Download Physical Design

Physical Design
This is what we want
• Are amenable to fabrication with some given target process
• Logically function as expected in spite of numerous parasitic effects
• Meet ambitious performance goals in spite of layout parasitics
• Keep fabrication costs down by minimizing die size and by maximizing
yield.
Common Problems
• Tolerances and misalignments of photomasks,
• Wave diffraction and proximity effects,
• Uneven profile together with shallow depth of focus,
• Reflections from underlying layers,
• Tolerances in photoresist exposure,
• Etching along undesired dimensions,
• Lateral diffusion of dopants, and
• Spiking of aluminum.
Layout Rules
• Minimum Width
• Minimum Intralayer Spacing
• Minimum Interlayer Spacing
• Minimum Enclosure
• Minimum Extension
Min Width and Min Intralayer Spacing
Min Interlayer Spacing and Min Enclosure
Minimum Extension
Maximum Width
Density Rules
• Have to define a lower and upper density bound
• No less than 20%, no more than 80% of 1mmx1mm
• This method is used in CMP (Chemical Mechanical Polishing) to
prevent the errosion of two interconnecting surfaces of two materials
of different hardness such as copper and Si02.
Electrical Properties
Surface has different materials of different electrical properties. So it’s
necessary to define electrical characteristics.
• Conductivity
• Sustainable Current Density
Conductivity
• Huge difference in conductivity between metal and silicon layers
• If no Silicidation was present, the contrast would be even more
significant
• Improved by using metal silicate or CoSi2 on the top of Si material
Sustainable Current Density
• The max amount of current that IC can handle is a matter of concern
• Reliability concerns the current the device can handle
• When subject to excess current, the metal conductors tend to
disintegrate named as electromigration
• VLSI designers design interconnect networks to function as current
load
Connection Between Layers
Two types of connections
• Contacts
Connection between metal and Si Layers
• Via
Connection between two superimposed layers of metal
350 mm CMOS 5 Layer
Contacts and Vias
Metal Layers
Typical Roles of Conducting Layers
• First level metal is instrumental can connect to all Si Layers without
detour
• Intermediate level are mostly used for general extra-cell signal inter
connect.
• Higher level metals are thicker, lower sheet resistance.
Cell Based Back-End Design
Floorplanning
• Partitioning into major building blocks (datapaths, controllers,
memories, megacells, etc.),
• Number and anticipated sizes, shapes, and placement of all such
blocks,
• Package selection and pin/pad utilization,
• Wide busses and electrically critical signals,
• Clock domains (frequency, conditional vs. unconditional clocking),
• Voltage domains (power dissipation, power density, local current
needs), and
• On-chip power and clock distribution schemes.
Two types of PIN Design
• Core Limited
A larger core surrounded by few pads. Core size determines overall die size.
Porting target to denser process might reduce core size i.e. Die size. Might not
impact cost.
• Pad Limited
Small core with large number of pads. The pad number determines necessary
circumference thus the fixed die size which cannot be reduced later. This is the
minimum defined size. Dense or less dense cannot reduce die size because core
is small and unaffected, but has impact on cost.
Core and Pad Limited Floorplan
Establish Pin Budget
• Total pin count determines package selection and packaging costs
• A good pinout accounts not only for on chip interconnect but also for
board level wiring
• Arrange signal from different power level
• Keep bus signal together
• Provide ample return path for switching current
• Make differential signals occupy adjacent pins
Place and Route Basics
• Floorplan predicts the future outcome of each individual block.
• These individual blocks can be tested separately thanks to modern
EDA Suites.
• We can decompose blocks into small sizes to manage and test with
separate personnel/teams.
• Extra cells (sewing kits) are kept which are expected to require future
mods, we can make last minute changes to them without much
divergence of the actualy floor plan itself.
Major Revision Necessary if
Inconsistency in
• Power Dissipation
• Long Path Delay
• Area Coverage
• Clock Speed
will force us to revise and change the major floorplan
Place and Route : These Are Done
Good routing makes a difference in fabrication yield. At the
interconnect level, yield enhancement implies:
• Connecting multiple vias in parallel.
