summary of requirements
... Adds cable pull test for luminaire wiring compartments with integral strain relief clamps. No action required, current practice. ...
... Adds cable pull test for luminaire wiring compartments with integral strain relief clamps. No action required, current practice. ...
F(t)
... The most obvious use of the test results is to distinguish between good and bad parts. This can be done with a test which detects faults. In case of repair, a test capable of locating faults is required. Testing can be done during normal use of the system; referred to as concurrent testing; for exam ...
... The most obvious use of the test results is to distinguish between good and bad parts. This can be done with a test which detects faults. In case of repair, a test capable of locating faults is required. Testing can be done during normal use of the system; referred to as concurrent testing; for exam ...
SPI225 Smart primary injection test system
... Smart Touch View Interface is a simplified input and control touch screen A key feature of the SPI system is the simplified touch screen input. The STVI touch screen input eliminates the confusing menu system of other primary injection and circuit breaker test systems. The touch screen makes the STV ...
... Smart Touch View Interface is a simplified input and control touch screen A key feature of the SPI system is the simplified touch screen input. The STVI touch screen input eliminates the confusing menu system of other primary injection and circuit breaker test systems. The touch screen makes the STV ...
• Measurable Elements: Gold, Silver, Copper, Platinum, Palladium
... Automatic controls such as lamp current, negative high voltage, peristaltic pump RPM; USB2.0. With function of Ar gas flow auto control, the instrument can cut off Ar gas when stop working, convenient for users’ operation and saving gas source. In-built device for flame observation is convenient for ...
... Automatic controls such as lamp current, negative high voltage, peristaltic pump RPM; USB2.0. With function of Ar gas flow auto control, the instrument can cut off Ar gas when stop working, convenient for users’ operation and saving gas source. In-built device for flame observation is convenient for ...
Semiconductors (opens in a new window)
... semiconductor materials and devices requires high-calibre analysis to ensure device and materials performance. Impurities, dopant concentrations and interface sharpness can all play an important role in determining your level of performance and quality. Whatever material you use, SIMS can help you c ...
... semiconductor materials and devices requires high-calibre analysis to ensure device and materials performance. Impurities, dopant concentrations and interface sharpness can all play an important role in determining your level of performance and quality. Whatever material you use, SIMS can help you c ...
RevF_543c
... 7. The note: NB: For equipment submitted to section 17 category B test, multiply the voltage levels deduced from Figure 16-XC (after application of its note) by following ratio Rv. ...
... 7. The note: NB: For equipment submitted to section 17 category B test, multiply the voltage levels deduced from Figure 16-XC (after application of its note) by following ratio Rv. ...
TS6001-2.5V Voltage Reference Demo Board
... Silicon Laboratories intends to provide customers with the latest, accurate, and in-depth documentation of all peripherals and modules available for system and software implementers using or intending to use the Silicon Laboratories products. Characterization data, available modules and peripherals, ...
... Silicon Laboratories intends to provide customers with the latest, accurate, and in-depth documentation of all peripherals and modules available for system and software implementers using or intending to use the Silicon Laboratories products. Characterization data, available modules and peripherals, ...
PV150 Comparison Document
... The electrical output will vary significantly with changes in the level of in-plane irradiance. Solar PV panel manufacturers quote the electrical output at standard test conditions (STC) with an irradiance level of 1000W/m2. Therefore, when commissioning a PV system, it is necessary to measure the l ...
... The electrical output will vary significantly with changes in the level of in-plane irradiance. Solar PV panel manufacturers quote the electrical output at standard test conditions (STC) with an irradiance level of 1000W/m2. Therefore, when commissioning a PV system, it is necessary to measure the l ...
STP 3 & 4 7.8 COL License Information
... voltages between system units. For ABWR safety systems, the problem has been reduced by using fiber optic cables as the transmission medium for most critical signals. While the cables may contain metallic supporting members or protective shields, these are not electrically connected to any equipment ...
... voltages between system units. For ABWR safety systems, the problem has been reduced by using fiber optic cables as the transmission medium for most critical signals. While the cables may contain metallic supporting members or protective shields, these are not electrically connected to any equipment ...
Analog Input Ratemeter/Totalizer
... Ordering Examples: DPF64-RS232, ratemeter/ batch controller with RS232 output, $289 + 79 = $368. OCW-3, OMEGACARESM extends standard 2-year warranty to a total of ...
... Ordering Examples: DPF64-RS232, ratemeter/ batch controller with RS232 output, $289 + 79 = $368. OCW-3, OMEGACARESM extends standard 2-year warranty to a total of ...
LHCb Velo Electronics PRR
... detector providing the interconnection of 2048 readout channels on each silicon sensor and the 16 Beetle readout chips on each side of the hybrid and then offboard to the readout electronics via kapton interconnecting cables. In an electrical sense the hybrids are two simple, independent four layer ...
... detector providing the interconnection of 2048 readout channels on each silicon sensor and the 16 Beetle readout chips on each side of the hybrid and then offboard to the readout electronics via kapton interconnecting cables. In an electrical sense the hybrids are two simple, independent four layer ...
Document
... from a distance of 30 cm from the front of the display device. The results of the assessment must be within established limits. Monthly Electronic Display Device Performance The performance of all electronic display devices used to view images from digital systems, as well as those obtained through ...
... from a distance of 30 cm from the front of the display device. The results of the assessment must be within established limits. Monthly Electronic Display Device Performance The performance of all electronic display devices used to view images from digital systems, as well as those obtained through ...
dc current measurement
... NOTE: These meters meet CAT III and CAT IV IEC 61010 standards. The IEC 61010 safety standard defines four overvoltage categories (CAT I to IV) based on the magnitude of danger from transient impulses. CAT III meters are designed to protect against transients in fixed-equipment installations at the ...
... NOTE: These meters meet CAT III and CAT IV IEC 61010 standards. The IEC 61010 safety standard defines four overvoltage categories (CAT I to IV) based on the magnitude of danger from transient impulses. CAT III meters are designed to protect against transients in fixed-equipment installations at the ...
Document
... consider the implications packaging has on test. Most device packages are made to JEDEC specifications. Under these circumstances, there is a tolerance in the package/pad/lead/pitch that can cause problems. Also packages may vary slightly with various suppliers. The window on the mechanical toleranc ...
... consider the implications packaging has on test. Most device packages are made to JEDEC specifications. Under these circumstances, there is a tolerance in the package/pad/lead/pitch that can cause problems. Also packages may vary slightly with various suppliers. The window on the mechanical toleranc ...
Automatic test equipment
Automatic or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the Device Under Test (DUT), Equipment Under Test (EUT) or Unit Under Test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on Wafer testing, including System-On-Chips and Integrated circuits.