamp-On Tong Test Ammeter reads the true effective (heating) value, regardless of wave shape. On DC currents from a rectifier or an SCR controlled source, it will measure the true RMS value of the DC and the AC ripples. On AC, particularly when current i ...
... Measures True RMS Values. The Columbia AC/DC Clamp-On Tong Test Ammeter reads the true effective (heating) value, regardless of wave shape. On DC currents from a rectifier or an SCR controlled source, it will measure the true RMS value of the DC and the AC ripples. On AC, particularly when current i ...
SmartFusion in Clinical Applications Hemodialysis Machine
... Fusion devices are the only programmable logic solution to integrate up to 8 Mbits of embedded flash memory, arranged in 1024-bit pages. This high-performance, configurable flash memory supports 100 MHz operation and data bus widths of 8, 16, and 32 bits for a wide variety of application needs. Smar ...
... Fusion devices are the only programmable logic solution to integrate up to 8 Mbits of embedded flash memory, arranged in 1024-bit pages. This high-performance, configurable flash memory supports 100 MHz operation and data bus widths of 8, 16, and 32 bits for a wide variety of application needs. Smar ...
Guidelines accompanying Commission Regulation (EC) No 642/2009
... security monitors or medical monitors. Such professional monitors are produced and sold in small quantities (less than 20.000 units/year) for the dedicated purpose of serving the signal quality expected via a SDI signal path by an SDI module, which typically costs up to 2000€ /per unit. They are usu ...
... security monitors or medical monitors. Such professional monitors are produced and sold in small quantities (less than 20.000 units/year) for the dedicated purpose of serving the signal quality expected via a SDI signal path by an SDI module, which typically costs up to 2000€ /per unit. They are usu ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.