• Making the preferred orientations of wires on adjacent metal layers
perpendicular to each other to minimize the impact of crosstalk on
path delays, both long and short.
• Spacing long lines further apart than required by the minimum
separation rule to minimize the chance of shorts and the severity of
crosstalk.
Chip Assembly
• Final phase of physical design
• Place all top level building blocks
• Interconnect those blocks to obtain chip’s core
• Prepare the pad frame required to electrically connect the external
world
• Connect core and pad frame to complete chip’s design
Packaging
Packaging Process 1
Packaging Process 2
Packaging Process 3
Packaging Rules
• Protect semiconductor dies against mechanical stress and other
environmental attacks
• Electrical connections with surrounding circuitry with a particular
emphasis on low impedance for power and ground nets.
• Facilitate the handling of parts during shipping and board assembly.
• Carry away the thermal power while keeping die at an acceptable
temperature.
Wafer Sorting
Wafer Testing
• A set of ultrafine needles firmly held in place by a probe card is
lowered into the wafer until all needles establish electrical contact
with the bonding pads of ic.
• It determines that the connections are all working and the circuit
faults can be found out.
• Takes 2 seconds to test each IC response, and defective chips are
inked.
• All responses are recorded.
Probe Card
Backgrinding and Singulation
• Standard wafers are between 720 µm and 770 µm thick.
• The wafer’s back surface is subjected to grinding by disks with
embedded diamond abrasives.
• Final thickness can be as low as 75 µm, although most thin-wafer
production averages 250 µm to stay clear of yield losses during
grinding, handling, and later packaging steps.
• The wafer then gets sawn apart by two orthogonal series of parallel
cuts, each of which traverses the wafer from one rim to the opposite
one.
Encapsulation
• In a step termed die bonding, aka die attach, a good die is placed in
the cavity of the package, where it is mechanically fastened by means
of solder or epoxy resin compound.
• Next follows wire bonding, whereby electrical connections are
established between bond pads on the silicon die and their
counterparts on the package leads.
• Al and Au wires are used.
• Bonding occurs by way of pressure, ultrasonic energy, and/or heat.
Bonding diagram and Bonding Rules
Instructions on how to connect the pads on the die to the available package leads
during wire bonding:
• are conveyed in a bonding diagram
• Do not design dies with aspect ratios outside the interval [1 2 ...2].
• Allow for a minimum gap of 0.6 mm between cavity and die on all four sides.
• Make 25 µm bond wires no shorter than 1.0 mm and no longer than 3.5 mm.
• Avoid downbonds, groundbonds, and double bonds.
• Respect a minimum angle of 45 between bond wires and chip edge.
• Make all bond areas square with a minimum overglass opening of 75 µm by 75
µm.
• Respect a minimum pad pitch of 90 µm.
Advanced Packaging
Techniques
High Performance Packages
• Implemented on chips which operate on Ghz Frequency and dissipate 150W
• Wire bonding is impractical in such situations.
• Conductive Polymer is used.
HighDensity Packaging
• Is used to reduce the IC size
• High-density packaging uses similar techniques to mount and interconnect
bare dies — and often tiny SMD components as well — on a small
substrate before encapsulating everything in a common package.
• Even where this is technically feasible, combining many such features on a
single monolithic circuit implies a more complex fabrication process
• The alternative is to have each subsystem manufactured with its respective
optimal technology and to have them tested separately before mounting
them in a common package to obtain a multi-chip module (MCM)
Folded Flexiprints
• Particularly popular when a multi-chip circuit must fit into a small or
irregular volume. Chips are fabricated, packaged, and tested in the
normal way before being surface-mounted on a flexible film
substrate.
• Discrete components, sensors, and the like can also be
accommodated. The flexiprint is then cut and folded before being fit
into a medical device
Chip Stacking and Cubing
• Hearing aids, mobile phones, and flash memories such as USB
memory sticks take advantage of the third dimension by stacking two,
three, or more dies on top of each other.
• Cubing allows for still higher densities. Bare dies are stacked on top of
each other before being inter-connected on their outer rims to obtain
a cube-like assembly. Burying the vertical interconnections within the
chip stack itself is an extra sophistication.
• Plasma etching is used.
Thank You